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    • 72. 发明申请
    • Method and Apparatus for Automatic Pattern Analysis
    • 自动模式分析的方法和装置
    • US20080097991A1
    • 2008-04-24
    • US11573048
    • 2005-08-01
    • Hiroshi Ishikawa
    • Hiroshi Ishikawa
    • G06T7/00G06K9/62
    • G06F16/904
    • A method and apparatus is disclosed for pattern analysis by arranging given data so that highdimensional data can be more effectively analyzed. The method allows arrangements of given data so that patterns can be discovered within the data. By utilizing maps that characterizes the data and the type or the set it belongs to, the method produces many data items from relatively few input data items, thereby making it possible to apply statistical and other conventional data analysis methods. In the method, a set of maps from the data or part of the data is determined. Then, new maps are generated by combining existing maps or applying certain transformations on the maps. Next, the results of applying the maps to the data are examined for patterns. Optionally, certain strong patterns are chosen, idealized, and propagated backwards to find a data reflecting that pattern.
    • 公开了一种用于模式分析的方法和装置,通过布置给定数据使得可以更有效地分析高维数据。 该方法允许给定数据的布置,使得可以在数据内发现模式。 通过利用表征数据及其所属类型或集合的映射,该方法从相对较少的输入数据项产生许多数据项,从而可以应用统计学和其他常规数据分析方法。 在该方法中,确定来自数据或数据部分的一组映射。 然后,通过组合现有地图或在地图上应用某些转换来生成新地图。 接下来,检查将图应用于数据的结果。 可选地,某些强图案被选择,理想化并向后传播以找到反映该图案的数据。
    • 80. 发明申请
    • Stress detection method for force sensor device with multiple axis sensor and force sensor device employing this method
    • 采用这种方法的多轴传感器和力传感器装置的力传感器装置的应力检测方法
    • US20050229720A1
    • 2005-10-20
    • US11073944
    • 2005-03-08
    • Toshio HanazawaMasaaki OnoTsutomu MiyashitaHiroshi TokunagaHiroshi Ishikawa
    • Toshio HanazawaMasaaki OnoTsutomu MiyashitaHiroshi TokunagaHiroshi Ishikawa
    • G01L5/16G01P15/12G01P15/125
    • G01P15/123G01P15/18G01P21/00G01P2015/084
    • The present invention provides the stress detection method for force sensor device with multiple axis sensor device and force sensor device employing this method, whose installation angle is arbitrary. The stress detection method includes, first and second force sensors whose detection axes are orthogonal to each other. When the detection axis of first force sensor forms angle θ with direction of detected stress Ax, and the stress component of direction perpendicular to direction of the detected stress Ax is Az, output Apx of the axis direction of first force sensor is found as Apx=αx (Ax×cos θ+Az×sin θ), and output Apz of the axis direction of the second force sensor is found as Apz=αz (Ax×sin θ+Az×cos θ), and, when αx and αz are detection sensitivity coefficients of first and second force sensors respectively, the detection sensitivity coefficient αz of second force sensor is set as αz=αx tan θ, and the detected stress Ax is found as Ax=(Apx−Apz)/αx(cos θ−tan θ×sin θ).
    • 本发明提供了具有多轴传感器装置的力传感器装置和采用该方法的力传感器装置的应力检测方法,其安装角度是任意的。 应力检测方法包括检测轴彼此正交的第一和第二力传感器。 当第一力传感器的检测轴与检测到的应力Ax的方向形成角度θ,并且垂直于检测应力的方向的方向的应力分量为Az时,第一力传感器的轴方向的输出Apx被发现为Apx = (Axxcosθ+Azxsinθ),第二力传感器的轴方向的输出Apz被找到为Apz =αz(Axxsinθ+Azxcosθ) ,并且当αx和αz分别是第一和第二力传感器的检测灵敏度系数时,第二和第二力传感器的检测灵敏度系数αz 力传感器被设置为α =α×tanθθ,并且检测到的应力Ax被发现为Ax =(Apx-Apz)/α×x / SUB>(cosθ-tan角蛋白θ)。