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71. 发明申请

US20050085985A1 Deceleration control apparatus and method for automotive vehicle 有权
标题翻译：用于汽车的减速控制装置和方法
公开(公告)号：US20050085985A1
公开(公告)日：2005-04-21
申请号：US10960705
申请日：2004-10-08
申请人： Tatsuya Suzuki , Shinji Matsumoto
发明人： Tatsuya Suzuki , Shinji Matsumoto
IPC分类号： B60W10/04 , B60K31/00 , B60T8/1755 , B60T8/58 , B60W10/06 , B60W10/18 , B60W10/188 , F02D29/02 , F02D45/00 , G06F19/00
CPC分类号： B60T8/1755 , B60T2201/16 , B60W10/06 , B60W10/18 , B60W30/04 , B60W30/143 , B60W2030/043 , B60W2710/18 , Y10T477/62423 , Y10T477/80
摘要： In deceleration control apparatus and method for an automotive vehicle, a deceleration control is performed on the basis of a turning of the vehicle; and a controlled variable of the deceleration control is decreased when the vehicle is traveling on an outlet of a curved road.
摘要翻译：在用于机动车辆的减速控制装置和方法中，基于车辆的转弯执行减速控制; 并且当车辆在弯曲道路的出口上行驶时减速控制的控制变量减小。

72. 外观设计

USD499130S1 Digital camera 失效
公开(公告)号：USD499130S1
公开(公告)日：2004-11-30
申请号：US29159993
申请日：2002-04-30
申请人： Yoshitaka Naito , Tatsuya Suzuki , Hiroshi Iue
设计人： Yoshitaka Naito , Tatsuya Suzuki , Hiroshi Iue

73. 发明授权

US06807453B1 Method and system for evaluating a defective ratio of products 有权
标题翻译：评估产品缺陷率的方法和系统
公开(公告)号：US06807453B1
公开(公告)日：2004-10-19
申请号：US09408104
申请日：1999-09-29
申请人： Tatsuya Suzuki
发明人： Tatsuya Suzuki
IPC分类号： G06F1900
CPC分类号： G06Q10/04 , G05B2219/32194 , G05B2219/32203 , Y02P90/22 , Y02P90/265
摘要： A defective ratio evaluation method includes the steps of classifying defective information describing a design structure of a product and manufacturing features which become product defective occurrence factors and making the defective information accessible; comparing design information of a product to be evaluated with the defective information and computing types of defective information and a number of defective information items included in the design information; computing, before beginning manufacture of the product to be evaluated and using the types of defective information and the number of defective information items thus computed, a degree of occurrence of an event in which the product to be evaluated becomes defective; and displaying the degree of defective occurrence thus computed.
摘要翻译：缺陷率评估方法包括对描述产品的设计结构的缺陷信息进行分类和成为产品缺陷发生因素的制造特征并使缺陷信息可访问的步骤; 将要评估的产品的设计信息与缺陷信息的计算类型和设计信息中包含的缺陷信息项的数量进行比较; 在开始制造要评估的产品和使用缺陷信息的类型和由此计算的缺陷信息项的数量之前，计算出要评估的产品变得有缺陷的事件的发生程度; 并显示如此计算的缺陷发生的程度。

74. 发明授权

US06582524B2 Method for washing wafer and apparatus used therefor 失效
标题翻译：洗涤晶片的方法及其使用的装置
公开(公告)号：US06582524B2
公开(公告)日：2003-06-24
申请号：US09749236
申请日：2000-12-27
申请人： Tatsuya Suzuki
发明人： Tatsuya Suzuki
IPC分类号： C23G114
CPC分类号： H01L21/02052 , B08B3/08 , C11D3/3947 , C11D7/06 , C11D11/0047 , Y10S134/902
摘要： A method including the consecutive steps of: dipping a wafer in a washing solution in a washing chamber; replacing the washing solution by a first chemical solution in the washing chamber receiving therein the wafer, the first chemical solution including at least one chemical; dipping the wafer in the first chemical solution after stopping the replacing; and replacing the first chemical solution by a second chemical solution including the at least one chemical and having a concentration lower than a concentration of said first chemical solution. The number of the particles remaining on the wafer is significantly reduced compared with a conventional method to improve the removing rate of the particles deposited onto the wafer.
摘要翻译：一种包括以下步骤的方法：将晶片浸入洗涤室中的洗涤溶液中; 在其中容纳晶片的洗涤室中用第一化学溶液代替洗涤溶液，所述第一化学溶液包括至少一种化学品; 停止更换后将晶片浸入第一种化学溶液中; 并且通过包含所述至少一种化学品的第二化学溶液代替所述第一化学溶液，并且其浓度低于所述第一化学溶液的浓度。与提高沉积在晶片上的颗粒的去除速率的常规方法相比，残留在晶片上的颗粒数量明显减少。

75. 发明授权

US06553273B1 Fraction defective estimating method, system for carrying out the same and recording medium 有权
标题翻译：分数缺陷估计方法，执行相同系统和记录介质
公开(公告)号：US06553273B1
公开(公告)日：2003-04-22
申请号：US09566482
申请日：2000-05-08
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
IPC分类号： G06F1900
CPC分类号： G06Q10/06
摘要： A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
摘要翻译：用于估计制造前的阶段中的物品的装配相关分数不良系数的方法和系统，例如，在设计阶段。作为数据输入组装操作，要组装的部件的属性/条件以及对组装工作中出现故障可能性具有重大影响的组装车间的条件。基于所输入的数据，通过执行组装相关分数缺陷值估计程序，以高精度算术地确定装配相关分数有缺陷的估计值。

76. 发明授权

US06526326B2 Fraction defective estimating method and system for estimating an assembly fraction defective of an article 有权
$Fraction defective estimating method and system for estimating an assembly fraction defective of an article$
公开(公告)号：US06526326B2
公开(公告)日：2003-02-25
申请号：US09927374
申请日：2001-08-13
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
IPC分类号： G06F1900
CPC分类号： G06Q10/06
摘要： A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.

77. 发明授权

US06411791B1 Developing apparatus including a developer charging member shaft and a holding member including a shaft guide groove 有权
公开(公告)号：US06411791B1
公开(公告)日：2002-06-25
申请号：US09758117
申请日：2001-01-12
申请人： Susumu Nittani , Jun Miyamoto , Tatsuya Suzuki
发明人： Susumu Nittani , Jun Miyamoto , Tatsuya Suzuki
IPC分类号： G03G1508
摘要： A developing apparatus includes a developing frame having an opening portion a developer carrying member provided in the opening portion and is adapted to carry developer a developer charging member contacted with the developer carrying member and is adapted to charge the developer carried by the developer carrying member. A voltage is applied to the developer charging member. A holding member, provided at a longitudinal end portion of the developing frame, is adapted to hold the developer carrying member and the developer charging member.

78. 发明授权

US06401000B1 Fraction defective estimating method and system for estimating an assembly fraction defective of an article 有权
$Fraction defective estimating method and system for estimating an assembly fraction defective of an article$
标题翻译：用于估计制品的组装部分缺陷的分数缺陷估计方法和系统
公开(公告)号：US06401000B1
公开(公告)日：2002-06-04
申请号：US09566481
申请日：2000-05-08
申请人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
发明人： Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
IPC分类号： G06F1900
CPC分类号： G06Q10/06
摘要： A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.
摘要翻译：用于估计制造前的阶段中的物品的装配相关分数不良系数的方法和系统，例如，在设计阶段。作为数据输入组装操作，要组装的部件的属性/条件以及对组装工作中出现故障可能性具有重大影响的组装车间的条件。基于所输入的数据，通过执行组装相关分数缺陷值估计程序，以高精度算术地确定装配相关分数有缺陷的估计值。

79. 外观设计

USD456036S1 Digital camera 失效
公开(公告)号：USD456036S1
公开(公告)日：2002-04-23
申请号：US29146517
申请日：2001-08-08
申请人： Tatsuya Suzuki , Michio Imada
设计人： Tatsuya Suzuki , Michio Imada

80. 发明授权

US06324349B2 Camera having a sheath which is incorporated into the camera body without being distorted 有权
标题翻译：相机具有并入相机主体而不会变形的护套
公开(公告)号：US06324349B2
公开(公告)日：2001-11-27
申请号：US09360259
申请日：1999-07-26
申请人： Toshifumi Nakano , Shinya Takahashi , Tatsuya Suzuki
发明人： Toshifumi Nakano , Shinya Takahashi , Tatsuya Suzuki
IPC分类号： G03B1702
CPC分类号： G03B17/02
摘要： A camera comprising a camera sheath composed of a front cover unit and a rear cover unit, a camera body supported in the camera sheath, and positioning mechanism for positioning the camera body with respect to the camera sheath without fixing them. The positioning mechanism is composed of a pair of protrusions protruding from the front cover unit and a pair of hole portions formed in a reinforcing plate unit of the camera body and capable of being fitted individually on the protrusions. A gap of about 1 mm or less is formed in the whole area between the camera body and the camera sheath except fitting portions including the positioning mechanism.
摘要翻译：一种照相机，包括由前盖单元和后盖单元组成的相机外壳，支撑在相机外壳中的相机主体以及用于相机相对于相机外壳定位而不固定的定位机构。定位机构由从前盖单元突出的一对突起和形成在相机主体的加强板单元中的一对孔部分组成，并且能够单独地装配在突起上。除了包括定位机构的配合部分之外，在照相机主体和照相机外壳之间的整个区域中形成约1mm以下的间隙。

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