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61. 发明授权

US6016202A Method and apparatus for measuring material properties using transient-grating spectroscopy 失效
公开(公告)号：US6016202A
公开(公告)日：2000-01-18
申请号：US885555
申请日：1997-06-30
申请人： Martin Fuchs , John A. Rogers , Matthew J. Banet
发明人： Martin Fuchs , John A. Rogers , Matthew J. Banet
IPC分类号： G01B11/06 , G01B21/08 , G01N21/00 , G01N21/17 , G01N21/41 , G01N21/47 , G01N21/63 , G01B9/02
CPC分类号： G01B11/0666 , G01B11/06 , G01B21/085 , G01N21/1717 , G01N21/636
摘要： The invention provides an apparatus for measuring a property of a sample (using, e.g., ISTS) that includes: 1) an excitation laser that generates an excitation laser beam; 2) an optical system aligned along an optical axis that separates the excitation laser beam into at least three sub-beams; 3) an imaging system aligned along the optical axis that collects the sub-beams and focuses them onto the sample to form an optical interference pattern that generates a time-dependent response in the sample; 4) a probe laser that generates a probe laser beam that diffracts off the time-dependent response to form a signal beam; 5) a detector that detects the signal beam and in response generates a radiation-induced electronic response; and 6) a processor that processes the radiation-induced electronic response to determine the property of the sample.

62. 发明授权

US6004030A Calibration apparatus and methods for a thermal proximity sensor 有权
标题翻译：用于热接近传感器的校准装置和方法
公开(公告)号：US6004030A
公开(公告)日：1999-12-21
申请号：US152989
申请日：1998-09-14
申请人： David William Abraham , Erhard Theodor Schreck
发明人： David William Abraham , Erhard Theodor Schreck
IPC分类号： G01B21/08 , G01K15/00 , G01N25/72 , G11B5/00 , G11B5/012 , G11B5/455 , G11B5/48 , G11B5/58 , G01N25/00
CPC分类号： G11B5/012 , G01B21/085 , G01K15/00 , G11B5/455 , G11B5/58 , G11B2005/0016 , G11B2005/0021 , G11B5/00 , G11B5/4806
摘要： Apparatus and methods for calibrating a thermal proximity sensor are disclosed. Thermal responses from a thermal proximity sensor are used to sense the instantaneous distance between the sensor and a medium over which the sensor is moved, in a data storage system. Sensing the instantaneous distance results in detection of topographical variations on the medium. Calibration techniques for the sensor are disclosed herein and involve, in one aspect, using primarily electrical measurements to calibrate the sensor; and in another aspect, varying the distance between the sensor and the medium, obtaining actual thermal responses from the sensor, and using the actual responses (via direct comparison or curve fitting) to calibrate the sensor. In one embodiment, the sensor is a magnetoresistive access element used to access data on the medium.
摘要翻译：公开了用于校准热接近传感器的装置和方法。来自热接近传感器的热响应用于在数据存储系统中感测传感器和传感器移动介质之间的瞬时距离。感测瞬时距离会导致介质上的拓扑变化的检测。传感器的校准技术在此公开，并且在一个方面涉及主要使用电气测量来校准传感器; 并且在另一方面，改变传感器和介质之间的距离，获得来自传感器的实际热响应，并使用实际响应（通过直接比较或曲线拟合）校准传感器。在一个实施例中，传感器是用于访问介质上的数据的磁阻访问元件。

63. 发明授权

US5969238A Thermoelectric microprobe 失效
标题翻译：热电微探针
公开(公告)号：US5969238A
公开(公告)日：1999-10-19
申请号：US921179
申请日：1997-08-29
申请人： Robert Fischer
发明人： Robert Fischer
IPC分类号： G01B7/34 , G01B21/08 , G01B21/30 , G01K7/02 , G01K7/06 , G01N13/00 , G01N25/72 , G01Q60/58 , H01L35/00 , H01L35/32 , G01K13/00 , G01N25/00 , H01L35/02
CPC分类号： G01Q60/58 , B82Y35/00 , G01B21/085 , G01K7/028 , G01K7/06 , G01N25/72 , H01L35/00 , Y10S977/875
摘要： A microprobe for thermoelectric microscopic measurements comprises a probe body (11), which consists of a doped or intrinsically conductive semiconductor material and has at least one thermoelectric contact surface (19). The probe body (11) can carry a metal or semiconductor layer (17), which is separated from the probe body (11) by an insulating layer (16) except in the area of the thermoelectric contact surface (19). A process for the production of a microprobe for thermoelectric microscopic measurements is also given.
摘要翻译：用于热电显微镜测量的微探针包括探针体（11），其由掺杂或固有导电的半导体材料组成并且具有至少一个热电接触表面（19）。探针体11可以承载金属或半导体层17，该金属或半导体层17除了热电接触表面19的区域之外还通过绝缘层16与探针本体11分离。还给出了用于制造用于热电显微测量的微探针的方法。

64. 发明授权

US5961214A Determining protective layer thickness of blast furnaces 失效
标题翻译：确定高炉的保护层厚度
公开(公告)号：US5961214A
公开(公告)日：1999-10-05
申请号：US220898
申请日：1998-12-24
申请人： Richard J. Groth , Yongfu Zhao
发明人： Richard J. Groth , Yongfu Zhao
IPC分类号： C21B7/06 , G01B21/08 , G01K3/04 , G01K7/04 , G01K17/20 , G01N25/18 , G01N25/72
CPC分类号： G01N25/18 , C21B7/06 , G01B21/085 , G01K17/20 , G01K3/04 , G01K7/04 , G01N25/72
摘要： A method is provided for determining the thickness of a protective layer of solidified metal skull formed on the refractory hearth of a blast furnace. The refractory hearth has temperature probes embedded in the floor and walls thereof. The method includes periodically measuring temperatures indicated by the probes and determining the campaign maximum and current average temperature readings to locate two solidification isotherms representing the wear line of the refractory and the inner surface of the protective metal layer. The thickness of the protective layer is determined from the distance between the solidification isotherms representing the refractory wear line and the inner surface of the metal skull.
摘要翻译：提供了一种用于确定形成在高炉耐火炉底上的固化金属骷髅保护层的厚度的方法。耐火炉具有嵌入地板及其壁的温度探针。该方法包括周期性地测量由探针指示的温度，并确定活动最大值和当前平均温度读数以定位表示耐火材料的耐磨层和保护金属层的内表面的两个凝固等温线。保护层的厚度由代表难熔耐磨线的凝固等温线与金属颅骨的内表面之间的距离确定。

65. 发明公开

US20240219175A1 THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT DETECTION METHOD, AND DEFECT DETECTION DEVICE 审中-公开
公开(公告)号：US20240219175A1
公开(公告)日：2024-07-04
申请号：US18601648
申请日：2024-03-11
申请人： Panasonic Intellectual Property Management Co., Ltd.
发明人： Yousuke IRIE , Hirotsugu INOUE , Koutaro SAKAMOTO
IPC分类号： G01B21/08 , G01J5/00 , G01K3/04 , G01K3/06 , G01N25/72
CPC分类号： G01B21/085 , G01J5/0003 , G01N25/72 , G01J2005/0077 , G01K3/04 , G01K3/06
摘要： A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function.

66. 发明授权

US11965735B2 Thickness measurement method, thickness measurement device, defect detection method, and defect detection device 有权
公开(公告)号：US11965735B2
公开(公告)日：2024-04-23
申请号：US17395867
申请日：2021-08-06
申请人： PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
发明人： Yousuke Irie , Hirotsugu Inoue , Koutaro Sakamoto
IPC分类号： G01K3/06 , G01B21/08 , G01J5/00 , G01N25/72 , G01K3/04
CPC分类号： G01B21/085 , G01J5/0003 , G01N25/72 , G01J2005/0077 , G01K3/04 , G01K3/06
摘要： A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function.

67. 发明公开

US20240085175A1 SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF REFRACTORIES 审中-公开
公开(公告)号：US20240085175A1
公开(公告)日：2024-03-14
申请号：US18272152
申请日：2022-01-11
申请人： Saint-Gobain do Brasil Produtos Industriais e Para Construção Ltda.
发明人： Haysler Apolinário Amoroso LIMA
IPC分类号： G01B21/08
CPC分类号： G01B21/085
摘要： The present invention relates to a system and a method for measuring the thickness of refractories comprising a heat flux measuring device (10) for measuring the flow of heat flowing from a hot face to a cold face of the refractory, a core (11) surrounded by a thermally insulating jacket (12) comprising, in which the core (11) conducts, between a first (11a) and a second (11b) face, heat from the hot face of the refractory to the cold face of the refractory; and a measuring apparatus (20) configured to: continuously measure the temperature on the first face of the core and on the second face of the core; determining the heat flux flowing through the heat flow measuring device (10) and determining the thickness of the refractory material by means of equivalent thermal conductivity of the refractory material.

68. 发明授权

US10615085B2 Method for predicting thickness of oxide layer of silicon wafer 有权
公开(公告)号：US10615085B2
公开(公告)日：2020-04-07
申请号：US16172947
申请日：2018-10-29
申请人： SK SILTRON CO., LTD.
发明人： Jung Kil Park , Sung Woo Jung , Ja Young Kim
IPC分类号： H01L21/66 , H01L21/67 , G01B21/08
CPC分类号： H01L22/12 , G01B21/08 , H01L21/67103 , H01L22/20 , G01B21/085
摘要： An embodiment provides a method of predicting a thickness of an oxide layer of a silicon wafer including: aging a heat treatment furnace (furnace); measuring a thickness of each of the oxide layers after disposing a plurality of reference wafers in slots of a heat treatment boat in the furnace and forming oxide layers; and measuring a thickness of each of the oxide layers after disposing the plurality of reference wafers and test wafers in the slots of the heat treatment boat in the furnace and forming oxide layers.

69. 发明申请

US20180118470A1 CONTINUOUS BELT CONVEYOR MONITORING SYSTEMS AND METHODS 审中-公开
公开(公告)号：US20180118470A1
公开(公告)日：2018-05-03
申请号：US15337965
申请日：2016-10-28
申请人： Embraer S.A.
发明人： Paulo Anchieta DA SILVA , Ricardo Pinheiro RULLI
IPC分类号： B65G43/02 , B65G15/36
CPC分类号： B65G43/02 , B65G15/36 , B65G2203/0275 , B65G2203/041 , G01B21/085
摘要： An online real-time method of measuring the thickness of a moving belt uses infrared thermography technology to continuously and noninvasively measure the thickness of rubber cover regions and detect damage. This technique solves technical problems and realizes potential gains such as increased efficiency in planning maintenance/replacements of conveyor belts; provides rationalizations and advanced planning for stocking spare conveyor belts; provides a lookahead of acute wear at points to avoid premature wear or belt loss; generates a history of generating wear after each belt replacement with life projections and early planning acquisitions and operational stoppages for exchange; and provides early warning system integration.

70. 发明授权

US09464891B2 Method for measuring thickness by pulsed infrared thermal wave technology 有权
标题翻译：脉冲红外热波技术测量厚度的方法
公开(公告)号：US09464891B2
公开(公告)日：2016-10-11
申请号：US14002022
申请日：2011-06-14
申请人： Zhi Zeng , Xun Wang , Ning Tao , Lichun Feng , Cunlin Zhang
发明人： Zhi Zeng , Xun Wang , Ning Tao , Lichun Feng , Cunlin Zhang
IPC分类号： G01B21/08 , G01N25/72
CPC分类号： G01B21/085 , G01N25/72
摘要： A method for measuring thickness or defect depth by pulsed infrared thermal wave technology is described. The method includes heating a measured object by pulsed heating devices, and at the same time, obtaining a thermal image sequence on the surface of the measured object by an infrared thermography device, and storing the thermal image sequence in a general-purpose memory. The method also includes multiplying a temperature-time curve at every point of the thermal image sequence by a corresponding time, thereby obtaining a new curve. The method also includes calculating a first-order differential and obtaining a peak time thereof. The method also includes use of one or more formulas to thereby determine the thickness or the defect depth of the measured object.
摘要翻译：描述了通过脉冲红外热波技术测量厚度或缺陷深度的方法。该方法包括通过脉冲加热装置加热测量对象，同时通过红外热成像装置获得被测物体表面上的热图像序列，并将热图像序列存储在通用存储器中。该方法还包括将热图像序列的每个点处的温度 - 时间曲线乘以相应的时间，从而获得新的曲线。该方法还包括计算一阶差分并获得其峰值时间。该方法还包括使用一个或多个公式从而确定被测物体的厚度或缺陷深度。

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