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61. 发明授权

US5961214A Determining protective layer thickness of blast furnaces 失效
标题翻译：确定高炉的保护层厚度
公开(公告)号：US5961214A
公开(公告)日：1999-10-05
申请号：US220898
申请日：1998-12-24
申请人： Richard J. Groth , Yongfu Zhao
发明人： Richard J. Groth , Yongfu Zhao
IPC分类号： C21B7/06 , G01B21/08 , G01K3/04 , G01K7/04 , G01K17/20 , G01N25/18 , G01N25/72
CPC分类号： G01N25/18 , C21B7/06 , G01B21/085 , G01K17/20 , G01K3/04 , G01K7/04 , G01N25/72
摘要： A method is provided for determining the thickness of a protective layer of solidified metal skull formed on the refractory hearth of a blast furnace. The refractory hearth has temperature probes embedded in the floor and walls thereof. The method includes periodically measuring temperatures indicated by the probes and determining the campaign maximum and current average temperature readings to locate two solidification isotherms representing the wear line of the refractory and the inner surface of the protective metal layer. The thickness of the protective layer is determined from the distance between the solidification isotherms representing the refractory wear line and the inner surface of the metal skull.
摘要翻译：提供了一种用于确定形成在高炉耐火炉底上的固化金属骷髅保护层的厚度的方法。耐火炉具有嵌入地板及其壁的温度探针。该方法包括周期性地测量由探针指示的温度，并确定活动最大值和当前平均温度读数以定位表示耐火材料的耐磨层和保护金属层的内表面的两个凝固等温线。保护层的厚度由代表难熔耐磨线的凝固等温线与金属颅骨的内表面之间的距离确定。

62. 发明公开

US20240219175A1 THICKNESS MEASUREMENT METHOD, THICKNESS MEASUREMENT DEVICE, DEFECT DETECTION METHOD, AND DEFECT DETECTION DEVICE 审中-公开
公开(公告)号：US20240219175A1
公开(公告)日：2024-07-04
申请号：US18601648
申请日：2024-03-11
申请人： Panasonic Intellectual Property Management Co., Ltd.
发明人： Yousuke IRIE , Hirotsugu INOUE , Koutaro SAKAMOTO
IPC分类号： G01B21/08 , G01J5/00 , G01K3/04 , G01K3/06 , G01N25/72
CPC分类号： G01B21/085 , G01J5/0003 , G01N25/72 , G01J2005/0077 , G01K3/04 , G01K3/06
摘要： A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function.

63. 发明授权

US11965735B2 Thickness measurement method, thickness measurement device, defect detection method, and defect detection device 有权
公开(公告)号：US11965735B2
公开(公告)日：2024-04-23
申请号：US17395867
申请日：2021-08-06
申请人： PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
发明人： Yousuke Irie , Hirotsugu Inoue , Koutaro Sakamoto
IPC分类号： G01K3/06 , G01B21/08 , G01J5/00 , G01N25/72 , G01K3/04
CPC分类号： G01B21/085 , G01J5/0003 , G01N25/72 , G01J2005/0077 , G01K3/04 , G01K3/06
摘要： A thickness measurement method includes: heating a surface of the measurement object in a dot shape by a heating device; generating a thermal image corresponding to a temperature of the surface of the measurement object by capturing an image of the heated surface of the measurement object at a predetermined time interval by an imaging device; acquiring temperature data indicating temporal changes in temperature at multiple positions on the surface of the measurement object based on the thermal image generated by the imaging device; fitting a solution function indicating a solution of a heat conduction equation corresponding to a point heat source and including a parameter related to the thickness of the measurement object to the temperature data; and calculating the thickness of the measurement object based on a value of the parameter in the fitted solution function.

64. 发明公开

US20240085175A1 SYSTEM AND METHOD FOR MEASURING THE THICKNESS OF REFRACTORIES 审中-公开
公开(公告)号：US20240085175A1
公开(公告)日：2024-03-14
申请号：US18272152
申请日：2022-01-11
申请人： Saint-Gobain do Brasil Produtos Industriais e Para Construção Ltda.
发明人： Haysler Apolinário Amoroso LIMA
IPC分类号： G01B21/08
CPC分类号： G01B21/085
摘要： The present invention relates to a system and a method for measuring the thickness of refractories comprising a heat flux measuring device (10) for measuring the flow of heat flowing from a hot face to a cold face of the refractory, a core (11) surrounded by a thermally insulating jacket (12) comprising, in which the core (11) conducts, between a first (11a) and a second (11b) face, heat from the hot face of the refractory to the cold face of the refractory; and a measuring apparatus (20) configured to: continuously measure the temperature on the first face of the core and on the second face of the core; determining the heat flux flowing through the heat flow measuring device (10) and determining the thickness of the refractory material by means of equivalent thermal conductivity of the refractory material.

65. 发明授权

US10615085B2 Method for predicting thickness of oxide layer of silicon wafer 有权
公开(公告)号：US10615085B2
公开(公告)日：2020-04-07
申请号：US16172947
申请日：2018-10-29
申请人： SK SILTRON CO., LTD.
发明人： Jung Kil Park , Sung Woo Jung , Ja Young Kim
IPC分类号： H01L21/66 , H01L21/67 , G01B21/08
CPC分类号： H01L22/12 , G01B21/08 , H01L21/67103 , H01L22/20 , G01B21/085
摘要： An embodiment provides a method of predicting a thickness of an oxide layer of a silicon wafer including: aging a heat treatment furnace (furnace); measuring a thickness of each of the oxide layers after disposing a plurality of reference wafers in slots of a heat treatment boat in the furnace and forming oxide layers; and measuring a thickness of each of the oxide layers after disposing the plurality of reference wafers and test wafers in the slots of the heat treatment boat in the furnace and forming oxide layers.

66. 发明申请

US20180118470A1 CONTINUOUS BELT CONVEYOR MONITORING SYSTEMS AND METHODS 审中-公开
公开(公告)号：US20180118470A1
公开(公告)日：2018-05-03
申请号：US15337965
申请日：2016-10-28
申请人： Embraer S.A.
发明人： Paulo Anchieta DA SILVA , Ricardo Pinheiro RULLI
IPC分类号： B65G43/02 , B65G15/36
CPC分类号： B65G43/02 , B65G15/36 , B65G2203/0275 , B65G2203/041 , G01B21/085
摘要： An online real-time method of measuring the thickness of a moving belt uses infrared thermography technology to continuously and noninvasively measure the thickness of rubber cover regions and detect damage. This technique solves technical problems and realizes potential gains such as increased efficiency in planning maintenance/replacements of conveyor belts; provides rationalizations and advanced planning for stocking spare conveyor belts; provides a lookahead of acute wear at points to avoid premature wear or belt loss; generates a history of generating wear after each belt replacement with life projections and early planning acquisitions and operational stoppages for exchange; and provides early warning system integration.

67. 发明授权

US09464891B2 Method for measuring thickness by pulsed infrared thermal wave technology 有权
标题翻译：脉冲红外热波技术测量厚度的方法
公开(公告)号：US09464891B2
公开(公告)日：2016-10-11
申请号：US14002022
申请日：2011-06-14
申请人： Zhi Zeng , Xun Wang , Ning Tao , Lichun Feng , Cunlin Zhang
发明人： Zhi Zeng , Xun Wang , Ning Tao , Lichun Feng , Cunlin Zhang
IPC分类号： G01B21/08 , G01N25/72
CPC分类号： G01B21/085 , G01N25/72
摘要： A method for measuring thickness or defect depth by pulsed infrared thermal wave technology is described. The method includes heating a measured object by pulsed heating devices, and at the same time, obtaining a thermal image sequence on the surface of the measured object by an infrared thermography device, and storing the thermal image sequence in a general-purpose memory. The method also includes multiplying a temperature-time curve at every point of the thermal image sequence by a corresponding time, thereby obtaining a new curve. The method also includes calculating a first-order differential and obtaining a peak time thereof. The method also includes use of one or more formulas to thereby determine the thickness or the defect depth of the measured object.
摘要翻译：描述了通过脉冲红外热波技术测量厚度或缺陷深度的方法。该方法包括通过脉冲加热装置加热测量对象，同时通过红外热成像装置获得被测物体表面上的热图像序列，并将热图像序列存储在通用存储器中。该方法还包括将热图像序列的每个点处的温度 - 时间曲线乘以相应的时间，从而获得新的曲线。该方法还包括计算一阶差分并获得其峰值时间。该方法还包括使用一个或多个公式从而确定被测物体的厚度或缺陷深度。

68. 发明授权

US09279664B2 Device for measuring slab thickness 有权
标题翻译：板厚测量装置
公开(公告)号：US09279664B2
公开(公告)日：2016-03-08
申请号：US14125738
申请日：2012-06-15
申请人： Michel Dussud , Fabien Dejean
发明人： Michel Dussud , Fabien Dejean
IPC分类号： B22D41/08 , G01B11/06 , B22D11/18 , G01B21/08 , G01F23/24 , B22D46/00 , C21C5/46 , C21C5/52
CPC分类号： G01B11/06 , B22D11/181 , B22D46/00 , C21C5/4673 , C21C2005/5288 , G01B21/085 , G01F23/245 , Y02P10/216
摘要： A device for measuring the thickness of slag on the surface of liquid metal contained in an ingot mould comprises a wire made of electrically conductive material and capable of being eliminated under the effect of the heat at the temperature of the slag, the wire having a free end able to be dipped into the slag, a wire feeder capable of displacing the wire so that its free end dips vertically into the slag according to a predetermined trajectory, a wire displacement measurer capable of measuring a distance travelled by the free end of the wire during a time interval between two predetermined events when the latter is displaced under the action of the feeding means, and a wire feeder controller having a molten metal contact detector capable of detecting contact between the free end and the surface of the liquid metal.
摘要翻译：用于测量包含在铸锭模具中的液态金属表面上的渣的厚度的装置包括由导电材料制成的线，并且能够在炉渣的温度下在热的作用下被去除，该线具有自由端部能够浸入炉渣中，该送丝机能够移动线材，使得其自由端根据预定轨迹垂直地垂直进入炉渣，能够测量由电线自由端行进的距离的电线排量测量器在两个预定事件之间的时间间隔期间，当后者在进给装置的作用下移位时，以及具有能够检测液态金属的自由端和表面之间的接触的熔融金属接触检测器的送丝机控制器。

69. 发明授权

US09134165B2 Method for detecting accretion or abrasion in a flow measuring device 有权
标题翻译：用于检测流量测量装置中的吸积或磨损的方法
公开(公告)号：US09134165B2
公开(公告)日：2015-09-15
申请号：US13565158
申请日：2012-08-02
申请人： Michael Kirst , Alfred Rieder , Wolfgang Drahm , Hao Zhu , Christof Huber , Vivek Kumar
发明人： Michael Kirst , Alfred Rieder , Wolfgang Drahm , Hao Zhu , Christof Huber , Vivek Kumar
IPC分类号： G01K13/12 , G01F25/00 , G01B21/08 , G01N3/56 , G01N17/00 , G01F1/84 , G01K3/04 , G01B11/06
CPC分类号： G01F25/0007 , G01B11/06 , G01B21/085 , G01F1/8436 , G01F1/8477 , G01K3/04 , G01N3/56 , G01N17/008
摘要： A method for detecting accretion or abrasion on a first measuring tube of a flow measuring device. A first temperature as a function of time is registered via a first temperature sensor, which is arranged on the first measuring tube in such a manner that, between the first temperature sensor and the medium, at least one measuring tube wall of the first measuring tube is embodied. Parallel in time, a second reference temperature as a function of time is registered by a second temperature sensor, which is spaced from the first temperature sensor and thermally coupled to the medium. Therefrom, at least one variable characteristic is determined, and accretion or abrasion on the first measuring tube is detected, if the at least one determined characteristic variable or a variable derived therefrom deviates by more than a limit value from a predetermined reference variable.
摘要翻译：一种用于检测流量测量装置的第一测量管上的吸积或磨损的方法。作为时间的函数的第一温度通过第一温度传感器来记录，第一温度传感器布置在第一测量管上，使得在第一温度传感器和介质之间，第一测量管的至少一个测量管壁体现了通过与第一温度传感器间隔开并热耦合到介质的第二温度传感器来记录作为时间的函数的第二参考温度。由此，确定至少一个可变特性，并且如果所述至少一个确定的特征变量或其导出的变量偏离预定参考变量的极限值，则检测到第一测量管上的吸积或磨损。

70. 发明申请

US20150042316A1 APPARATUS AND METHOD OF MONITORING FOR MATTER ACCUMULATION ON AN AIRCRAFT SURFACE 有权
标题翻译：监控航空器表面物质累积的装置和方法
公开(公告)号：US20150042316A1
公开(公告)日：2015-02-12
申请号：US14370421
申请日：2013-01-07
申请人： Instrumar Limited
发明人： Stuart Inkpen , Chris Nolan , Bill Conway , Dana Linfield , David Bonnell , Joshua Swamidas , Ruth Abraham
IPC分类号： B64D15/20 , G01K13/00 , G01R19/00
CPC分类号： B64D15/20 , B64D15/22 , G01B7/06 , G01B21/085 , G01K13/00 , G01R19/0092 , G08B19/02
摘要： A method of monitoring the accumulation of matter on an external surface of an aircraft involves applying varying electric fields to the aircraft surface, and a sensor monitor receiving a time-series of measurements of a temperature of the aircraft surface and a phase and a magnitude of a current induced in an electric field sensor unit from the varying electric fields. The electric field sensor unit is mounted proximate the aircraft surface. The time-series of the measurements varies in accordance with the instantaneous accumulation of matter on the aircraft surface. The sensor monitor generates an assessment of the accumulation of matter on the aircraft surface from a correlation of the time-series of the measurements with at least one predetermined matter accumulation profile. Each predetermined matter accumulation profile comprises a corresponding time-series of current phase, current magnitude and temperature measurements.
摘要翻译：监测飞机外表面上的物质累积的方法包括对飞机表面施加变化的电场，以及传感器监测器，其接收飞行器表面的温度的时间序列测量值和相位和大小在电场传感器单元中从变化的电场感应的电流。电场传感器单元安装在飞机表面附近。测量的时间序列根据飞机表面物质的瞬时积累而变化。传感器监视器根据测量的时间序列与至少一个预定的物质积累轮廓的相关性，对飞机表面上物质的积累进行评估。每个预定物质累积分布包括相应的时间序列的当前相位，电流幅度和温度测量。

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