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    • 62. 发明申请
    • PATTERN FORMATION METHOD
    • 模式形成方法
    • US20080193882A1
    • 2008-08-14
    • US11958661
    • 2007-12-18
    • Masayuki EndoMasaru Sasago
    • Masayuki EndoMasaru Sasago
    • G03F7/20
    • G03F7/0035G03F7/2041
    • After forming a lower layer film, an intermediate layer film and a first resist film on a substrate, a first resist pattern is formed by performing first exposure. Then, after a first intermediate layer pattern is formed by transferring the first resist pattern onto the intermediate layer film, a second resist film is formed thereon, and a second resist pattern is formed by performing second exposure. Thereafter, a second intermediate layer pattern is formed by transferring the second resist pattern onto the intermediate layer film. After removing the second resist film, the lower layer film is etched by using the second intermediate layer pattern as a mask, so as to form a lower layer pattern.
    • 在基板上形成下层膜,中间层膜和第一抗蚀剂膜之后,通过进行第一曝光来形成第一抗蚀剂图案。 然后,在通过将第一抗蚀剂图案转印到中间层膜上形成第一中间层图案之后,在其上形成第二抗蚀剂膜,并通过进行第二曝光形成第二抗蚀剂图案。 此后,通过将第二抗蚀剂图案转印到中间层膜上来形成第二中间层图案。 在除去第二抗蚀剂膜之后,通过使用第二中间层图案作为掩模来蚀刻下层膜,以形成下层图案。
    • 64. 发明授权
    • Composition for forming porous film, porous film and method for forming the same, interlevel insulator film, and semiconductor device
    • 用于形成多孔膜的组合物,多孔膜及其形成方法,层间绝缘膜和半导体器件
    • US07341775B2
    • 2008-03-11
    • US10706861
    • 2003-11-12
    • Yoshitaka HamadaFujio YagihashiHideo NakagawaMasaru Sasago
    • Yoshitaka HamadaFujio YagihashiHideo NakagawaMasaru Sasago
    • H01L23/48
    • H01L21/02126C08K5/19C09D183/02C09D183/04H01L21/02203H01L21/02216H01L21/02282H01L21/31695Y10T428/249953Y10T428/31649Y10T428/31663
    • Provided are a composition for forming film which can form a porous film excelling in dielectric constant, adhesiveness, uniformity of the film, mechanical strength and having low hygroscopicity; a porous film and a method for forming the film; and a high-performing and highly reliable semiconductor device comprising the porous film inside. More specifically, provided is a composition for forming porous film, comprising a surfactant and a solution comprising polymer obtainable by hydrolyzing and condensing, in the presence of the surfactant, one or more of alkoxysilane represented by Formula (1) and one or more of alkoxysilane represented by Formula (2): (R1)mSi(OR2)4-m  (1) R3Si(R4)n(OR5)3-n  (2) Also provided is a method for forming porous film comprising a step of applying said composition on a substrate to form film and a step of transforming the film into porous film.
    • 提供一种可形成介电常数,粘合性,膜均匀性,机械强度和吸湿性低的多孔膜的成膜用组合物。 多孔膜和形成膜的方法; 以及内部具有多孔膜的高性能,高可靠性的半导体装置。 更具体地,提供了一种用于形成多孔膜的组合物,其包含表面活性剂和包含可通过在表面活性剂存在下水解和缩合获得的聚合物的溶液,所述聚合物可由一种或多种由式(1)表示的烷氧基硅烷和一种或多种烷氧基硅烷 由式(2)表示:<?in-line-formula description =“In-line Formulas”end =“lead”?>(R&lt; 1&gt;)&lt; (1)<?in-line-formula description =“In-line Formulas”end =“tail”?> <?in-line -formulae description =“In-line Formulas”end =“lead”?> R <3> Si(R 4) 3-n(2)<?in-line-formula description =“In-line Formulas”end =“tail”?>还提供了形成多孔的方法 薄膜,其包括在基材上涂布所述组合物以形成薄膜的步骤和将薄膜转变成多孔薄膜的步骤。
    • 70. 发明申请
    • Water-soluble material, chemically amplified resist and pattern formation method using the same
    • 水溶性材料,化学放大抗蚀剂和使用其的图案形成方法
    • US20070082292A1
    • 2007-04-12
    • US11602377
    • 2006-11-21
    • Masayuki EndoMasaru Sasago
    • Masayuki EndoMasaru Sasago
    • G03C1/00
    • G03F7/11G03F7/0045G03F7/0392G03F7/095
    • A water-soluble material used for forming a water-soluble film on a chemically amplified resist film includes a water-soluble polymer, an acid generator and a compound constructing an inclusion compound for incorporating the acid generator. Also, in a pattern formation method, a chemically amplified resist film is formed on a substrate, and a water-soluble film made of a water-soluble material including a water-soluble polymer, an acid generator and a compound constructing an inclusion compound for incorporating the acid generator is formed on the resist film. Thereafter, pattern exposure is carried out by selectively irradiating the resist film with exposing light through the water-soluble film, the resultant resist film is developed and the water-soluble film is removed. Thus, a resist pattern made of the resist film is formed.
    • 用于在化学放大抗蚀剂膜上形成水溶性膜的水溶性材料包括水溶性聚合物,酸产生剂和构成用于掺入酸产生剂的包合物的化合物。 此外,在图案形成方法中,在基板上形成化学放大抗蚀剂膜,以及由水溶性材料构成的水溶性膜,所述水溶性物质包含水溶性聚合物,酸产生剂和构成包合物的化合物, 在抗蚀剂膜上形成并入酸产生剂。 此后,通过选择性地照射通过水溶性膜曝光光的抗蚀剂膜来进行图案曝光,使得到的抗蚀剂膜显影并除去水溶性膜。 因此,形成由抗蚀剂膜制成的抗蚀剂图案。