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    • 61. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06603219B2
    • 2003-08-05
    • US09801472
    • 2001-03-08
    • Masaomi ToyamaShiro DoshoNaoshi Yanagisawa
    • Masaomi ToyamaShiro DoshoNaoshi Yanagisawa
    • H02J100
    • H03K17/005H01L24/06H01L2224/05554H01L2224/49175H01L2924/14H03K3/03H03K17/693Y10T307/391Y10T307/461Y10T307/492H01L2924/00
    • A semiconductor integrated circuit includes a plurality of units. Each of the units includes a power supply pad, a function circuit, and a power supply control circuit. The plurality of units each have a first state in which the function circuit is in an operating state by the power supply pad being at a prescribed operating potential and a second state in which the function circuit is in a non-operating state by the power supply pad being at a prescribed non-operating potential. The power supply control circuit includes a switching circuit for connecting the power supply pad to the prescribed non-operating potential. The power supply control circuit in each of the plurality of units closes the switching circuit when at least one of the other units is in the first state and opens the switching circuit otherwise.
    • 半导体集成电路包括多个单元。 每个单元包括电源焊盘,功能电路和电源控制电路。 所述多个单元各自具有第一状态,其中所述功能电路处于处于规定操作电位的所述功率电路处于工作状态,以及所述功能电路通过所述电源处于非工作状态的第二状态 垫处于规定的非操作电位。 电源控制电路包括用于将电源焊盘连接到规定的非工作电位的开关电路。 当多个单元中的至少一个处于第一状态时,多个单元中的每个单元中的电源控制电路闭合开关电路,否则打开开关电路。
    • 65. 发明授权
    • Analog circuit automatic calibration system
    • 模拟电路自动校准系统
    • US07254507B2
    • 2007-08-07
    • US10915345
    • 2004-08-11
    • Shiro DoshoNaoshi YanagisawaMasaomi ToyamaKeijiro Umehara
    • Shiro DoshoNaoshi YanagisawaMasaomi ToyamaKeijiro Umehara
    • G01R35/02
    • G01R35/005G01R31/316
    • An analog circuit automatic calibration system for calibrating an object circuit that is an analog circuit having a characteristic changing with an input set value. The system includes: a set value storage section for storing a value and outputting the value to the object circuit as the set value; a characteristic detection section for detecting the characteristic of the object circuit; a first characteristic change section for determining the set value so that the characteristic of the object circuit is optimized; a second characteristic change section for updating the set value so that the characteristic of the object circuit is maintained, using an algorithm different from that used in the first characteristic change section; and a selector for selecting either one of the outputs of the first and second characteristic sections to enable the selected one to be stored in the set value storage section.
    • 一种模拟电路自动校准系统,用于校准作为具有随着输入设定值变化的特性的模拟电路的目标电路。 该系统包括:设定值存储部分,用于存储值并将该值输出到对象电路作为设定值; 用于检测所述目标电路的特性的特性检测部分; 用于确定所述设定值使得所述对象电路的特性被优化的第一特征变化部分; 第二特征变化部,使用与第一特征变化部中使用的算法不同的算法来更新设定值,使得保持对象电路的特性; 以及选择器,用于选择第一和第二特征部分的输出之一,以使所选择的一个存储在设定值存储部分中。
    • 66. 发明授权
    • Current driver and display device
    • 当前驱动和显示设备
    • US07145379B2
    • 2006-12-05
    • US10815800
    • 2004-04-02
    • Yoshito DateTetsuro OmoriShiro DoshoMakoto Mizuki
    • Yoshito DateTetsuro OmoriShiro DoshoMakoto Mizuki
    • H03K17/687G09G3/36
    • G09G3/3283G09G3/3241G09G2310/027G09G2320/0233G09G2330/028
    • The first and second chips are provided side by side. The first chip includes: a current supply section for outputting a drive current, the current supply section including a current mirror; a current distribution MISFET; a current input MISFET for transmitting an electric current to the current supply section, the current input MISFET being connected to the current distribution MISFET; and a second current distribution MISFET. The current distribution MISFET and the second current distribution MISFET constitute a current mirror. The second chip includes a second current input MISFET which is connected to the second current distribution MISFET. The ratio between the W/L ratio of the current distribution MISFET and the W/L ratio of the current input MISFET connected thereto is the same in the first and second chips.
    • 第一和第二芯片并排设置。 第一芯片包括:电流供应部分,用于输出驱动电流;电流供应部分包括电流镜; 电流分布MISFET; 电流输入MISFET,用于将电流传输到电流供应部分,电流输入MISFET连接到电流分布MISFET; 和第二电流分布MISFET。 电流分布MISFET和第二电流分布MISFET构成电流镜。 第二芯片包括连接到第二电流分布MISFET的第二电流输入MISFET。 电流分布MISFET的W / L比与与其连接的电流输入MISFET的W / L比之间的比率在第一和第二芯片中是相同的。
    • 67. 发明申请
    • Pipelined A/D converter and method for correcting output of the same
    • 流水线A / D转换器及其输出校正方法
    • US20060049973A1
    • 2006-03-09
    • US11218784
    • 2005-09-06
    • Shiro DoshoTakashi Morie
    • Shiro DoshoTakashi Morie
    • H03M1/38
    • H03M1/1038H03M1/168
    • Analog inputs to a controllable stage can be switched by an input selecting section, while digital inputs to a D/A converter in the controllable stage can also be switched. An error calculation section calculates an error in the output of the pipelined A/D converter caused by an error in the analog output of the controllable stage, based on the output of the pipelined A/D converter produced when the controllable stage is in a given input state, and an expected value thereof. A correction value generation section generates a correction value for correcting the output of the pipelined A/D converter, based on the calculated error. An output correction section corrects the output of a digital calculation section based on the generated correction value.
    • 可以通过输入选择部分切换到可控级的模拟输入,而可控切换到D / A转换器的数字输入也可以切换。 误差计算部分基于在可控级在给定的时间内产生的流水线A / D转换器的输出,计算由可控级的模拟输出中的误差引起的流水线A / D转换器的输出中的误差 输入状态及其期望值。 校正值生成部基于计算出的误差来生成校正流水线式A / D转换器的输出的校正值。 输出校正部根据生成的校正值来校正数字计算部的输出。
    • 70. 发明授权
    • Analog FIFO memory device
    • 模拟FIFO存储器件
    • US06466273B1
    • 2002-10-15
    • US09076848
    • 1998-05-13
    • Shiro DoshoNaoshi Yanagisawa
    • Shiro DoshoNaoshi Yanagisawa
    • H04N52136
    • G06J1/00
    • An analog FIFO memory device allowing for the suppression of the adverse effects produced by fixed pattern noise, generated inside an analog FIFO memory, on signal components. First and second analog multipliers are respectively provided on the input and output sides of the analog FIFO memory. In synchronism with the inputs/outputs of signals to/from the analog FIFO memory, a non-inverting operation and an inverting operation are alternately and repeatedly performed on the input signals and the output signals. Then, although the signal input/output characteristics of the analog FIFO memory are not changed, the fixed pattern noise generated inside the analog FIFO memory is modulated by the second analog multiplier. As a result, the spectrum of the fixed pattern noise, which originally has a lower frequency, is shifted to have a higher frequency. That is to say, since a signal band can be separated from the fixed pattern noise in terms of frequency, the fixed pattern noise can be eliminated by a low pass filter. Consequently, even when the analog FIFO memory device of the present invention is applied for delaying TV signals, the resulting TV image quality is not deteriorated.
    • 模拟FIFO存储器件允许抑制由模拟FIFO存储器内部产生的固定模式噪声对信号分量产生的不利影响。 第一和第二模拟乘法器分别设置在模拟FIFO存储器的输入和输出侧。 与来自/来自模拟FIFO存储器的信号的输入/输出同步,对输入信号和输出信号交替重复执行非反相操作和反相操作。 然后,虽然模拟FIFO存储器的信号输入/输出特性没有改变,但在模拟FIFO存储器内产生的固定模式噪声被第二模拟乘法器调制。 结果,原来具有较低频率的固定图案噪声的频谱被移位以具有较高的频率。 也就是说,由于信号频带可以根据频率与固定模式噪声分离,因此可以通过低通滤波器消除固定模式噪声。 因此,即使当本发明的模拟FIFO存储器件用于延迟TV信号时,所得到的TV图像质量也不会恶化。