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    • 63. 发明授权
    • Method and apparatus for producing photoelectric conversion device
    • 光电转换装置的制造方法及装置
    • US06391743B1
    • 2002-05-21
    • US09401775
    • 1999-09-22
    • Masaaki IwaneTakao YoneharaKazuaki OhmiShoji NishidaKiyofumi SakaguchiKazutaka Yanagita
    • Masaaki IwaneTakao YoneharaKazuaki OhmiShoji NishidaKiyofumi SakaguchiKazutaka Yanagita
    • H01L2130
    • H01L31/072H01L21/67092H01L21/76254H01L2221/68363Y02E10/50
    • There is disclosed a method of producing a photoelectric conversion device comprising the steps of forming a semiconductor substrate comprising a first and a second semiconductor layers with a separation layer therebetween; bonding a support substrate to a surface of the second semiconductor layer opposite to the separation-layer-side surface to form a bonded substrate; separating the first and the second semiconductor layers by the separation layer; and producing a photoelectric conversion device in the second semiconductor layer, wherein when bonding the semiconductor substrate and the support substrate to each other, at least a portion is formed in the bonded substrate in which at least a part of end portions of the semiconductor substrate and the support substrate is not bonded to the other substrate and a fluid is jetted against a side surface of the bonded substrate, thereby separating the first and the second semiconductor layers. The method makes it possible to separate a bonded substrate with a high yield, thereby supplying photoelectric conversion devices with a high quality at a low production cost.
    • 公开了一种制造光电转换装置的方法,包括以下步骤:形成包括第一和第二半导体层的半导体衬底,其间具有分离层; 将支撑基板接合到与分离层侧表面相对的第二半导体层的表面,以形成键合衬底; 通过分离层分离第一和第二半导体层; 以及在所述第二半导体层中制造光电转换器件,其中当将所述半导体衬底和所述支撑衬底彼此接合时,至少一部分形成在所述键合衬底中,其中所述半导体衬底和所述支撑衬底的至少一部分端部和 支撑基板不与另一个基板接合,并且流体相对于键合衬底的侧表面喷射,从而分离第一和第二半导体层。 该方法可以以高产率分离粘合的基片,从而以低的生产成本提供高质量的光电转换装置。
    • 66. 发明授权
    • Fabrication process for a semiconductor substrate
    • 半导体衬底的制造工艺
    • US06294478B1
    • 2001-09-25
    • US08807604
    • 1997-02-27
    • Kiyofumi SakaguchiTakao Yonehara
    • Kiyofumi SakaguchiTakao Yonehara
    • H01L2100
    • H01L21/76259
    • SOI substrates are fabricated with sufficient quality and with good reproducibility. At the same time, conservation of resources and reduction of cost are realized by reuse of the wafer and the like. Carried out to achieve the above are a step of bonding a principal surface of a first substrate to a principal surface of a second substrate, the first substrate being Si substrate in which at least one layer of non-porous thin film is formed through a porous Si layer, a step of exposing the porous Si layer in a side surface of a bonding substrate comprised of the first substrate and the second substrate, a step of dividing the porous Si layer by oxidizing the bonding substrate, and a step of removing the porous Si and oxidized porous Si layer on the second substrate separated by the division of the porous Si layer.
    • 以足够的质量和良好的再现性制造SOI衬底。 同时,通过重复利用晶片等来实现资源的节约和成本的降低。为了实现上述目的,将第一基板的主面与第二基板的主面接合, 所述第一衬底是通过多孔Si层形成至少一层非多孔薄膜的Si衬底,在由所述第一衬底和所述第二衬底构成的接合衬底的侧表面中暴露所述多孔Si层的步骤 衬底,通过氧化接合衬底来分离多孔Si层的步骤,以及除去由多孔Si层划分分离的第二衬底上的多孔Si和氧化多孔Si层的步骤。
    • 70. 发明授权
    • Method for producing semiconductor substrate
    • 半导体衬底的制造方法
    • US5854123A
    • 1998-12-29
    • US729722
    • 1996-10-07
    • Nobuhiko SatoTakao YoneharaKiyofumi Sakaguchi
    • Nobuhiko SatoTakao YoneharaKiyofumi Sakaguchi
    • H01L21/20H01L21/02H01L21/265H01L21/322H01L21/762H01L27/12H01L31/18H01L21/76
    • H01L21/02032H01L21/3221H01L21/3223H01L21/3226H01L21/76251H01L21/76254H01L21/76259H01L31/1892Y02E10/50
    • A method is provided for producing, with high reproducibility, an SOI substrate which is flat and high in quality, and simultaneously for achieving resources saving and reduction in cost through recycling of a substrate member. For accomplishing this, a porous-forming step is performed forming a porous Si layer on at least a surface of an Si substrate and a large porosity layer forming step is performed for forming a large porosity layer in the porous Si layer. This large porosity layer forming step is performed by implanting ions into the porous Si layer with a given projection range or by changing current density of anodization in said porous-forming step. At this time, a non-porous single-crystal Si layer is epitaxial-grown on the porous Si layer. Thereafter, the surface of the porous Si layer and a support substrate are bonded together, and then separation is performed at the porous Si layer with the large porosity. Subsequently, selective etching is performed to remove the porous Si layer.
    • 提供了一种以高再现性制造平坦且质量高的SOI衬底的方法,同时用于通过再循环衬底构件实现资源节省和降低成本。 为了实现这一点,在Si衬底的至少一个表面上进行形成多孔Si层的多孔形成步骤,并且进行大孔隙层形成步骤以在多孔Si层中形成大孔隙率层。 通过将离子注入到具有给定投影范围的多孔Si层中或通过改变所述多孔形成步骤中的阳极氧化的电流密度来进行该大孔隙率层形成步骤。 此时,在多孔Si层上外延生长无孔单晶Si层。 此后,将多孔Si层和支撑基板的表面接合在一起,然后在具有大孔隙率的多孔Si层上进行分离。 随后,进行选择性蚀刻以去除多孔Si层。