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    • 63. 发明授权
    • Image displaying device and method for manufacturing same
    • 图像显示装置及其制造方法
    • US07335915B2
    • 2008-02-26
    • US11585967
    • 2006-10-25
    • Yoshiaki ToyotaMutsuko Hatano
    • Yoshiaki ToyotaMutsuko Hatano
    • H01L29/04
    • H01L27/12H01L27/1248
    • A technique for improving the manufacturing yield of an image displaying device is disclosed. A fabrication method of the image displaying device includes the steps of forming on an insulative substrate a plurality of island-like semiconductor layers, forming a gate insulating film on the island-like semiconductor layers, defining more than one contact hole in the gate insulating film, forming a gate electrode on the gate insulator film for causing the island-like semiconductor layer to be in contact with the gate insulator film, forming a source region, a drain region and a channel region interposed therebetween in the island-like semiconductor layer, forming an interlayer dielectric (ILD) film on the gate electrode, forming source/drain electrodes contacted with the source and drain regions and the ILD film, defining a through-hole(s) after formation of the source/drain electrodes, and removing a contact portion of the island-like semiconductor layer and gate electrode.
    • 公开了一种提高图像显示装置的制造成品率的技术。 图像显示装置的制造方法包括以下步骤:在绝缘基板上形成多个岛状半导体层,在岛状半导体层上形成栅极绝缘膜,在栅极绝缘膜中限定多于一个的接触孔 在所述栅极绝缘膜上形成用于使所述岛状半导体层与所述栅极绝缘膜接触的栅电极,在所述岛状半导体层中形成源极区域,漏极区域和沟道区域, 在栅电极上形成层间电介质(ILD)膜,形成与源极和漏极区域接触的源/漏电极和ILD膜,在形成源极/漏极之后限定通孔,并且去除 岛状半导体层和栅电极的接触部分。
    • 64. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    • 半导体器件及其制造方法
    • US20070155070A1
    • 2007-07-05
    • US11620154
    • 2007-01-05
    • Kiyoshi OUCHIMutsuko HatanoTakeshi SatoMitsuharu Tai
    • Kiyoshi OUCHIMutsuko HatanoTakeshi SatoMitsuharu Tai
    • H01L21/84
    • H01L21/02683H01L21/02532H01L21/02691H01L21/2026H01L27/1285
    • An image display device capable of high-resolution and smooth moving image display, equipped with TFTs in an n-type (or p-type) semiconductor layer with a high on-off ratio and a low resistance. In polysilicon crystallization by laser annealing, an n-type (or p-type) semiconductor layer with a low resistance is produced by performing the following processes in order: implanting nitrogen (N) ions into an amorphous silicon precursor semiconductor film; laser crystallization; implanting n-type (or p-type) dopant ions; and annealing for dopant activation. When fabricating TFTs, this low-resistance semiconductor layer is used to form a source and a drain. Since C, N, and O impurities decrease the mobility of the TFTs, polysilicon is used in which the contaminants concentrations meet the following conditions: carbon concentration ≦3×1019 cm−3, nitrogen concentration ≦5×1017 cm−3, and oxygen concentration ≦3×1019 cm−3.
    • 一种具有高分辨率和平滑运动图像显示的图像显示装置,在具有高开关比和低电阻的n型(或p型)半导体层中配备有TFT。 在通过激光退火的多晶硅结晶中,通过以下步骤进行以下工序来制造具有低电阻的n型(或p型)半导体层:将氮(N)离子注入到非晶硅前驱体半导体膜中; 激光结晶; 注入n型(或p型)掺杂剂离子; 并进行掺杂剂激活退火。 当制造TFT时,该低电阻半导体层用于形成源极和漏极。 由于C,N和O杂质降低了TFT的迁移率,所以使用多晶硅,其中污染物浓度满足以下条件:碳浓度<= 3×10 9 / >,氮浓度<= 5×10 17 cm -3,氧浓度<= 3×10 9 cm -3 -3 / 。
    • 65. 发明申请
    • Image displaying device and method for manufacturing same
    • 图像显示装置及其制造方法
    • US20070096209A1
    • 2007-05-03
    • US11585967
    • 2006-10-25
    • Yoshiaki ToyotaMutsuko Hatano
    • Yoshiaki ToyotaMutsuko Hatano
    • H01L27/12H01L27/01H01L21/84H01L21/00H01L31/0392
    • H01L27/12H01L27/1248
    • A technique for improving the manufacturing yield of an image displaying device is disclosed. A fabrication method of the image displaying device includes the steps of forming on an insulative substrate a plurality of island-like semiconductor layers, forming a gate insulating film on the island-like semiconductor layers, defining more than one contact hole in the gate insulating film, forming a gate electrode on the gate insulator film for causing the island-like semiconductor layer to be in contact with the gate insulator film, forming a source region, a drain region and a channel region interposed therebetween in the island-like semiconductor layer, forming an interlayer dielectric (ILD) film on the gate electrode, forming source/drain electrodes contacted with the source and drain regions and the ILD film, defining a through-hole(s) after formation of the source/drain electrodes, and removing a contact portion of the island-like semiconductor layer and gate electrode.
    • 公开了一种提高图像显示装置的制造成品率的技术。 图像显示装置的制造方法包括以下步骤:在绝缘基板上形成多个岛状半导体层,在岛状半导体层上形成栅极绝缘膜,在栅极绝缘膜中限定多于一个的接触孔 在所述栅极绝缘膜上形成用于使所述岛状半导体层与所述栅极绝缘膜接触的栅电极,在所述岛状半导体层中形成源极区域,漏极区域和沟道区域, 在栅电极上形成层间电介质(ILD)膜,形成与源极和漏极区域接触的源/漏电极和ILD膜,在形成源/漏电极之后限定出一个或多个通孔, 岛状半导体层和栅电极的接触部分。
    • 66. 发明授权
    • Apparatus for manufacturing flat panel display devices
    • 用于制造平板显示装置的装置
    • US07193693B2
    • 2007-03-20
    • US10991482
    • 2004-11-19
    • Akio YazakiMikio HongoMutsuko HatanoTakeshi Noda
    • Akio YazakiMikio HongoMutsuko HatanoTakeshi Noda
    • G01N21/00G01J1/00B23K26/06
    • B23K26/073B23K26/702H01L27/14625
    • A mechanism for always measuring the spatial intensity distribution of a laser beam and displacement of the optical axis of the laser beam is provided so that a measured signal is processed when the laser beam incident on a laser beam shaping optical element is out of a predetermined condition. The shape, diameter and incidence position of the laser beam incident on the laser beam shaping optical element are always kept in the predetermined condition by a spatial filter disposed at the position of a focal point of lenses forming a beam expander disposed in the optical axis, on the basis of a result of the signal processing.In this manner, silicon thin films uniform in crystallinity can be formed stably with a high yield on an insulating substrate which forms display panels of flat panel display devices.
    • 提供用于总是测量激光束的空间强度分布和激光束的光轴位移的机构,使得当入射到激光束整形光学元件上的激光束处于预定条件时,处理测量信号 。 入射到激光束整形光学元件上的激光束的形状,直径和入射位置总是通过设置在设置在光轴上的形成光束扩展器的透镜的焦点的位置处的空间滤光器保持在预定条件, 基于信号处理的结果。 以这种方式,可以在形成平板显示装置的显示面板的绝缘基板上以高产率稳定地形成结晶度均匀的硅薄膜。
    • 70. 发明授权
    • Thin film crystal growth by laser annealing
    • US06635932B2
    • 2003-10-21
    • US10213698
    • 2002-08-06
    • Costas P. GrigoropoulosMutsuko HatanoMing-Hong LeeSeung-Jae Moon
    • Costas P. GrigoropoulosMutsuko HatanoMing-Hong LeeSeung-Jae Moon
    • H01L2362
    • H01L21/02686H01L21/2026
    • A layer of material is transformed from a first state to a second state by the application of energy from an energy beam. For example, large direction- and location-controlled p-Si grain growth utilizes recrystallization of amorphous silicon from superpositioned laser irradiation. The superpositioned laser irradiation controls cooling and solidification processes that determine the resulting crystal structure. Specifically, a first laser beam of a first pulse duration is used to melt an amorphous silicon (a-Si) film and to create a temperature gradient. After an initial delay, a second laser beam with shorter pulse duration is superpositioned with the first laser beam. When a-Si is irradiated by the second laser beam, the area heated by the first laser beam becomes completely molten. Spontaneous nucleation is initiated in the supercooled liquid-Si when the liquid-Si temperature drops below the nucleation temperature. However, the central part of the liquid pool subjected to continued heating by the first laser beam cools down slowly. Grains nucleated in the periphery of the fully molten spot can therefore grow into the liquid-Si and extend in length until they collide at the center of the first laser beam spot. The first laser beam prolongs the molten Si phase and induces grain growth in a certain direction. The second laser beam triggers nucleation and controls grain location leading to subsequent lateral grain growth.