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    • 61. 发明授权
    • Content addressable memory using phase change devices
    • 内容可寻址内存使用相变设备
    • US07751217B2
    • 2010-07-06
    • US12166311
    • 2008-07-01
    • Chung H. LamBrian L. JiRobert K. MontoyeBipin Rajendran
    • Chung H. LamBrian L. JiRobert K. MontoyeBipin Rajendran
    • G11C15/00
    • G11C13/0004G11C15/046
    • Content addressable memory device utilizing phase change devices. An aspect of the content addressable memory device is the use of a comparatively lower power search-line access element and a comparatively higher power word-line access element. The word-line access element is only utilized during write operations and the search-line access element is only utilized during search operations. The word-line access element being electrically coupled to a second end of a phase change memory element and a word-line. The search-line access element also being electrically coupled to the second end of the phase change memory element and a search-line. The search-line being electrically coupled to a match-line. A bit-line is electrically coupled to a first end of the phase change memory element. Additionally, a complementary set of access elements, a complementary phase change memory element, a complementary search-line, and a complementary bit-line are also included in the content addressable memory device.
    • 使用相变装置的内容寻址存储装置。 内容可寻址存储器件的一个方面是使用相对较低功率的搜索线访问元件和相对较高功率的字线访问元件。 字线访问元件仅在写入操作期间使用,并且搜索线访问元件仅在搜索操作期间被使用。 字线访问元件电耦合到相变存储器元件的第二端和字线。 搜索线访问元件还电耦合到相变存储元件的第二端和搜索线。 搜索线电耦合到匹配线。 位线电耦合到相变存储元件的第一端。 此外,内容可寻址存储器件中还包括互补的一组存取元件,互补相变存储器元件,互补搜索线和互补位线。
    • 62. 发明授权
    • Multi-level cell programming of PCM by varying the reset amplitude
    • 通过改变复位幅度对PCM进行多级单元编程
    • US07944740B2
    • 2011-05-17
    • US12564904
    • 2009-09-22
    • Chung H. LamMing-Hsiu LeeThomas NirschiBipin Rajendran
    • Chung H. LamMing-Hsiu LeeThomas NirschiBipin Rajendran
    • G11C11/00
    • G11C13/0004G11C11/5678G11C13/0069G11C2013/0083G11C2013/0092
    • A phase change memory device and a method for programming the same. The method includes determining a characterized lowest SET current and corresponding SET resistance for the phase change memory device. The method includes determining a characterized RESET current slope for the phase change memory device. The method also includes calculating a first current amplitude for a RESET pulse based on the characterized lowest SET current and the characterized RESET current slope. The method includes applying the RESET pulse to a target memory cell in the phase change memory device and measuring the resistance of the target memory cell. If the measured resistance is substantially less than a target resistance, the method further includes applying one or more additional RESET pulses. In one embodiment of the invention, the one or more additional RESET pulses have current amplitudes greater than a previously applied RESET pulse.
    • 相变存储器件及其编程方法。 该方法包括确定用于相变存储器件的特征最低的SET电流和相应的SET电阻。 该方法包括确定用于相变存储器件的特征化的RESET电流斜率。 该方法还包括基于所表征的最低SET电流和表征的RESET电流斜率来计算RESET脉冲的第一电流幅度。 该方法包括将RESET脉冲施加到相变存储器件中的目标存储单元并测量目标存储单元的电阻。 如果所测量的电阻远小于目标电阻,该方法还包括应用一个或多个附加的RESET脉冲。 在本发明的一个实施例中,一个或多个附加的RESET脉冲的电流幅度大于先前施加的RESET脉冲。
    • 64. 发明申请
    • HIGH DENSITY TERNARY CONTENT ADDRESSABLE MEMORY
    • 高密度内容可寻址存储器
    • US20100265748A1
    • 2010-10-21
    • US12427484
    • 2009-04-21
    • Chung H. LamBipin Rajendran
    • Chung H. LamBipin Rajendran
    • G11C15/00G11C11/00G11C11/56
    • G11C15/046G11C11/5678G11C13/0004
    • A content addressable memory device with a plurality of memory cells storing data words. Each data bit in the data words is set to one of three values of a first binary value, a second binary value, and a don't care value. An aspect of the content addressable memory device is the use of a single memory element and an access device in the memory cells. The memory cells are arranged such that each memory cell is electrically coupled to a single bit line, a single match line, and a single word line. The memory elements in the memory cells store low resistance states if the data bit value is the first binary value, high resistance states if the data bit value is the second binary value, and very high resistance states if the data bit value is the don't care value.
    • 一种具有存储数据字的多个存储器单元的内容可寻址存储器件。 数据字中的每个数据位被设置为第一二进制值,第二二进制值和不关心值的三个值之一。 内容可寻址存储器件的一个方面是在存储器单元中使用单个存储器元件和存取器件。 存储器单元被布置成使得每个存储器单元电耦合到单个位线,单个匹配线和单个字线。 如果数据位值是第一个二进制值,则存储器单元中的存储元件存储低电阻状态,如果数据位值是第二个二进制值则为高电阻状态,如果数据位值为“ 关心价值。
    • 66. 发明授权
    • Method to create a uniformly distributed multi-level cell (MLC) bitstream from a non-uniform MLC bitstream
    • 从非均匀MLC比特流创建均匀分布的多级单元(MLC)比特流的方法
    • US07606067B2
    • 2009-10-20
    • US11774539
    • 2007-07-06
    • Chung H. LamBipin Rajendran
    • Chung H. LamBipin Rajendran
    • G11C16/04
    • G11C11/56G11C11/5628G11C16/3418G11C29/00
    • A method, system, and computer software product for operating a collection of memory cells. Each memory cell in the collection of memory cells is configured to store a binary multi-bit value delimited by characteristic parameter bands. In one embodiment, a transforming unit transforms an original collection of data to a transformed collection of data using a reversible mathematical operator. The original collection of data has binary multi-bit values arbitrarily distributed across the binary multi-bit values assigned to the characteristic parameter bands and the transformed collection of data has binary multi-bit values substantially uniformly distributed across the binary multi-bit values assigned to the characteristic parameter bands.
    • 一种用于操作存储器单元集合的方法,系统和计算机软件产品。 存储器单元集合中的​​每个存储器单元被配置为存储由特征参数带限定的二进制多位值。 在一个实施例中,变换单元使用可逆数学运算符将原始数据集合转换成变换的数据集合。 原始数据集合具有任意分配给分配给特征参数带的二进制多位值的二进制多位值,并且变换的数据集合具有基本上均匀分布在分配给二进制多位值的二进制多位值的二进制多位值 特征参数带。
    • 69. 发明申请
    • TERNARY CONTENT ADDRESSABLE MEMORY USING PHASE CHANGE DEVICES
    • 使用相位变更设备的内容可寻址存储器
    • US20100226161A1
    • 2010-09-09
    • US12399346
    • 2009-03-06
    • Brian L. JiChung H. LamRobert K. MontoyeBipin Rajendran
    • Brian L. JiChung H. LamRobert K. MontoyeBipin Rajendran
    • G11C15/00G11C11/00G11C11/56
    • G11C15/046G11C13/0004
    • A content addressable memory device with a plurality of memory cells storing ternary data values of high, low, and don't care. An aspect of the content addressable memory device is the use of first memory elements and second memory elements in the memory cells. The first and second memory elements are electrically coupled in parallel circuit to a match-line. The first memory elements are coupled to first word-lines and the second memory elements are coupled to second word-lines. The first memory elements are configured to store low resistance states if the ternary data value is low and high resistance states if the ternary data value is either high or don't care. The second memory elements are configured to store the low resistance states if the ternary data value is high and the high resistance states if the ternary data value is either low or don't care.
    • 一种具有多个存储单元的内容可寻址存储器件,其存储高,低和不关心的三进制数据值。 内容可寻址存储器件的一个方面是在存储器单元中使用第一存储器元件和第二存储器元件。 第一和第二存储器元件以并联电路电耦合到匹配线。 第一存储器元件耦合到第一字线,并且第二存储器元件耦合到第二字线。 如果三进制数据值低,则第一存储器元件被配置为存储低电阻状态,并且如果三进制数据值高或不在乎,则高电阻状态。 如果三进制数据值高,则第二存储器元件被配置为存储低电阻状态,并且如果三进制数据值为低或不关心,则存在高电阻状态。