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    • 62. 发明授权
    • Apparatus and method for testing air bag control unit of vehicle
    • 车辆气囊控制单元测试装置及方法
    • US08571760B2
    • 2013-10-29
    • US12956471
    • 2010-11-30
    • Chang Beom YouSang Uk ChuJung-Pil NamDong-Hyun Kim
    • Chang Beom YouSang Uk ChuJung-Pil NamDong-Hyun Kim
    • G01M17/00
    • G01M99/008
    • A system testing the air bag control unit of a vehicle testing an air bag control unit of a vehicle summing a first signal shaken by a shaker and a second signal provided from the signal control apparatus to generate a sum-sensing signal, and generating a determining signal for evaluation regarding presence of an operation of an air bag based on the sum-sensing signal, is provided. The system testing an air bag control unit of a vehicle, includes: a shaker control unit generating a first signal and start-synchronizing information regarding the first signal; a shaker shaking an air bag control unit according to a frequency of the first signal; a signal control unit time-synchronizing and transferring the second signal with the first signal using the start-synchronizing information to the air bag control unit; and an air bag control unit generating a sum-sensing signal regarding the first signal and the second signal, generating and transferring a determining signal for evaluation regarding presence of an operation of an air bag based on the sum-sensing signal to the signal control unit.
    • 一种对车辆的气囊控制单元进行测试,所述车辆对车辆的气囊控制单元进行加速,所述车辆对振动器摇动的第一信号和从所述信号控制装置提供的第二信号相加,以生成和感测信号, 提供了关于基于和感测信号的气囊的操作的评估的信号。 系统测试车辆的气囊控制单元,包括:振荡器控制单元,其产生第一信号和关于第一信号的开始同步信息; 摇动器,根据所述第一信号的频率摇动安全气囊控制单元; 信号控制单元使用开始同步信息将第二信号与第一信号进行时间同步并传送到气囊控制单元; 以及气囊控制单元,其生成关于所述第一信号和所述第二信号的和感信号,基于所述和感测信号生成并传送用于评估关于气囊的操作的确定信号的信号到所述信号控制单元 。
    • 67. 发明申请
    • APPARATUS AND METHOD FOR TESTING AIR BAG CONTROL UNIT OF VEHICLE
    • 用于测试车辆空气袋控制单元的装置和方法
    • US20120078464A1
    • 2012-03-29
    • US12956471
    • 2010-11-30
    • Chang Beom YouSang Uk ChuJung-Pil NamDong-Hyun Kim
    • Chang Beom YouSang Uk ChuJung-Pil NamDong-Hyun Kim
    • G06F19/00
    • G01M99/008
    • A system testing the air bag control unit of a vehicle testing an air bag control unit of a vehicle summing a first signal shaken by a shaker and a second signal provided from the signal control apparatus to generate a sum-sensing signal, and generating a determining signal for evaluation regarding presence of an operation of an air bag based on the sum-sensing signal, is provided. The system testing an air bag control unit of a vehicle, includes: a shaker control unit generating a first signal and start-synchronizing information regarding the first signal; a shaker shaking an air bag control unit according to a frequency of the first signal; a signal control unit time-synchronizing and transferring the second signal with the first signal using the start-synchronizing information to the air bag control unit; and an air bag control unit generating a sum-sensing signal regarding the first signal and the second signal, generating and transferring a determining signal for evaluation regarding presence of an operation of an air bag based on the sum-sensing signal to the signal control unit.
    • 一种对车辆的气囊控制单元进行测试,所述车辆对车辆的气囊控制单元进行加速,所述车辆对振动器摇动的第一信号和从所述信号控制装置提供的第二信号相加,以生成和感测信号, 提供了关于基于和感测信号的气囊的操作的评估的信号。 系统测试车辆的气囊控制单元,包括:振荡器控制单元,其产生第一信号和关于第一信号的开始同步信息; 摇动器,根据所述第一信号的频率摇动安全气囊控制单元; 信号控制单元使用开始同步信息将第二信号与第一信号进行时间同步并传送到气囊控制单元; 以及气囊控制单元,其生成关于所述第一信号和所述第二信号的和感信号,基于所述和感测信号生成并传送用于评估关于气囊的操作的确定信号的信号到所述信号控制单元 。
    • 69. 发明授权
    • Method of fabricating semiconductor device having self-aligned contact plug
    • 制造具有自对准接触插头的半导体器件的方法
    • US07799643B2
    • 2010-09-21
    • US12112438
    • 2008-04-30
    • Nam-Jung KangDong-Soo WooHyeong-Sun HongDong-Hyun Kim
    • Nam-Jung KangDong-Soo WooHyeong-Sun HongDong-Hyun Kim
    • H01L21/336
    • H01L27/10888H01L21/76897H01L27/10855
    • Methods of fabricating a semiconductor device having a self-aligned contact plug are provided. Methods include forming a lower insulating layer on a semiconductor substrate, forming a plurality of interconnection patterns parallel to each other on the lower insulating layer; forming an upper insulating layer that is configured to fill between the interconnection patterns, and forming a plurality of first mask patterns crossing the plurality of interconnection patterns, ones of the plurality of first mask patterns parallel to each other on the semiconductor substrate having the upper insulating layer. Methods may include forming a second mask pattern that is self-aligned to the plurality of first mask patterns and that is between ones of the plurality of first mask patterns, etching the upper insulating layer and the lower insulating layer using the first and second mask patterns and the plurality of interconnection patterns as etch masks to form a plurality of contact holes exposing the semiconductor substrate, and forming a plurality of contact plugs in respective ones of the plurality of contact holes. Semiconductor devices are also provided.
    • 提供制造具有自对准接触插头的半导体器件的方法。 方法包括在半导体衬底上形成下绝缘层,在下绝缘层上形成彼此平行的多个互连图案; 形成上部绝缘层,其被构造成填充在所述互连图案之间,并且形成与所述多个互连图案交叉的多个第一掩模图案,所述多个第一掩模图案中的所述第一掩模图案在所述半导体衬底上彼此平行, 层。 方法可以包括形成第二掩模图案,该第二掩模图案与多个第一掩模图案自对准,并且在多个第一掩模图案中的一个之间,使用第一和第二掩模图案蚀刻上绝缘层和下绝缘层 以及所述多个互连图案作为蚀刻掩模,以形成暴露所述半导体衬底的多个接触孔,以及在所述多个接触孔中的相应接触孔中形成多个接触插塞。 还提供了半导体器件。
    • 70. 发明授权
    • Dynamic random access memory devices and methods of forming the same
    • 动态随机存取存储器件及其形成方法
    • US07714372B2
    • 2010-05-11
    • US12070875
    • 2008-02-21
    • Dong-Hyun Kim
    • Dong-Hyun Kim
    • H01L27/108
    • H01L27/0207H01L27/10855H01L27/10888
    • Dynamic random access memory (DRAM) devices include first node pads and second node pads alternately arranged in a first direction on a substrate to form a first pad column. A width of the second node pads in a second direction, perpendicular to the first direction, is greater than a width of the first node pads in the second direction. Storage electrodes are electrically connected to the first node pads and the second node pads. Bit line pads may be arranged in the first direction on the substrate to form a second pad column. The second pad column is adjacent the first pad column and displaced therefrom in the second direction.
    • 动态随机存取存储器(DRAM)装置包括在衬底上沿第一方向交替布置的第一节点焊盘和第二节点焊盘,以形成第一焊盘柱。 垂直于第一方向的第二方向的第二节点焊盘的宽度大于第二方向上的第一节点焊盘的宽度。 存储电极电连接到第一节点焊盘和第二节点焊盘。 位线焊盘可以在衬底上沿第一方向布置以形成第二焊盘柱。 第二垫柱与第一垫柱相邻并且在第二方向上从其移位。