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    • 69. 发明授权
    • Lithographic apparatus, and mechanism
    • 平版印刷设备和机构
    • US07525643B2
    • 2009-04-28
    • US11228464
    • 2005-09-19
    • Hans Butler
    • Hans Butler
    • G03B27/58G03B27/62H01H47/00
    • G03F7/70825G03F7/7025
    • A lithographic apparatus has a mechanism with a movable element, at least partially made from a magnetizable material. The movable element is movable between a first position and a second position. A pretensioner exerts a pretension force on the movable element urging it to the first position. A permanent magnet produces a magnetic field exerting a force on the movable element urging it to the second position. A coil produces, when energized in a first direction, a magnetic field exerting a force on the movable element urging it to the second position. The combined magnetic field of the magnet and the coil exerts a force on the movable element which is higher than the pretension force.
    • 光刻设备具有至少部分地由可磁化材料制成的具有可移动元件的机构。 可移动元件可在第一位置和第二位置之间移动。 预紧器对可移动元件施加预紧力,将其推动到第一位置。 永磁体产生一个向可移动元件施加力的磁场,从而将其推到第二位置。 当线圈在第一方向上被激励时,产生一个向可动元件施力的第二位置的磁场。 磁体和线圈的组合磁场对可动元件施加大于预紧力的力。
    • 70. 发明申请
    • Lithographic apparatus having feedthrough control system
    • 具有馈通控制系统的平版印刷设备
    • US20080239264A1
    • 2008-10-02
    • US11730189
    • 2007-03-29
    • Hans Butler
    • Hans Butler
    • G03B27/42G03B27/52
    • G03F7/70725G03F7/70775
    • An optical component of the lithographic apparatus is moved. A substrate support is moved so as to be synchronous with the motion of the optical component. A momentary position of the optical component is measured. A momentary position of the substrate support is measured at a first sampling rate. The measured momentary position of the optical component is compared with a desired momentary position of the optical component to generate an optical component position error signal in accordance with a difference between the two optical component positions. The measured momentary position of the substrate support is compared with a desired momentary position of the substrate support to generate a substrate support position error signal in accordance with a difference between the two substrate support positions. The momentary position of the optical component is adjusted so as to compensate for the difference between the two substrate support positions.
    • 移动光刻设备的光学部件。 移动基板支撑件以与光学部件的运动同步。 测量光学部件的瞬时位置。 以第一采样率测量衬底支撑件的瞬时位置。 将光学部件的测量的瞬时位置与光学部件的期望的瞬时位置进行比较,以根据两个光学部件位置之间的差异产生光学部件位置误差信号。 将基板支撑件的测量的瞬时位置与基板支撑件的期望的瞬时位置进行比较,以根据两个基板支撑位置之间的差异产生基板支撑位置误差信号。 调整光学部件的瞬时位置,以便补偿两个基板支撑位置之间的差异。