会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 61. 发明授权
    • Image extraction method and apparatus, and image recognition method and
apparatus for extracting/recognizing specific images from input image
signals
    • 图像提取方法和装置,以及用于从输入图像信号中提取/识别特定图像的图像识别方法和装置
    • US6115495A
    • 2000-09-05
    • US904617
    • 1997-08-01
    • Michiyoshi TachikawaToshio MiyazawaAkihiko Hirano
    • Michiyoshi TachikawaToshio MiyazawaAkihiko Hirano
    • G06K9/20G06K9/36G06K9/46G06K9/62
    • G06K9/4647G06K9/00463G06K9/46G06K9/4652
    • A circumscribing rectangle is obtained for a black continuous image part using a two-tone image signal. If it is determined that the image part is possibly one which is obtained as a result of rotating the object, lengths of sides of the image part are compared with threshold values. If it is determined that the image part is not one which is obtained as a result of rotating the object, the height and horizontal length of the circumscribing rectangle are compared with the threshold values. Thus, it is determined whether or not the image part is identical to the object. An RGB chromaticity histogram is produced for each of small regions of an input color image. Each of the chromaticity histograms of the small regions is compared with reference ones. As a result of the comparison, an identification number of the reference histogram having the highest similarity to that of the small region among those constituting the input image is given to the small region. A histogram of the identification numbers thus is produced for the input color image. The thus-produced histogram is used to determine which one of a plurality of objects is identical to the input color image.
    • 对于使用双色调图像信号的黑色连续图像部分获得外接矩形。 如果确定图像部分可能是由于旋转对象而获得的图像部分,则将图像部分的边的长度与阈值进行比较。 如果确定图像部分不是作为旋转物体的结果获得的图像部分,则将外接矩形的高度和水平长度与阈值进行比较。 因此,确定图像部分是否与对象相同。 为输入彩色图像的每个小区域产生RGB色度直方图。 将每个小区域的色度直方图与参考图像进行比较。 作为比较的结果,在小区域中给出与构成输入图像的那些区域中具有与小区域相似度最高的参考直方图的识别号。 因此,为输入彩色图像产生识别号码的直方图。 由此产生的直方图用于确定多个对象中的哪一个与输入彩色图像相同。
    • 62. 发明授权
    • Inspecting method and apparatus for semiconductor integrated circuit
    • 半导体集成电路检测方法和装置
    • US6037793A
    • 2000-03-14
    • US15065
    • 1998-01-28
    • Toshio MiyazawaMasataka HattaMasahiko Akiyama
    • Toshio MiyazawaMasataka HattaMasahiko Akiyama
    • G01R31/26G01R31/28H01L21/66G01R1/02
    • G01R31/2851G01R31/2831G01R31/2874G01R31/287
    • According to the present invention, a main chuck, on which a wafer having a number of devices is held, is driven under the control of a computer, and the devices on the wafer are brought into electric contact with the probes arranged on the upper side of the main chuck. On the basis of outputs from the probes, a tester sequentially measures the electric characteristics of the devices. When a heat-generating type device is measured, the inspecting method and apparatus of the present invention execute the following steps step of predicting the temperature of the device under measurement on the basis of the amount of heat generated from the device under measurement, step of predicting the temperatures of the devices that surround the device under measurement, step of selecting next-measurement devices (which are suitable for next measurement in light of their temperatures) from among the devices the temperatures of which are predicted in step, and calculating the position coordinates of the next-measurement devices, and a step of repeating the steps with respect to each of the devices, adding the distance between the device under measurement and the next-measurement device to the already-calculated distance, and selecting the shortest measurement route along which all devices are measured.
    • 根据本发明,在计算机的控制下驱动其上保持有多个器件的晶片的主卡盘,并且将晶片上的器件与布置在上侧的探针电接触 的主卡盘。 根据探头的输出,测试仪依次测量设备的电气特性。 当测量发热型装置时,本发明的检查方法和装置执行以下步骤:根据测量装置产生的热量预测测量装置的温度,步骤 预测在测量装置周围的装置的温度,从步骤中预测其温度的装置中选择下一次测量装置(其适合于其温度的下次测量)的步骤,并计算位置 下一测量装置的坐标,以及重复相对于每个装置的步骤的步骤,将测量装置与下一测量装置之间的距离加到已经计算的距离上,并选择最短测量路线 测量所有设备。
    • 65. 发明授权
    • Photosensor device
    • 光电传感器设备
    • US08576314B2
    • 2013-11-05
    • US13041645
    • 2011-03-07
    • Kozo YasudaToshio Miyazawa
    • Kozo YasudaToshio Miyazawa
    • H01L31/062H04N3/14
    • H04N5/228Y02E10/50
    • The present invention provides a photosensor device including: a photodiode array in which photodiodes are arranged in an array shape; scanning lines which are coupled to first electrodes of the photodiodes in respective lines of the photodiode array; read lines which are coupled to second electrodes of the photodiodes in respective columns of the photodiode array; a scanning circuit which is coupled to the scanning lines and sequentially supplies a selected scanning signal to the respective scanning lines in each horizontal scanning period; and a signal processing circuit which is coupled to the read lines and loads each voltage fluctuation of the read lines in one horizontal scanning period as signal voltage when reading a signal, wherein each of the photodiodes is made of amorphous silicon or microcrystal silicon, and forward bias voltage is applied to each of the photodiodes when reading a signal.
    • 本发明提供一种光电传感器装置,包括:光电二极管阵列,其中光电二极管排列成阵列形状; 扫描线,其耦合到光电二极管阵列的各行中的光电二极管的第一电极; 读取线,其耦合到光电二极管阵列的各个列中的光电二极管的第二电极; 扫描电路,耦合到扫描线,并且在每个水平扫描周期中顺序地将所选择的扫描信号提供给各扫描线; 以及信号处理电路,其耦合到读取线并且在读取信号时在一个水平扫描周期中将读取线的每个电压波动加载为信号电压,其中每个光电二极管由非晶硅或微晶硅制成,并且向前 当读取信号时,偏置电压施加到每个光电二极管。