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61. 发明授权

US11971424B2 Automatic analyzer 有权
公开(公告)号：US11971424B2
公开(公告)日：2024-04-30
申请号：US17043354
申请日：2019-03-20
申请人： HITACHI HIGH-TECH CORPORATION , ROCHE DIAGNOSTICS OPERATIONS, INC.
发明人： Yuichi Hirabayashi , Dai Inagi , Satoshi Yokotsuka , Youichi Aruga , Mohamed Abouelsoud
IPC分类号： G01N33/68 , A01N1/02 , B01L3/00 , C07C309/65 , C07C309/73 , G01N1/40 , G01N21/01 , G01N21/31 , G01N21/33 , G01N21/64 , G01N27/414 , G01N33/52 , G01N33/532 , G01N33/543 , G01N33/569 , G01N33/72 , G01N35/00 , G01N35/02 , G01N35/04 , G01N35/10
CPC分类号： G01N35/025 , G01N35/00623 , G01N35/1002 , G01N35/1065 , G01N2035/00465 , G01N2035/00653 , G01N2035/00891 , G01N2035/0443 , G01N2035/0453
摘要： An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (8, 9, and 16), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.

62. 发明公开

US20240134175A1 OPTICAL FILTERING DEVICE, METHOD OF CONTROLLING OPTICAL FILTERING DEVICE, AND MEMS SHUTTER 审中-公开
公开(公告)号：US20240134175A1
公开(公告)日：2024-04-25
申请号：US18278487
申请日：2021-03-24
申请人： Hitachi High-Tech Corporation
发明人： Yasuhiro YOSHIMURA , Masatoshi KANAMARU , Takanori AONO , Hitoyuki TOMOTSUNE , Yuko OTANI , Nobuhiko KANZAKI
IPC分类号： G02B21/00
CPC分类号： G02B21/0016
摘要： Provided is a highly reliable optical filtering device used as a spatial filter for an optical inspection apparatus and configured to prevent a shutter from sticking to a wall surface of a shutter opening. The optical filtering device includes the shutter openable and closeable by voltage control and a substrate having the shutter opening serving as a movable range of the shutter, in which the substrate includes a sticking prevention part configured to prevent the shutter from sticking to the wall surface of the shutter opening when the shutter is opened.

63. 发明公开

US20240128049A1 ELECTRON MICROSCOPE 审中-公开
公开(公告)号：US20240128049A1
公开(公告)日：2024-04-18
申请号：US18572544
申请日：2021-08-31
申请人： HITACHI HIGH-TECH CORPORATION
发明人： Katsura TAKAGUCHI , Takashi OHSHIMA , Hideo MORISHITA , Yoichi OSE , Junichi KATANE , Toshihide AGEMURA , Michio HATANO
IPC分类号： H01J37/244 , H01J37/26 , H01J37/28
CPC分类号： H01J37/244 , H01J37/265 , H01J37/28
摘要： An object of the invention is to provide an electron microscope capable of obtaining a sufficient energy resolution without forming a long drift space and capable of attaining high energy discrimination detection performance with approximately the same device size as in the related art. The electron microscope according to the invention includes a pulsed electron emission mechanism configured to emit an electron beam in a pulsed manner, and discriminates energy of signal electrons by discriminating the signal electrons, which are emitted from a sample by irradiating the sample with the electron beam, according to a time of flight (see FIG. 2).

64. 发明授权

US11959895B2 Analysis apparatus provided with a plurality of chromatographic apparatuses 有权
公开(公告)号：US11959895B2
公开(公告)日：2024-04-16
申请号：US16961344
申请日：2018-11-30
申请人： HITACHI HIGH-TECH CORPORATION , Roche Diagnostics Operations, Inc.
发明人： Daisuke Akieda , Takayuki Sugime , Izumi Ogata , Makoto Nogami
IPC分类号： G01N30/60 , G01N30/24 , G01N30/34 , G01N30/72
CPC分类号： G01N30/6043 , G01N30/24 , G01N30/34 , G01N30/7233
摘要： The analysis apparatus includes a standby section which is provided between a dispensing operation of an analysis item B′ prior to an analysis item C and the sample analysis channel introduction. The sample analysis channel introduction is arranged prior to a data collection section of an analysis item A. The operation is started earlier but after a sample dispensing operation section of the analysis item A. A sample dispensing operation section of the analysis item C can be started earlier and the analysis time of the analysis item C can be moved to immediately after a sample analysis operation section of the analysis item B′. The analysis item A in a second cycle can be started earlier by the early start time of the analysis item C in a first cycle. A total processing time Tc can be shorter than a total processing time Tb.

65. 发明公开

US20240120174A1 Ion Milling Device 审中-公开
公开(公告)号：US20240120174A1
公开(公告)日：2024-04-11
申请号：US18273325
申请日：2021-01-22
申请人： Hitachi High-Tech Corporation
发明人： Shota AIDA , Hisayuki TAKASU , Atsushi KAMINO , Hitoshi KAMOSHIDA
IPC分类号： H01J37/305 , H01J37/08 , H01J37/24
CPC分类号： H01J37/3056 , H01J37/08 , H01J37/243
摘要： In order to improve the processing reproducibility, an ion milling device 100 includes a sample chamber 107, a sample stage 102 that is disposed in the sample chamber on which a sample is placed, an ion source 101 that emits an unfocused ion beam toward the sample, a control unit 112 that controls an output of the ion beam, an oscillator 104 that is disposed in the sample chamber, and an oscillation circuit 111 that oscillates the oscillator and outputs an oscillation signal to the control unit, in which the control unit controls the output of the ion beam such that a vibrational frequency change amount of the oscillator per unit time due to deposition of sputtered particles generated by irradiating the sample with the ion beam on the oscillator is kept within a predetermined range.

66. 发明公开

US20240118251A1 Control Method for Automatic Analyzer 审中-公开
公开(公告)号：US20240118251A1
公开(公告)日：2024-04-11
申请号：US18273111
申请日：2022-01-06
申请人： Hitachi High-Tech Corporation
发明人： Takumi YAMADA , Takayuki SUGIME , Naoto SAKAMOTO
IPC分类号： G01N30/86 , G01N30/46 , G01N35/00 , G01N35/10
CPC分类号： G01N30/86 , G01N30/46 , G01N35/0092 , G01N35/10
摘要： [Problem] To provide a control method of avoiding drop of a throughput by solvent substitution and of avoiding increase of a solvent consumption amount in a control method for an automatic analyzer including a liquid chromatograph that includes plural analysis flow passages arranged to be parallel to each other.
[Solution] Which one of plural analysis flow passages 105 to 107 is to be used is determined in introducing plural separation processes using solvents whose kind is different from each other with a time lag relative to one another, and a solvent used in a next separation process executed at timing after starting the plural separation processes determined to be introduced with a time lag relative to one another and each of the solvents used in the plural separation processes determined to be introduced with a time lag relative to one another are compared. Whether or not a solvent substitution process is required for the analysis flow passages 105 to 107 used in the plural separation processes is determined, an analysis flow passage used in the next separation process out of the plural analysis flow passages 105 to 107 is determined according to the determination, and an analysis schedule is prepared.

67. 发明公开

US20240117406A1 CENTRIFUGAL FILTRATION CARTRIDGE AND MICROBIAL TEST METHOD 审中-公开
公开(公告)号：US20240117406A1
公开(公告)日：2024-04-11
申请号：US18275829
申请日：2021-12-08
申请人： HITACHI HIGH-TECH CORPORATION
发明人： Shunsuke KAWABE , Masako ISHIMARU
IPC分类号： C12Q1/22 , B01L3/00
CPC分类号： C12Q1/22 , B01L3/50215 , B01L2200/04 , B01L2200/0689 , B01L2300/0681
摘要： Provided is a technique for reducing false positives and false negatives in a microbial test. A centrifugal filtration cartridge of the present disclosure includes: a filter cup including a filter that captures a microorganism and a nozzle that discharges a liquid that has passed through the filter; and a contamination prevention box connectable to the filter cup and internally storing a measurement container configured to store the liquid discharged from the nozzle. The contamination prevention box includes a partition wall disposed between the filter cup and an opening surface of the measurement container. The partition wall has an opening through which the nozzle can pass. The nozzle has a length in which a tip of the nozzle is located below a lower end of the opening and enters inside of the measurement container when the contamination prevention box is connected to the filter cup.

68. 发明授权

US11955360B2 Electrostatic chuck and processing apparatus 有权
公开(公告)号：US11955360B2
公开(公告)日：2024-04-09
申请号：US17642083
申请日：2020-12-24
申请人： TOCALO Co., Ltd. , HITACHI HIGH-TECH CORPORATION
发明人： Takeshi Takabatake , Tomohiro Nakasuji , Akira Itoh , Kentaro Seto , Yutaka Omoto , Hiroho Kitada , Kazuumi Tanaka
IPC分类号： H01L21/683 , H01J37/32 , H01L21/687
CPC分类号： H01L21/6833 , H01J37/32715 , H01L21/68757
摘要： A Johnsen-Rahbek force type electrostatic chuck including: a metal substrate; an electrode for electrostatic attraction provided on the metal substrate with an insulating layer interposed between the metal substrate and the electrode for electrostatic attraction; and a dielectric layer constituting an electrostatic attraction surface in contact with a workpiece. The dielectric layer includes a ceramic spray coating and a sealing component with which pores of the ceramic spray coating are filled, and the sealing component contains a metal organic salt containing a rare earth element.

69. 发明授权

US11955327B2 Ion detector 有权
公开(公告)号：US11955327B2
公开(公告)日：2024-04-09
申请号：US17433133
申请日：2020-01-22
申请人： Hitachi High-Tech Corporation
发明人： Kiyomi Yoshinari , Masuyuki Sugiyama , Yuichiro Hashimoto , Shin Imamura
IPC分类号： H01J49/42 , G01N27/623 , G01T1/20 , G01T1/28
CPC分类号： H01J49/42 , G01N27/623 , G01T1/2018 , G01T1/28
摘要： The present invention implements an ion detector with which it is possible to avoid direct collisions of negative ions with a scintillator, prevent degradation of the scintillator, prolong life of the scintillator, reduce the need for maintenance, and perform highly sensitive detection of both positive and negative ions. With respect to a reference line 65 connecting a central point 63 of a positive ion CD 52 and a central point 64 of a counter electrode 54, a central point 66 of a negative ion CD 53 is provided in a region of a side opposite to a region of a side of a central point 67 of a scintillator 56. Positive ions entering from an ion entrance 62 receive a deflection force and collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 to generate light. The generated light passes through a light guide 59 and is detected by a photomultiplier tube 58. A negative potential barrier is generated along the reference line 65. Negative ions entering form the ion entrance 62 are attracted to and collide with the negative ion CD 53 to generate positive ions. The generated positive ions collide with the positive ion CD 52 to generate secondary electrons. The generated secondary electrons collide with the scintillator 56 and are detected by the photomultiplier tube 58.

70. 发明授权

US11953508B2 Automatic analysis device 有权
公开(公告)号：US11953508B2
公开(公告)日：2024-04-09
申请号：US17285972
申请日：2019-10-09
申请人： Hitachi High-Tech Corporation
发明人： Sunao Funakoshi , Takenori Okusa , Nobuyuki Isoshima , Koki Yokoyama
IPC分类号： G01N35/00 , B01L3/00 , B01L7/00
CPC分类号： G01N35/00663 , B01L3/52 , B01L3/56 , B01L7/00 , B01L2200/16 , B01L2300/0663 , B01L2300/18 , G01N2035/00425 , G01N2035/00673
摘要： An automatic analysis device includes a processing unit 3 which performs the treatment on a specimen before analysis of the specimen, supply equipment which supplies a reagent to a reaction vessel 11 disposed in the processing unit 3, a liquid temperature adjusting unit 1 which adjusts a temperature of the reagent supplied to the reaction vessel 11 by the supply equipment, a control unit 201, and a first temperature detection unit 4 which detects at least one temperature of a temperature of the air within the processing unit 3 and a temperature of the reagent supplied to the reaction vessel 11, in which the liquid temperature adjusting unit 1 and the control unit 201 execute temperature adjustment of the reagent based on a first temperature detected by the first temperature detection unit 4.

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