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    • 52. 发明授权
    • Metal deposit process
    • 金属沉积工艺
    • US07078340B2
    • 2006-07-18
    • US09774303
    • 2001-01-29
    • Gary W. Ferrell
    • Gary W. Ferrell
    • H01L21/44
    • H01L21/2885C23C18/1653C23C18/1658C23C18/1844C23C18/40C25D5/54C25D7/123H01L21/288
    • Method and system for controllable deposit of copper onto an exposed surface of a workpiece, such as a semiconductor surface. A seed thickness of copper is optionally deposited onto the exposed surface, preferably using oxygen-free liquid ammonia to enhance this deposition. The workpiece exposed surface is then immersed in an electroplating solution, including copper and liquid ammonia at a suitable pressure and temperature, and copper is caused to plate onto the exposed surface at a controllable rate. When the copper deposited on the exposed surface reaches a selected total thickness, electroplating is discontinued, the electroplating solution is removed, and the gaseous and liquid ammonia are recovered and recycled for re-use.
    • 铜可控制地沉积到诸如半导体表面的工件的暴露表面上的方法和系统。 任选地将铜的种子厚度沉积到暴露的表面上,优选使用无氧液氨来增强该沉积。 然后将工件暴露表面在合适的压力和温度下浸入包括铜和液氨的电镀溶液中,并以可控的速率将铜板印刷在暴露的表面上。 当沉积在暴露表面上的铜达到所选择的总厚度时,停止电镀,除去电镀溶液,回收气态和液态氨并重新利用。