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51. 发明申请

US20050284755A1 Substrate support element for an electrochemical plating cell 失效
标题翻译：用于电化学电镀单元的基板支撑元件
公开(公告)号：US20050284755A1
公开(公告)日：2005-12-29
申请号：US10879668
申请日：2004-06-28
申请人： You Wang , Anzhong Chang , John Dukovic
发明人： You Wang , Anzhong Chang , John Dukovic
IPC分类号： C25D5/00 , C25D7/12 , C25D17/06
CPC分类号： H01L21/6723 , C25D17/001 , C25D17/06
摘要： A contact ring for an electrochemical plating system is provided. The contact ring includes an annular substrate supporting member, a plurality of radially positioned conductive substrate contact pins extending from the substrate supporting member, an annular conductive thief element attached to the substrate supporting member, and at least one source of electrical power in electrical communication with the contact pins and the conductive thief element.
摘要翻译：提供了用于电化学电镀系统的接触环。所述接触环包括环形基板支撑构件，从所述基板支撑构件延伸的多个径向定位的导电基板接触销，附接到所述基板支撑构件的环形导电小窃贼元件以及与所述基板支撑构件电连接的至少一个电力源触针和导电小窃贼元件。

52. 发明申请

US20050145499A1 Plating of a thin metal seed layer 审中-公开
标题翻译：电镀薄金属种子层
公开(公告)号：US20050145499A1
公开(公告)日：2005-07-07
申请号：US11072473
申请日：2005-03-03
申请人： Nicolay Kovarsky , You Wang , John Dukovic , Ivan Rodriguez
发明人： Nicolay Kovarsky , You Wang , John Dukovic , Ivan Rodriguez
IPC分类号： C25D5/18
CPC分类号： C25D17/10 , C25D5/18 , C25D7/123 , C25D17/001 , C25D17/002 , C25D17/007 , H01L21/2885 , H01L21/76843 , H01L21/76873 , H01L21/76877
摘要： A method and apparatus for plating a metal layer onto a substrate is provided. The plating apparatus includes two or more segments of an anode and an auxiliary electrode. The plating method includes a first stage of plating a thin metal seed uniformly in the center of the substrate and near the edges of the substrate before metal gap filling and bulk metal plating are performed. The thin metal seed is plated on the substrate surface by applying a current pulse provided by a first power supply and a second power supply which are in electrical communication in reverse polarity with one segment of the anode and the auxiliary electrode. Thereafter, gap filling of features is performed by applying a second current pulse where current is provided to all segments of the anode.
摘要翻译：提供了一种用于将金属层电镀到基底上的方法和装置。电镀装置包括阳极和辅助电极的两个或更多个区段。电镀方法包括在执行金属间隙填充和块状金属电镀之前，在基板的中心和基板的边缘附近均匀地电镀薄金属种子的第一阶段。通过施加由与阳极和辅助电极的一个部分相反极性电连通的第一电源和第二电源提供的电流脉冲，将薄金属种子电镀在基板表面上。此后，通过施加第二电流脉冲来执行特征的间隙填充，其中电流被提供给阳极的所有段。

53. 发明授权

US5194138A Method for creating a corrosion-resistant aluminum surface 失效
标题翻译：制造耐腐蚀铝表面的方法
公开(公告)号：US5194138A
公开(公告)日：1993-03-16
申请号：US556109
申请日：1990-07-20
申请人： Florian B. Mansfeld , Hong Shih , You Wang
发明人： Florian B. Mansfeld , Hong Shih , You Wang
IPC分类号： C23C22/56
CPC分类号： C23C22/56
摘要： A method for treating the surface of an aluminum-based material so as to make the surface resistant to corrosion includes the steps of contacting the surface with an aqueous cerium non-halide solution and then contacting the surface with an aqueous cerium halide solution. These steps may optionally be followed by a step of positively charging the metal surface while in contact with an aqueous molybdenum solution.
摘要翻译：用于处理铝基材料的表面以使表面耐腐蚀的方法包括使表面与无水卤化铈水溶液接触，然后使表面与卤化铈水溶液接触的步骤。这些步骤可以任选地在与钼水溶液接触的同时对金属表面进行正电充电的步骤。

54. 发明授权

US09073169B2 Feedback control of polishing using optical detection of clearance 有权
标题翻译：使用光学检测间隙的抛光反馈控制
公开(公告)号：US09073169B2
公开(公告)日：2015-07-07
申请号：US13223159
申请日：2011-08-31
申请人： Kun Xu , Ingemar Carlsson , Feng Q. Liu , David Maxwell Gage , You Wang , Dominic J. Benvegnu , Boguslaw A. Swedek , Yuchun Wang , Pierre Fontarensky , Wen-Chiang Tu , Lakshmanan Karuppiah
发明人： Kun Xu , Ingemar Carlsson , Feng Q. Liu , David Maxwell Gage , You Wang , Dominic J. Benvegnu , Boguslaw A. Swedek , Yuchun Wang , Pierre Fontarensky , Wen-Chiang Tu , Lakshmanan Karuppiah
IPC分类号： G06F19/00 , H01L21/00 , B24B49/00 , B24B37/005 , B24B37/04 , B24B37/10 , B24B37/30 , B24B49/12 , G01B11/06
CPC分类号： B24B37/005 , B24B37/042 , B24B37/107 , B24B37/30 , B24B49/12 , G01B11/0683
摘要： A method of controlling polishing includes polishing a first substrate having an overlying layer on an underlying layer or layer structure. During polishing, the substrate is monitored with an in-situ monitoring system to generate a sequence of measurements. The measurements are sorted into groups, each group associated with a different zone of a plurality of zones on the substrate. For each zone, a time at which the overlying layer is cleared is determined based on the measurements from the associated group. At least one second adjusted polishing pressure for at least zone is calculated based on a pressure applied in the at least one zone during polishing the substrate, the time for the at least one zone, and the time for another zone. A second substrate is polished using the at least one adjusted polishing pressure.
摘要翻译：控制抛光的方法包括在下层或层结构上抛光具有上层的第一衬底。在抛光期间，用原位监测系统监测基底以产生测量序列。测量被分组成组，每个组与衬底上的多个区域的不同区域相关联。对于每个区域，基于来自关联组的测量来确定覆盖层被清除的时间。基于在抛光衬底期间在至少一个区域中施加的压力，至少一个区域的时间和另一个区域的时间来计算至少一个至少一个区域的调整后的第二抛光压力。使用至少一个调整的抛光压力来抛光第二基底。

55. 发明申请

US20140221662A1 INTERMEDIATE COMPOUNDS OF TAMIFLU, METHODS OF PREPARATION AND USES THEREOF 有权
标题翻译： TAMIFLU的中间体化合物，其制备方法及其用途
公开(公告)号：US20140221662A1
公开(公告)日：2014-08-07
申请号：US14123870
申请日：2010-12-17
申请人： Dawei Ma , Shaolin Zhu , Shouyun Yu , You Wang , Qianghui Zhou
发明人： Dawei Ma , Shaolin Zhu , Shouyun Yu , You Wang , Qianghui Zhou
IPC分类号： C07C319/12 , C07D207/14 , C07D213/73 , C07C227/16 , C07C229/66 , C07C227/14
CPC分类号： C07C319/12 , C07B2200/07 , C07C227/14 , C07C227/16 , C07C229/66 , C07C233/31 , C07C271/18 , C07C323/61 , C07C2601/14 , C07C2601/16 , C07D207/14 , C07D209/48 , C07D213/73 , C07D401/04 , C07D403/04
摘要： Chiral amino compounds, methods of preparation and uses thereof. Tamiflu can be obtained from the said compounds. Multi-substituted chiral tetrahydropyrrolyl amine which can be used as intermediate compounds of medicament can also be produced by the said compounds.
摘要翻译：手性氨基化合物，其制备方法及其应用。可以从所述化合物获得达菲。可以用作药物的中间体化合物的多取代手性四氢吡咯胺也可以由所述化合物制备。

56. 发明申请

US20130189843A1 SLURRY FOR PLANARIZING PHOTORESIST 审中-公开
标题翻译：用于平面化光刻胶的浆料
公开(公告)号：US20130189843A1
公开(公告)日：2013-07-25
申请号：US13747825
申请日：2013-01-23
申请人： You Wang , Wen-Chiang Tu , Lakshmanan Karuppiah , Yufei Chen
发明人： You Wang , Wen-Chiang Tu , Lakshmanan Karuppiah , Yufei Chen
IPC分类号： H01L21/306
CPC分类号： H01L21/30625 , C09G1/02 , H01L21/31058
摘要： A slurry for planarization of a photoresist includes abrasive particles, an oxidizer, a surface activation chemical, and a solvent.
摘要翻译：用于平版化光致抗蚀剂的浆料包括磨料颗粒，氧化剂，表面活化化学品和溶剂。

57. 发明申请

US20130186850A1 SLURRY FOR COBALT APPLICATIONS 审中-公开
标题翻译：浆料应用
公开(公告)号：US20130186850A1
公开(公告)日：2013-07-25
申请号：US13357535
申请日：2012-01-24
申请人： You Wang , Chenhao Ge , Yufei Chen , Yuchun Wang , Wen-Chiang Tu , Lakshmanan Karuppiah
发明人： You Wang , Chenhao Ge , Yufei Chen , Yuchun Wang , Wen-Chiang Tu , Lakshmanan Karuppiah
IPC分类号： C09K13/00 , C09K13/02 , H05K3/26
CPC分类号： C09K3/1463 , C09G1/02 , H01L21/3212 , H01L23/53238 , H01L23/53257 , H01L2924/0002 , H05K3/045 , H05K3/107 , H01L2924/00
摘要： A slurry for chemical mechanical of a cobalt layer or a conductive layer over a cobalt layer includes abrasive particles, an organic complexing compound for Cu or Co ion complexion, a Co corrosion inhibitor that is 0.01-1.0 wt % of the slurry, an oxidizer, and a solvent. The slurry has a pH of 7-12.
摘要翻译：用于钴层或钴层上的导电层的化学机械的浆料包括磨料颗粒，用于Cu或Co离子表面的有机络合化合物，作为浆料的0.01-1.0重量％的Co腐蚀抑制剂，氧化剂，和溶剂。浆液的pH为7-12。

58. 发明授权

US08403226B2 Chip card holder 失效
标题翻译：芯片卡座
公开(公告)号：US08403226B2
公开(公告)日：2013-03-26
申请号：US12850720
申请日：2010-08-05
申请人： You Wang
发明人： You Wang
IPC分类号： G06K7/00 , G06K7/08 , G06K19/00 , H04M1/00 , H05K1/14
CPC分类号： G06K7/0021
摘要： An exemplary chip card holder for holding a chip card includes a base member, a card receiving frame and a cover. The card receiving frame is mounted on the base member and defines an accommodating space for receiving the chip card therein. The accommodating space has an inserting opening for inserting the chip card into and removing the chip card out from the accommodating space. The cover includes a resisting block protruding therefrom. The cover is detachably latched to the base member in such a way that the resisting block is aligned with the inserting opening and located adjacent to an end of the chip card to hold the chip card within the accommodating space.
摘要翻译：用于保持芯片卡的示例性芯片卡保持器包括基座构件，卡片接收框架和盖子。卡接收框架安装在基座构件上并且限定用于在其中接收芯片卡的容纳空间。容纳空间具有插入开口，用于将芯片卡插入存放空间中并将其从芯片卡中取出。盖子包括从其突出的抵抗块。盖子可拆卸地锁定到基座构件上，使得抵抗块与插入口对准并且位于与芯片卡的一端相邻并且将芯片卡保持在容纳空间内。

59. 发明授权

US08248819B2 Chip card holder for portable electronic device 失效
标题翻译：便携式电子设备的芯片卡座
公开(公告)号：US08248819B2
公开(公告)日：2012-08-21
申请号：US12768699
申请日：2010-04-27
申请人： You Wang
发明人： You Wang
IPC分类号： H05K7/14 , H05K7/18
CPC分类号： H04B1/3818 , H04B1/3816 , H05K7/1408
摘要： A chip card holder includes a main housing and a retaining cover. The main housing includes a chip card receiving portion for receiving a chip card. The main housing defines a slot adjacent to the chip card receiving portion. A locking portion is formed adjacent to the slot. The retaining cover is rotatably attached the main housing. The retaining cover includes a latching portion. The latching portion includes an angled bottom. The retaining cover is locked to the main housing by engagement of the locking portion and the latching portion, and the angled bottom of the latching portion is received in the slot.
摘要翻译：芯片卡座包括主壳体和保持盖。主壳体包括用于接收芯片卡的芯片卡接收部分。主壳体限定与芯片卡接收部分相邻的槽。锁定部分邻近狭槽形成。保持盖可旋转地安装在主壳体上。保持盖包括闩锁部分。闩锁部分包括成角度的底部。通过锁定部分和闩锁部分的接合将保持盖锁定到主壳体，并且闩锁部分的倾斜的底部被容纳在狭槽中。

60. 发明申请

US20100112903A1 DISHING AND DEFECT CONTROL OF CHEMICAL MECHANICAL POLISHING USING REAL-TIME ADJUSTABLE ADDITIVE DELIVERY 有权
标题翻译：使用实时可调式添加剂进行化学机械抛光的抛光和缺陷控制
公开(公告)号：US20100112903A1
公开(公告)日：2010-05-06
申请号：US12263237
申请日：2008-10-31
申请人： WEN-CHIANG TU , You Wang , Yuchun Wang , Lakshmanan Karuppiah
发明人： WEN-CHIANG TU , You Wang , Yuchun Wang , Lakshmanan Karuppiah
IPC分类号： B24B49/04 , B24B7/22 , B24B57/02
CPC分类号： B24B37/04 , B24B57/02
摘要： A method and apparatus for polishing or planarzing a substrate by a chemical mechanical polishing process. In one embodiment a method of processing a semiconductor substrate is provided. The method comprises positioning a substrate on a polishing apparatus comprising a polishing pad assembly, delivering a polishing slurry to a surface of the polishing pad assembly, polishing the substrate with the surface of the polishing pad assembly, monitoring the removal rate of material from a plurality of regions on the surface of the substrate, determining whether the plurality of regions on the surface of the substrate are polishing uniformly, and selectively delivering a polishing slurry additive to at least one region of the plurality of regions to obtain a uniform removal rate of material from the plurality of regions on the surface of the substrate, wherein the removal rate of material from the at least one region is different than at least one other region of the plurality of regions.
摘要翻译：一种用于通过化学机械抛光工艺抛光或平面化基板的方法和装置。在一个实施例中，提供了一种处理半导体衬底的方法。该方法包括将衬底定位在包括抛光垫组件的抛光设备上，将抛光浆料输送到抛光垫组件的表面，用抛光垫组件的表面抛光衬底，监测来自多个部件的材料的去除速率在基板表面上确定基板表面上的多个区域是否均匀抛光，并且将抛光浆料添加剂选择性地输送到多个区域中的至少一个区域以获得均匀的材料去除速率从所述衬底表面上的多个区域中去除所述至少一个区域的材料的去除速率不同于所述多个区域中的至少一个其它区域。

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