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    • 56. 发明授权
    • Double-surface printing apparatus
    • 双面印刷装置
    • US06330425B1
    • 2001-12-11
    • US09558041
    • 2000-04-26
    • Yoshio OhuchiAkira ShimizuNobuaki FukasawaMichio SumiyoshiSatoshi NaritaKiminori Takada
    • Yoshio OhuchiAkira ShimizuNobuaki FukasawaMichio SumiyoshiSatoshi NaritaKiminori Takada
    • G03G1500
    • G03G15/234
    • A double-surface printing apparatus, which is small-sized and has a simple construction to make it impossible to take out a sheet, of which one surface has been subjected to printing, from outside. The apparatus includes a paper discharge tray, to which sheets having been subjected to printing are discharged; a sheet reversing mechanism including a reversal/temporary storage unit for guiding a sheet in a direction different from a discharge direction toward the paper discharge tray, once exposing the sheet outside of the apparatus, and rotating conveying rollers in an opposite direction to thereby reverse the sheet; and a protective cover, which covers the sheet conveyed to the reversal/temporary storage unit so that a sheet, of which one-surface has been subjected to printing, cannot be taken out from outside.
    • 一种双面打印装置,其尺寸小并且具有简单的结构,使得不可能从外部取出其表面已经被印刷的片材。 该设备包括排纸托盘,已经印刷的纸张被排出到该排纸托盘; 纸张反转机构,其包括用于将片材沿着与排出方向不同的方向朝向排纸盘引导的反转/临时存储单元,一旦暴露出设备外部的片材,并且使相反方向的输送辊转动, 片; 以及保护盖,其覆盖输送到反转/临时存储单元的纸张,使得其中一个表面已被印刷的纸张不能从外部取出。
    • 57. 发明授权
    • Method for fabricating CMOS transistors by implanting into polysilicon
    • 通过植入多晶硅制造CMOS晶体管的方法
    • US6001677A
    • 1999-12-14
    • US65334
    • 1998-04-23
    • Akira Shimizu
    • Akira Shimizu
    • H01L21/28H01L21/265H01L21/8238H01L27/092
    • H01L21/823842
    • A method for fabricating MOS transistors comprises the steps of forming a polysilicon layer, having an underlying gate oxide layer on the major surface of a silicon substrate, providing a mask to cover a predetermined portion except the portion for an N-type polysilicon layer to be formed, doping the polysilicon layer uncovered by the first mask with N-type ions, providing a second mask to cover a predetermined portion except the portion for a P-type polysilicon layer to be formed, doping the polysilicon layer uncovered by the second mask with boron ions, subjecting the polysilicon layer to a patterning process to define gate electrodes of an NMOS and PMOS transistors, providing a third mask to cover a predetermined portion except the portion for an NMOS transistor to be formed, doping N-type ions into substrate portion for the NMOS transistor to be formed using the third mask and the gate electrodes as a mask to thereby form a source and a drain of the NMOS transistor, forming a silicon oxide layer over each of the gate electrodes, providing a fourth mask to cover a predetermined portion except the portion for a PMOS transistor to be formed, and doping BF.sub.2 ions into substrate portion for PMOS transistors to be formed using the fourth mask and gate electrodes overlaid by the silicon oxide layer as a mask, to thereby form source and drain regions of the PMOS transistors.
    • 一种用于制造MOS晶体管的方法包括以下步骤:在硅衬底的主表面上形成具有下面的栅氧化层的多晶硅层,提供掩模以覆盖除了用于N型多晶硅层的部分之外的预定部分 形成,用N型离子掺杂由第一掩模未覆盖的多晶硅层,提供第二掩模以覆盖除了待形成的P型多晶硅层的部分之外的预定部分,将由第二掩模未覆盖的多晶硅层掺杂 硼离子,对多晶硅层进行图形化处理以限定NMOS和PMOS晶体管的栅电极,提供第三掩模以覆盖除了要形成的NMOS晶体管的部分之外的预定部分,将N型离子掺杂到衬底部分 为了使用第三掩模和栅电极作为掩模形成NMOS晶体管,从而形成NMOS晶体管的源极和漏极,形成硅 在每个栅电极上的氧化物层上,提供第四掩模以覆盖除了要形成的PMOS晶体管的部分之外的预定部分,并且将BF 2离子掺杂到使用第四掩模和栅电极形成的PMOS晶体管的衬底部分 由氧化硅层覆盖作为掩模,从而形成PMOS晶体管的源区和漏区。
    • 60. 发明授权
    • Data logging apparatus with memory and pattern testing device
    • 具有记忆和图案测试装置的数据记录仪
    • US5305331A
    • 1994-04-19
    • US684411
    • 1991-04-12
    • Toshiya SatoAkira ShimizuHajime HiroiHirohisa Ooishi
    • Toshiya SatoAkira ShimizuHajime HiroiHirohisa Ooishi
    • G01R31/28G01R31/3193G06F11/22G06F11/00
    • G01R31/31935
    • A data logging apparatus for a device function tester comprises a first shift circuit (1) supplied with an output signal of the tester and a strobe signal for shifting the output of the tester by n rates under the timing of a basic clock (T.sub.0), a second shift circuit (2) for shifting the timing of the basic clock (T.sub.0) by n rates, a write pulse generating circuit (3) supplied with the output signal of the shift circuit (2), a third shift circuit (4) supplied with a memory address signal for shifting it by n rates under the timing of the basic clock (T.sub.0), a fourth shift circuit (5) for shifting a pattern address signal by n rates under the timing of the basic clock (T.sub.0), a first memory (6) supplied with the output signal of the first shift circuit (1) and the output signal of the third shift circuit (1) for storing the result of the test shifted by n rates in response to a write command signal, and a second memory ( 7) supplied with the output of the fourth shift circuit (5) and the output of the third shift circuit (4) for storing the pattern address shifted by n rates in response to the write command signal. Data logging can be accomplished without being affected by variable time intervals of write enable strobe pulses.
    • 一种用于设备功能测试器的数据记录装置,包括:提供有测试仪的输出信号的第一移位电路(1)和用于在基本时钟(T0)的定时下将测试仪的输出移位n个速率的选通信号, 用于将基本时钟(T0)的定时移位n个速率的第二移位电路(2),提供有移位电路(2)的输出信号的写脉冲发生电路(3),第三移位电路(4) 提供存储器地址信号,用于在基本时钟(T0)的定时下移位n个速率;第四移位电路(5),用于在基本时钟(T0)的定时下将模式地址信号移位n个速率, 提供有第一移位电路(1)的输出信号的第一存储器(6)和第三移位电路(1)的输出信号,用于存储响应写入命令信号移位n个速率的测试结果, 以及提供有第四移位电路(5)的输出和外部输出的第二存储器(7) t用于响应写入命令信号存储以n个速率移位的模式地址。 可以在不受写使能选通脉冲的可变时间间隔的影响的情况下实现数据记录。