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    • 53. 发明授权
    • Determining soft data for combinations of memory cells
    • 确定存储单元组合的软数据
    • US08737139B2
    • 2014-05-27
    • US13444443
    • 2012-04-11
    • Violante MoschianoTommaso ValiMark A. Hawes
    • Violante MoschianoTommaso ValiMark A. Hawes
    • G11C11/34
    • G11C11/5628G11C16/0483G11C16/10G11C16/26
    • The present disclosure includes apparatuses and methods for determining soft data for combinations of memory cells. A number of embodiments include an array of memory cells including a first and a second memory cell each programmable to one of a number of program states, wherein a combination of the program states of the first and second memory cells corresponds to one of a number of data states, and a buffer and/or a controller coupled to the array and configured to determine soft data associated with the program states of the first and second memory cells and soft data associated with the data state that corresponds to the combination of the program states of the first and second memory cells based, at least in part, on the soft data associated with the program states of the first and second memory cells.
    • 本公开包括用于确定存储器单元的组合的软数据的装置和方法。 多个实施例包括存储单元的阵列,其包括第一和第二存储单元,每个第一和第二存储器单元可编程为多个程序状态之一,其中第一和第二存储器单元的编程状态的组合对应于多个 数据状态,以及耦合到阵列并被配置为确定与第一和第二存储器单元的程序状态相关联的软数据的缓冲器和/或控制器以及与对应于程序状态的组合的数据状态相关联的软数据 至少部分地基于与第一和第二存储器单元的程序状态相关联的软数据。
    • 60. 发明授权
    • Fast sensing scheme for floating-gate memory cells
    • 浮栅存储器单元的快速感测方案
    • US07206240B2
    • 2007-04-17
    • US10787911
    • 2004-02-25
    • Girolamo GalloTommaso ValiGiulio Giuseppe Marotta
    • Girolamo GalloTommaso ValiGiulio Giuseppe Marotta
    • G11C7/02
    • G11C7/04G11C7/14G11C16/24G11C16/26
    • Sensing circuits are adapted for faster sensing of a programmed state of a floating-gate memory cell. The sensing circuits include a first precharging path for applying a first precharge potential to the input node of a sensing device for precharging bit lines prior to sensing the programmed state of the floating-gate memory cell. The sensing circuits further include a second precharging path for applying a second precharge potential to a target global bit line for precharging bit lines prior to sensing the programmed state of the floating-gate memory cell. The second precharging path is activated during only a portion of the precharging phase of a sensing operation to bring the bit lines rapidly up toward an asymptotic potential level. The second precharging path is thus deactivated prior to deactivating the first precharging path.
    • 感测电路适于更快地感测浮栅存储器单元的编程状态。 感测电路包括用于将第一预充电电位施加到感测装置的输入节点的第一预充电路径,用于在感测浮栅存储器单元的编程状态之前对位线进行预充电。 感测电路还包括第二预充电路径,用于在感测浮栅存储器单元的编程状态之前,将第二预充电电位施加到目标全局位线用于预充电位线。 第二预充电路径仅在感测操作的预充电阶段的一部分期间被激活,以使位线快速向上渐近的电位电平。 因此在停用第一预充电路径之前停用第二预充电路径。