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    • 56. 发明授权
    • Vla-4 inhibitors
    • Vla-4抑制剂
    • US07157487B2
    • 2007-01-02
    • US10451159
    • 2001-12-28
    • Atsushi NakayamaNobuo MachinagaYoshiyuki YonedaYuichi SugimotoJun ChibaToshiyuki WatanabeShin Iimura
    • Atsushi NakayamaNobuo MachinagaYoshiyuki YonedaYuichi SugimotoJun ChibaToshiyuki WatanabeShin Iimura
    • A61K31/405C07D209/04
    • C07D263/58C07C275/42C07D209/42C07D401/12C07D401/14C07D403/12C07D413/06C07D413/12C07D413/14C07D417/06C07D417/12C07D471/04C07D491/04
    • The present invention relates to a compound represented by the following formula (I): (wherein, W represents WA-A1-WB- (in which, WA is substituted or unsubstituted aryl, etc., A1 is —NR1—, single bond, —C(O)—, etc., and WB is substituted or unsubstituted arylene, etc.), R is single bond, —NH—, —OCH2—, alkenylene, etc., X is —C(O)—, —CH2—, etc., and M is, for example, the following formula: (in which, R11, R12 and R13 each independently represents hydrogen, hydroxyl, amino, halogen, etc., R14 is hydrogen or lower alkyl, Y represents —CH2—O—, etc., Z is substituted or unsubstituted arylene, etc., A2 is single bond, etc, and R10 is hydroxyl or lower alkoxy)), or salt thereof; and a medicament containing the same. This compound or salt thereof selectively inhibits binding of cell adhesion molecules to VLA-4 and exhibits high bioavailability so that it is useful as a preventive and/or remedy for inflammatory diseases, autoimmune diseases, metastasis, bronchial asthma, rhinostenosis, diabetes, and the like.
    • 本发明涉及由下式(I)表示的化合物:(其中,W表示W A,A,B, - (其中,W A是取代或未取代的芳基等,A 1是-NR 1 - 单键,-C (O) - 等,W B是取代或未取代的亚芳基等),R是单键,-NH-,-OCH 2 - ,亚烯基 等等,X是-C(O) - , - CH 2 - 等,M是例如下式:(其中R 11, R 12,R 12和R 13各自独立地表示氢,羟基,氨基,卤素等,R 14是氢或低级烷基 ,Y表示-CH 2 -O-O-等,Z是取代或未取代的亚芳基等,A 2是单键等,R“ 10是羟基或低级烷氧基))或其盐; 和含有该药物的药物。 该化合物或其盐选择性地抑制细胞粘附分子与VLA-4的结合并且表现出高的生物利用度,使得其可用作炎性疾病,自身免疫性疾病,转移,支气管哮喘,鼻窦炎,糖尿病的预防和/或补救。 喜欢。
    • 60. 发明授权
    • Semiconductor integrated circuit having a semiconductor storage circuit and a test circuit for testing the semiconductor storage circuit
    • 半导体集成电路具有半导体存储电路和用于测试半导体存储电路的测试电路
    • US06734693B2
    • 2004-05-11
    • US10294788
    • 2002-11-15
    • Atsushi Nakayama
    • Atsushi Nakayama
    • G01R3102
    • G11C29/56012G01R31/318558G01R31/318563G01R31/318572G11C29/48G11C2029/5602
    • A first test circuit is supplied with test signals to test an operation of a first semiconductor storage circuit. The test signals include a test input signal, a test output signal, and a test sync signal. A second test circuit receives the test signals from the first test circuit to test an operation of a second semiconductor storage circuit. The first test circuit uses the test input signal as information to operate the first semiconductor storage circuit in synchronization with the test sync signal and supplies the test input signal to the second test circuit. The first test circuit also synchronizes a signal, which is determined by performing a logical operation between the output of the first semiconductor storage circuit and the test output signal supplied thereto, with the test sync signal and supplies the signal to the second test circuit as a test output signal.
    • 向第一测试电路提供测试信号以测试第一半导体存储电路的操作。 测试信号包括测试输入信号,测试输出信号和测试同步信号。 第二测试电路从第一测试电路接收测试信号以测试第二半导体存储电路的操作。 第一测试电路使用测试输入信号作为与测试同步信号同步地操作第一半导体存储电路的信息,并将测试输入信号提供给第二测试电路。 第一测试电路还使通过在第一半导体存储电路的输出和所提供的测试输出信号之间的逻辑运算与测试同步信号进行逻辑运算而确定的信号同步,并将该信号作为第二测试电路提供 测试输出信号。