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    • 52. 发明授权
    • Method for temperature compensation in MEMS resonators with isolated regions of distinct material
    • 具有不同材料隔离区域的MEMS谐振器中的温度补偿方法
    • US07639104B1
    • 2009-12-29
    • US11716115
    • 2007-03-09
    • Emmanuel P. QuevyDavid H. Bernstein
    • Emmanuel P. QuevyDavid H. Bernstein
    • H03H9/00
    • B81C1/0069B81C1/00349B81C1/00523G02B6/358H03H3/0076H03H9/2405H03H9/2457H03H2009/02496H03H2009/2442Y10T29/42Y10T29/49005Y10T29/49165
    • MEMS resonators containing a first material and a second material to tailor the resonator's temperature coefficient of frequency (TCF). The first material has a different Young's modulus temperature coefficient than the second material. In one embodiment, the first material has a negative Young's modulus temperature coefficient and the second material has a positive Young's modulus temperature coefficient. In one such embodiment, the first material is a semiconductor and the second material is a dielectric. In a further embodiment, the quantity and location of the second material in the resonator is tailored to meet the resonator TCF specifications for a particular application. In an embodiment, the second material is isolated to a region of the resonator proximate to a point of maximum stress within the resonator. In a particular embodiment, the resonator includes a first material with a trench containing the second material. In a specific embodiment, the shape, dimensions, location and arrangement of a second material comprising silicon dioxide is tailored so that the resonator comprising a first material of SiGe will have a TCF of a much lower magnitude than that of either a homogeneous SiGe or homogeneous silicon dioxide resonator.
    • 包含第一材料和第二材料的MEMS谐振器以调整谐振器的频率温度系数(TCF)。 第一种材料具有与第二种材料不同的杨氏模量温度系数。 在一个实施例中,第一材料具有负杨氏模量温度系数,第二材料具有正的杨氏模量温度系数。 在一个这样的实施例中,第一材料是半导体,第二材料是电介质。 在另一实施例中,谐振器中的第二材料的数量和位置被调整为满足特定应用的谐振器TCF规格。 在一个实施例中,第二材料被隔离到谐振器附近的最大应力点处的谐振器的区域。 在特定实施例中,谐振器包括具有包含第二材料的沟槽的第一材料。 在具体实施例中,包括二氧化硅的第二材料的形状,尺寸,位置和布置被定制,使得包括SiGe的第一材料的谐振器将具有比均匀SiGe或均质SiGe的TCF低得多的TCF 二氧化硅谐振器。
    • 53. 发明授权
    • Low stress thin film microshells
    • 低应力薄膜微壳
    • US07595209B1
    • 2009-09-29
    • US11716233
    • 2007-03-09
    • Pezhman MonadgemiEmmanuel P. QuevyRoger T. Howe
    • Pezhman MonadgemiEmmanuel P. QuevyRoger T. Howe
    • H01L21/56H01L21/50
    • B81C1/0023B81B7/0054B81C2201/0167B81C2203/0136B81C2203/0145H01L21/568H01L2924/0002H01L2924/3011H01L2924/00
    • Multi-layered, planar microshells having low stress for encapsulation of devices such as MEMS and microelectronics. The microshells may include a perforated pre-sealing layer, below which a sacrificial layer is accessed, and a sealing layer to close the perforation in the pre-sealing layer after the sacrificial material is removed. The sealing layer may further include a nonhermetic layer to physically occlude the perforation and a hermetic layer over the nonhermetic occluding layer to seal the perforation. The various layers may be formed employing processes having opposing stresses to tune the residual stress of the multi-layered microshell. In an embodiment, the hermetic layer is a metal which is deposited with a process tuned to impart a tensile stress to lower the residual stress in the microshell below the magnitude of cumulative stress present in sealing layer and pre-sealing layer.
    • 具有低应力的多层平面微壳体,用于诸如MEMS和微电子器件的封装。 微壳可以包括穿孔的预密封层,在其下方存取牺牲层,以及密封层,用于在去除牺牲材料之后封闭预密封层中的穿孔。 密封层还可以包括非密封层,以物理地封闭穿孔,并且在非密封闭塞层上方形成密封层以密封穿孔。 可以使用具有相反应力的工艺来形成各个层,以调节多层微壳的残余应力。 在一个实施例中,密封层是金属,其沉积有被调整以赋予拉伸应力的工艺,以将微壳中的残余应力降低到低于存在于密封层和预密封层中的累积应力的大小。