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41. 发明申请

US20140259234A1 Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source 有权
标题翻译：使用基于探针的纳米定位光源进行物理性能测量的方法和装置
公开(公告)号：US20140259234A1
公开(公告)日：2014-09-11
申请号：US14202669
申请日：2014-03-10
申请人： Bruker Nano, Inc.
发明人： Markus B. Raschke , Stefan B. Kaemmer , Stephen C. Minne , Chanmin Su
IPC分类号： G01Q10/00
CPC分类号： G01Q20/02 , G01Q10/00 , G01Q10/065 , G01Q60/06 , G01Q60/22 , G01Q60/38
摘要： An apparatus and method of performing physical property measurements on a sample with a probe-based metrology instrument employing a nano-confined light source is provided. In one embodiment, an SPM probe tip is configured to support an appropriate receiving element so as to provide a nano-localized light source that is able to efficiently and locally excite the sample on the nanoscale. Preferably, the separation between the tip apex and the sample during spectroscopic measurements is maintained at less than 10 nm, for example, using an AFM TR Mode control scheme.
摘要翻译：提供了一种使用采用纳米限制光源的基于探针的计量仪器对样品进行物理性能测量的装置和方法。在一个实施例中，SPM探针尖端被配置为支撑适当的接收元件，以便提供能够在纳米尺度上有效地和局部地激发样品的纳米局部光源。优选地，例如使用AFM TR模式控制方案，在光谱测量期间尖端顶点和样品之间的间隔保持在小于10nm。

42. 发明申请

US20130254948A1 Scanning Method for Scanning a Sample with a Probe 有权
标题翻译：用探头扫描样品的扫描方法
公开(公告)号：US20130254948A1
公开(公告)日：2013-09-26
申请号：US13655200
申请日：2012-10-18
申请人： FEI Company
发明人： Arthur Reinout Hartong , Cornelis Sander Kooijman
IPC分类号： H01J37/26 , G01Q10/00
CPC分类号： H01J37/26 , G01Q10/00 , G01Q30/06 , H01J37/265 , H01J37/28 , H01J2237/221 , H01J2237/28
摘要： The method relates to a method of scanning a sample. Scanning a sample is typically done by scanning the sample with a probe along a multitude of parallel lines. In prior art scan methods a sample is scanned multiple times with a nominally identical scan pattern. The invention is based on the insight that the coherence between adjacent points in a direction along the scan direction is much better than the coherence of adjacent points perpendicular to the scan direction. By combining two images that are scanned perpendicular to each other, it should thus be possible to form an image making use of the improved coherence (due to shorter temporal distance) in both directions. The method thus involves scanning the sample with two scan patterns, the lines of one scan pattern preferably perpendicular to the lines of the other scan pattern. Hereby it is possible to use the temporal coherence of scan points on a line of one scan pattern to align the lines of the other scan pattern, and vice versa.
摘要翻译：该方法涉及扫描样品的方法。扫描样品通常通过沿着大量平行线的探头扫描样品来完成。在现有技术的扫描方法中，用标称相同的扫描图案扫描多次样品。本发明基于以下认识：沿着扫描方向的相邻点之间的相干性远远优于垂直于扫描方向的相邻点的相干性。通过组合彼此垂直扫描的两个图像，因此应该可以使用改进的相干性（由于较短的时间距离）在两个方向上形成图像。因此，该方法涉及用两个扫描图案扫描样本，一个扫描图案的线优选地垂直于另一扫描图案的线。因此，可以使用一个扫描图案的线上的扫描点的时间相干性来对准另一扫描图案的线，反之亦然。

43. 发明授权

US08495760B2 Atomic force microscope manipulation of living cells 失效
标题翻译：原子力显微镜操纵活细胞
公开(公告)号：US08495760B2
公开(公告)日：2013-07-23
申请号：US13307882
申请日：2011-11-30
申请人： Manish J Butte , Marc Amor Bruce , Jianwei Liu
发明人： Manish J Butte , Marc Amor Bruce , Jianwei Liu
IPC分类号： G01N13/16 , G01Q10/00 , G01Q60/24 , G01Q70/08
CPC分类号： G01Q10/00 , G01Q30/025 , G01Q60/42
摘要： Techniques for atomic force microscope manipulation of living cells include functionalizing a nanoscale tip of a microscale cantilever with a first ligand for a first receptor associated with a surface of a first type of cell. The method further comprises, controlling the cantilever to cause the first ligand on the nanoscale tip to contact the first receptor on a surface of a living cell of the first type in a particular temporal pattern to induce a target response by the living cell. Other techniques for controlling an atomic force microscope comprising a nanoscale tip include controlling the cantilever to cause the nanoscale tip to contact a living cardiomyocyte at a predetermined pressure. The cantilever is also controlled to turn off vertical deflection feedback after contacting the cardiomyocyte and collecting deflection data that indicates a time series of nanoscale vertical deflections of the microscale cantilever caused by the living cardiomyocyte.
摘要翻译：用于原子力显微镜操作活细胞的技术包括用与第一类型细胞表面相关联的第一受体的第一配体官能化微尺度悬臂的纳米级尖端。该方法还包括：控制悬臂以使纳米级尖端上的第一配体以特定时间模式接触第一类型活细胞表面上的第一受体以诱导活细胞的靶标反应。用于控制包含纳米级尖端的原子力显微镜的其它技术包括控制悬臂以使纳米级尖端以预定压力接触活的心肌细胞。接触心肌细胞后，悬臂也被控制为关闭垂直偏转反馈，并收集指示由活体心肌细胞引起的微量悬臂的纳米尺度垂直偏转的时间序列偏转数据。

44. 发明申请

US20130145505A1 NEAR FIELD OPTICAL MICROSCOPE WITH OPTICAL IMAGING SYSTEM 审中-公开
标题翻译：具有光学成像系统的近场光学显微镜
公开(公告)号：US20130145505A1
公开(公告)日：2013-06-06
申请号：US13579623
申请日：2011-02-21
申请人： Nenad Ocelic , Florian Huth
发明人： Nenad Ocelic , Florian Huth
IPC分类号： G01Q60/22 , G01Q10/00
CPC分类号： G01Q60/22 , G01Q10/00 , G01Q20/02 , G01Q60/06
摘要： The invention relates to a device for conducting near-field optical measurements of a specimen comprising an optical imaging system, the use of such device and to a method for adjusting the probe or the illumination of the probe in such a device.
摘要翻译：本发明涉及一种用于进行包括光学成像系统的样本的近场光学测量的装置，这种装置的使用以及用于在这种装置中调节探针或探针的照明的方法。

45. 发明申请

US20130117895A1 Quantitative measurements using multiple frequency atomic force microscopy 有权
标题翻译：使用多频率原子力显微镜进行定量测量
公开(公告)号：US20130117895A1
公开(公告)日：2013-05-09
申请号：US13694095
申请日：2012-10-29
申请人： Asylum Research Corporation
发明人： Roger B. Proksch , Jason Bemis
IPC分类号： G01Q10/00
CPC分类号： G01Q60/32 , B82Y35/00 , G01B17/08 , G01Q10/00
摘要： The imaging mode presented here combines the features and benefits of amplitude modulated (AM) atomic force microscopy (AFM), sometimes called AC mode AFM, with frequency modulated (FM) AFM. In AM-FM imaging, the topographic feedback from the first resonant drive frequency operates in AM mode while the second resonant drive frequency operates in FM mode and is adjusted to keep the phase at 90 degrees, on resonance. With this approach, frequency feedback on the second resonant mode and topographic feedback on the first are decoupled, allowing much more stable, robust operation.
摘要翻译：这里呈现的成像模式结合了调幅（AM）原子力显微镜（AFM）（有时称为AC模式AFM）与频率调制（FM）AFM的特征和益处。在AM-FM成像中，来自第一谐振驱动频率的地形反馈以AM模式工作，而第二谐振驱动频率在FM模式下工作，并被调整以在相位谐振时保持90度相位。采用这种方法，对第二谐振模式的频率反馈和第一谐振模式的地形反馈是去耦的，从而允许更稳定，更稳健的操作。

46. 发明授权

US08342008B2 Scanning probe microscope 有权
标题翻译：扫描探针显微镜
公开(公告)号：US08342008B2
公开(公告)日：2013-01-01
申请号：US12187430
申请日：2008-08-07
申请人： Shuichi Baba , Masahiro Watanabe , Toshihiko Nakata , Yukio Kembo , Toru Kurenuma , Takafumi Morimoto , Manabu Edamura , Satoshi Sekino
发明人： Shuichi Baba , Masahiro Watanabe , Toshihiko Nakata , Yukio Kembo , Toru Kurenuma , Takafumi Morimoto , Manabu Edamura , Satoshi Sekino
IPC分类号： G01B5/28 , G01Q60/28
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q60/28 , G01Q60/34
摘要： In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern side wall, and an error occurs in a measured profile of the side wall portion. When a pattern having a groove width almost equal to a probe diameter is measured, the probe adheres to both side walls, the probe cannot reach the groove bottom, and the groove depth cannot be measured. When the probe adheres to a pattern side wall in measurements of a microscopic high-aspect ratio pattern using an elongated probe, the probe is caused to reach the side wall bottom by detecting the adhesion of the probe to the pattern side wall, and temporarily increasing a contact force between the probe and the sample. Also, by obtaining the data of the amount of torsion of a cantilever with the shape data of the pattern, a profile error of the side wall portion by the adhesion is corrected by the obtained data of the amount of torsion.
摘要翻译：在测量具有陡峭侧壁的图案的情况下，当接近图案侧壁时，探针通过作用在探针和侧壁之间的范德华力附着在侧壁上，并且在测量的轮廓中发生错误侧壁部分。当测量具有几乎等于探针直径的槽宽度的图案时，探针粘附到两个侧壁，探针不能到达凹槽底部，并且不能测量凹槽深度。当使用细长的探针测量微观高纵横比图案时探头粘附到图案侧壁上时，通过检测探针与图案侧壁的粘附力使探针到达侧壁底部，并暂时增加探针和样品之间的接触力。此外，通过利用图案的形状数据获得悬臂的扭转量的数据，通过获得的扭转量的数据来校正侧壁部分的粘附的轮廓误差。

47. 发明申请

US20090158828A1 Scanning Probe Microscope 有权
标题翻译：扫描探头显微镜
公开(公告)号：US20090158828A1
公开(公告)日：2009-06-25
申请号：US12187430
申请日：2008-08-07
申请人： Shuichi BABA , Masahiro Watanabe , Toshihiko Nakata , Yukio Kembo , Toru Kurenuma , Takafumi Morimoto , Manabu Edamura , Satoshi Sekino
发明人： Shuichi BABA , Masahiro Watanabe , Toshihiko Nakata , Yukio Kembo , Toru Kurenuma , Takafumi Morimoto , Manabu Edamura , Satoshi Sekino
IPC分类号： G01B5/28
CPC分类号： G01Q10/00 , B82Y35/00 , G01Q60/28 , G01Q60/34
摘要： In the case of measuring a pattern having a steep side wall, a probe adheres to the side wall by the van der Waals forces acting between the probe and the side wall when approaching the pattern side wall, and an error occurs in a measured profile of the side wall portion. When a pattern having a groove width almost equal to a probe diameter is measured, the probe adheres to both side walls, the probe cannot reach the groove bottom, and the groove depth cannot be measured. When the probe adheres to a pattern side wall in measurements of a microscopic high-aspect ratio pattern using an elongated probe, the probe is caused to reach the side wall bottom by detecting the adhesion of the probe to the pattern side wall, and temporarily increasing a contact force between the probe and the sample. Also, by obtaining the data of the amount of torsion of a cantilever with the shape data of the pattern, a profile error of the side wall portion by the adhesion is corrected by the obtained data of the amount of torsion.
摘要翻译：在测量具有陡峭侧壁的图案的情况下，当接近图案侧壁时，探针通过作用在探针和侧壁之间的范德华力粘附到侧壁，并且在测量的轮廓中发生错误侧壁部分。当测量具有几乎等于探针直径的槽宽度的图案时，探针粘附到两个侧壁，探针不能到达凹槽底部，并且不能测量凹槽深度。当使用细长的探针测量微观高纵横比图案时探头粘附到图案侧壁上时，通过检测探针与图案侧壁的粘附力使探针到达侧壁底部，并暂时增加探针和样品之间的接触力。此外，通过利用图案的形状数据获得悬臂的扭转量的数据，通过获得的扭转量的数据来校正侧壁部分的粘附的轮廓误差。

48. 发明申请

US20180303573A1 SYSTEMS AND METHODS FOR OPTOGENETIC IMAGING 审中-公开
公开(公告)号：US20180303573A1
公开(公告)日：2018-10-25
申请号：US15964832
申请日：2018-04-27
申请人： INSCOPIX, INC.
发明人： Mark O. TRULSON , Alice STAMATAKIS , Koen VISSCHER
IPC分类号： A61B90/20 , G01N21/64 , G02B21/00 , G02B21/32
CPC分类号： A61B90/20 , A61B5/0035 , A61B5/0059 , A61B5/0071 , A61B5/04001 , A61B5/4064 , G01N21/6458 , G01N2021/6439 , G01N2021/6441 , G01Q10/00 , G02B3/14 , G02B21/0004 , G02B21/0096 , G02B21/025 , G02B21/06 , G02B21/16 , G02B21/242 , G02B21/32
摘要： Provided herein are systems and methods for simultaneous imaging and stimulation using a microscope system. The microscope system can have a relatively small size compared to an average microscope system. The microscope can comprise in part an imaging light source and a stimulation light source. Light from the imaging light source and the stimulation light source can be spectrally separated to reduce cross talk between the stimulation light and the imaging light.

49. 发明授权

US10054613B2 Scanning probe microscope combined with a device for modifying the surface of an object 有权
公开(公告)号：US10054613B2
公开(公告)日：2018-08-21
申请号：US15541669
申请日：2015-07-10
申请人： PRIVATE INSTITUTION “NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM”
发明人： Alexander Alekseev , Aleksey Dmitriyevich Volkov , Dmitry Yuryevich Sokolov , Anton Evgeniyevich Efimov
IPC分类号： G01Q30/20 , G01Q10/00
CPC分类号： G01Q30/20 , G01N1/06 , G01N1/42 , G01N2001/2873 , G01Q10/00
摘要： The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.

50. 发明授权

US09885736B2 Electrode control methodology for a scanning tunneling microscope 有权
公开(公告)号：US09885736B2
公开(公告)日：2018-02-06
申请号：US15174939
申请日：2016-06-06
申请人： Mark J. Hagmann
发明人： Mark J. Hagmann
IPC分类号： G01Q60/10 , G01Q10/00 , G01Q10/06
CPC分类号： G01Q60/10 , G01Q10/00 , G01Q10/065
摘要： A control methodology for scanning tunneling microscopy is disclosed. Instead of utilizing Integral-based control systems, the methodology utilizes a dual-control algorithm to direct relative advancement of a STM tip towards a sample. A piezo actuator and stepper motor advances an STM tip towards a sample at a given distance until measuring a current greater than or equal to a desired setpoint current. Readings of the contemporaneous step are analyzed to direct the system to change continue or change direction and also determine the size of each step. In simulations where Proportion and/or Integral control methodology was added to the algorithm the stability of the feedback control is decreased. The present methodology accounts for temperature variances in the environment and also appears to clean and protect the tip electrode, prolonging its useful life.

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