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41. 发明申请

US20130278723A1 THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREMENT METHOD 审中-公开
标题翻译：三维测量系统和三维测量方法
公开(公告)号：US20130278723A1
公开(公告)日：2013-10-24
申请号：US13732702
申请日：2013-01-02
申请人： TEST RESEARCH, INC.
发明人： Liang-Pin YU , Don LIN
IPC分类号： G01B11/25
CPC分类号： G01B11/2513 , G01B11/2531
摘要： A three-dimensional measurement system includes a measurement carrier, first and second projection modules, an image-capturing module, and a control unit. The measurement carrier carries a test object on a measurement plane. The first projection module projects a first patterned structure light onto the test object along a first optical axis that forms a first incident angle relative to the measurement plane, and the second projection module projects a second patterned structure light onto the test object along a second optical axis that forms a second incident angle different from the first incident angle. The image-capturing module captures first and second patterned images formed after reflection of the first and second patterned structure lights from the test object. The control unit controls the first and second projection modules, and measures a three-dimensional shape of the test object according to the first and second patterned images.
摘要翻译：三维测量系统包括测量载体，第一和第二投影模块，图像捕获模块和控制单元。测量载体在测量平面上承载测试对象。第一投影模块沿着相对于测量平面形成第一入射角的第一光轴将第一图案化结构光投影到测试对象上，并且第二投影模块沿第二光学器件将第二图案化结构光投影到测试对象上轴形成不同于第一入射角的第二入射角。图像捕获模块捕获在来自测试对象的第一和第二图案化结构光的反射之后形成的第一和第二图案化图像。控制单元控制第一和第二投影模块，并且根据第一和第二图案化图像来测量测试对象的三维形状。

42. 发明授权

US08324908B2 Electrical connection defect detection device 有权
标题翻译：电气连接缺陷检测装置
公开(公告)号：US08324908B2
公开(公告)日：2012-12-04
申请号：US12761481
申请日：2010-04-16
申请人： Su-Wei Tsai , Shang-Tsang Yeh
发明人： Su-Wei Tsai , Shang-Tsang Yeh
IPC分类号： G01R31/04
CPC分类号： G01R31/046
摘要： An electrical connection defect detection device to detect whether an electrical connection between an under-test pin of an under-test device and a signal line of a circuit board is normal is provided. The electrical connection defect detection device comprises a signal provider providing a test signal to the under-test pin through the signal line, a detection module and an electrode board comprising a detection surface and at least one array of through holes. The detection surface contacts a surface of the under-test device to make the detection module detect a capacitance value associated with the electrode board, the under-test pin and the signal line larger than a threshold value when their connection is normal. The through holes are placed along the edges of the electronic board and are electrically connected to a ground potential to perform a capacitive shielding.
摘要翻译：一种电连接缺陷检测装置，用于检测被测试装置的未被测试的引脚与电路板的信号线之间的电连接是否正常。电连接缺陷检测装置包括信号提供器，通过信号线向被测试引脚提供测试信号，检测模块和包括检测表面和至少一个通孔阵列的电极板。检测面接触被测设备的表面，使得检测模块在连接正常时检测与电极板，欠压引脚和信号线相关联的电容值大于阈值。通孔沿着电子板的边缘放置并且电连接到地电位以执行电容屏蔽。

43. 发明申请

US20120173214A1 ELECTRICAL CONNECTION DEFECT SIMULATION TEST METHOD AND SYSTEM OF THE SAME 有权
标题翻译：电气连接缺陷模拟测试方法及其系统
公开(公告)号：US20120173214A1
公开(公告)日：2012-07-05
申请号：US13039843
申请日：2011-03-03
申请人： Su-Wei Tsai , Ming-Hsien Liu
发明人： Su-Wei Tsai , Ming-Hsien Liu
IPC分类号： G06G7/48
CPC分类号： G06F11/261 , G01R31/318357
摘要： An electrical connection defect simulation test method is provided. The electrical connection state simulation test method includes the steps as follows. A device under test is provided, wherein the device under test includes a plurality of pin groups each having a plurality of signal pins. A zero-frequency signal is transmitted from a signal-feeding device to each of the signal pins to simulate an open condition. An open test is performed on each of the signal pins. The signal pins of the device under test are connected to a relay matrix. The relay matrix is controlled to make any two of the signal pins in one of the pin groups electrically connected to simulate a short condition. A short test is performed on any two of the electrically connected signal pins. An electrical connection state simulation test system is disclosed herein as well.
摘要翻译：提供电气连接缺陷模拟试验方法。电气连接状态模拟测试方法包括以下步骤。提供了一种被测器件，其中被测器件包括多个引脚组，每个引脚组具有多个信号引脚。零信号从信号馈送装置发送到每个信号引脚以模拟打开状态。对每个信号引脚进行开路测试。被测器件的信号引脚连接到继电器矩阵。控制继电器矩阵以使其中一个引脚组中的任何两个信号引脚电连接以模拟短路状态。对任何两个电气连接的信号引脚进行短路测试。本文还公开了电连接状态模拟测试系统。

44. 发明申请

US20100090679A1 APPARATUS FOR TESTING PRINTED CIRCUIT AND METHOD THEREFOR 有权
标题翻译：用于测试印刷电路的设备及其方法
公开(公告)号：US20100090679A1
公开(公告)日：2010-04-15
申请号：US12251892
申请日：2008-10-15
申请人： Shang-Tsang YEH , Chia-Ming Chen
发明人： Shang-Tsang YEH , Chia-Ming Chen
IPC分类号： G01R27/02
CPC分类号： G01R31/312 , G01R31/2806 , G01R31/304 , G01R31/315
摘要： An apparatus comprises a sensor, a power supply and a measurer. The sensor is placed over the electronic component. The power supply can supply electric power to the printed circuit; thereby the printed circuit is powered on. The measurer can measure a sensing signal through the sensor when the printed circuit is powered on.
摘要翻译：一种装置包括传感器，电源和测量器。传感器放置在电子元件上。电源可以为印刷电路供电; 从而印刷电路通电。当印刷电路通电时，测量仪可以通过传感器测量感测信号。

45. 发明申请

US20090243642A1 Electronic Device Testing System and Method 有权
标题翻译：电子设备测试系统和方法
公开(公告)号：US20090243642A1
公开(公告)日：2009-10-01
申请号：US12060817
申请日：2008-04-01
申请人： Su-Wei Tsai , Hsin-Hao Chen
发明人： Su-Wei Tsai , Hsin-Hao Chen
IPC分类号： G01R31/02
CPC分类号： G01R31/2813 , G01R31/043
摘要： The invention provides a testing system and method suitable for determining whether the pins of the socket are properly connected to a printed circuit board. The testing system includes a testing signal source, a socket, a signal sensing unit, a fixing element, and an analysis unit. The signal sensing unit comprises a sensor board, a probe, and an operation amplifier. The sensor board is electrically coupled to the socket, and the sensor board has a probing point. The probe is selectively contacted with the probing point of the sensor board for receiving and outputting a sensing signal. The operation amplifier is electrically connected to the probe for receiving, amplifying and outputting the sensing signal. The fixing element is used for fixing the sensor board between the socket and the fixing element.
摘要翻译：本发明提供了一种适用于确定插座的插针是否正确连接到印刷电路板的测试系统和方法。测试系统包括测试信号源，插座，信号感测单元，固定元件和分析单元。信号感测单元包括传感器板，探针和运算放大器。传感器板电耦合到插座，传感器板具有探测点。探头选择性地与传感器板的探测点接触，用于接收和输出感测信号。运算放大器电连接到探头，用于接收，放大和输出感测信号。固定元件用于将传感器板固定在插座和固定元件之间。

46. 发明授权

US07529336B2 System and method for laminography inspection 有权
标题翻译：系统和方法进行层析检查
公开(公告)号：US07529336B2
公开(公告)日：2009-05-05
申请号：US11756503
申请日：2007-05-31
申请人： Kuang Pu Wen , Shih-Liang Chen , Meng Kun Lee
发明人： Kuang Pu Wen , Shih-Liang Chen , Meng Kun Lee
IPC分类号： G01N23/00
CPC分类号： G01N23/044 , G01N2223/419
摘要： A laminography inspection system comprises an irradiation source, a plurality of linear image detectors defining an image plane, a fixed table for placement of a test object in a stationary position between the irradiation source and the image detectors, and a computing device for processing a plurality of images of the test object acquired from the image detectors. The irradiation source and the image detectors perform a plurality of parallel linear scanning passes across the area of the test object to acquire images of the test object under different viewing angles. Based on the acquired image data, the computing device determines a warp compensation and generates a cross-sectional image of a selected section within the test object.
摘要翻译：层析检查系统包括照射源，限定图像平面的多个线性图像检测器，用于将被检体放置在照射源和图像检测器之间的静止位置的固定台，以及用于处理多个从图像检测器获取的测试对象的图像。照射源和图像检测器在测试对象的区域上执行多个平行线性扫描通过，以在不同的视角下获取测试对象的图像。基于所获取的图像数据，计算装置确定翘曲补偿并生成测试对象内所选部分的横截面图像。

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