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1. 发明授权

US10002809B2 Top contact resistance measurement in vertical FETs 有权
公开(公告)号：US10002809B2
公开(公告)日：2018-06-19
申请号：US15622614
申请日：2017-06-14
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION
发明人： Kangguo Cheng , Zuoguang Liu , Xin Miao , Wenyu Xu , Chen Zhang
IPC分类号： H01L21/66 , H01L29/786 , H01L29/423 , H01L29/78 , G01R31/28 , G01R27/20 , H01L21/8234 , H01L27/06 , G01R31/26
CPC分类号： H01L22/32 , G01R27/205 , G01R31/2621 , G01R31/2813 , G01R31/2856 , H01L21/76838 , H01L21/823487 , H01L21/823821 , H01L21/823885 , H01L21/845 , H01L22/14 , H01L22/34 , H01L27/0629 , H01L29/42392 , H01L29/6609 , H01L29/66136 , H01L29/66204 , H01L29/66666 , H01L29/66712 , H01L29/66795 , H01L29/7788 , H01L29/7802 , H01L29/7827 , H01L29/78603 , H01L29/78618 , H01L29/78642 , H01L29/78696
摘要： A test device includes a diode junction layer having a first dopant conductivity region and a second dopant conductivity region formed within the diode junction layer on opposite sides of a diode junction. A first portion of vertical transistors is formed over the first dopant conductivity region as a device under test, and a second portion of vertical transistors is formed over the second dopant conductivity region. A common source/drain region is formed over the first and second portions of vertical transistors. Current through the first portion of vertical transistors permits measurement of a resistance at a probe contact connected to the common source/drain region.

2. 发明授权

US09958496B2 Layer-layer registration coupon for printed circuit boards 有权
公开(公告)号：US09958496B2
公开(公告)日：2018-05-01
申请号：US14838605
申请日：2015-08-28
申请人： Oracle International Corporation
发明人： Stephanie Moran , Michael C. Freda , Karl Sauter
IPC分类号： G01R31/28 , H05K1/11 , H05K1/02 , H05K3/46 , H05K1/16 , H05K3/00
CPC分类号： G01R31/2813 , H05K1/0266 , H05K1/0268 , H05K1/0298 , H05K1/11 , H05K1/167 , H05K3/0052 , H05K3/0097 , H05K3/4679 , H05K2201/09381 , H05K2201/09636 , H05K2201/097 , H05K2201/09781 , H05K2203/166
摘要： A method and apparatus for determining misregistration of internal layers of a PCB using resistance measurements is disclosed. In one embodiment, a method includes measuring a first resistance between a first center terminal and a first peripheral terminal of a first registration coupon on a printed circuit board (PCB) panel including at least one PCB. The method further includes measuring a second resistance between the first center terminal and a second peripheral terminal of the first registration coupon, wherein the first and second peripheral terminals are associated with a first internal layer of the PCB. A difference between the first and second resistances is then calculated. Then, based on this difference, a determination is made of a distance of misregistration of the first internal layer, if any, along a first axis.

3. 发明授权

US09733300B2 Corrosion detection system 有权
公开(公告)号：US09733300B2
公开(公告)日：2017-08-15
申请号：US14610801
申请日：2015-01-30
申请人： KONE Corporation
发明人： Jukka Korpela , Mikko Vaskela
IPC分类号： G01R31/00 , G01R31/28 , G01N17/00
CPC分类号： G01R31/2813 , G01N17/00 , G01R31/2812 , G01R31/2818
摘要： A printed circuit arrangement employs a printed circuit board having a corrosion test circuit provided with at least two conductive pads which are located proximate to each other in a measuring area. The arrangement uses a measuring device to identify corrosion on other defects in the circuit board including short circuits and/or line cuts. One pad is an excitation pad, being connected to an excitation signal source, and the other pad is a response pad, whereby the measuring device is connected at least to the response pad.

4. 发明授权

US09511455B2 Substrate inspection device and component mounting device 有权
标题翻译：基板检查装置和部件安装装置
公开(公告)号：US09511455B2
公开(公告)日：2016-12-06
申请号：US14624124
申请日：2015-02-17
申请人： CKD Corporation
发明人： Manabu Okuda , Tsuyoshi Ohyama , Norihiko Sakaida
IPC分类号： G01N21/01 , B23K37/04 , G01N21/956 , G01R31/309 , G01R31/28
CPC分类号： B23K37/04 , G01N21/956 , G01N2021/95646 , G01R31/2813 , G01R31/309
摘要： A substrate inspection device and a component mounting device are provided. The solder inspection device and the component mounting device respectively have substrate support devices that support a rear face of a printed circuit board. The substrate support device includes backup pins that support the rear surface of the printed circuit board, a location determiner that determines locations of the backup pins, and a backup pin locator that places the backup pins at the locations of the backup pins determined by the location determiner. The location determiner determines positions for supporting areas of the rear face of the printed circuit board where an electrode is covered by a resist film and where neither electronic component nor solder is present, as the locations of the backup pins.
摘要翻译：提供了基板检查装置和部件安装装置。焊料检查装置和部件安装装置分别具有支撑印刷电路板的背面的基板支撑装置。基板支撑装置包括支撑印刷电路板的后表面的备用引脚，确定备用引脚的位置的位置确定器以及将备用引脚放置在由位置确定的备用引脚的位置处的备用引脚定位器决定者位置确定器确定用于支撑引脚的位置的用于支撑印刷电路板的背面的区域的位置，其中电极被抗蚀剂膜覆盖，并且其中不存在电子部件和焊料。

5. 发明申请

US20160124028A1 METHOD FOR CHECKING THE ABSENCE OF VOLTAGE ON A POWER ELECTRONIC COMPONENT OF A MOTOR VEHICLE 有权
标题翻译：电动汽车电力电子元件电压检测方法
公开(公告)号：US20160124028A1
公开(公告)日：2016-05-05
申请号：US14897845
申请日：2014-05-30
申请人： AUDI AG
发明人： SASCHA STAUDENMAIER
IPC分类号： G01R19/155 , G01R31/00
CPC分类号： G01R19/155 , B60L1/003 , B60L1/02 , B60L3/0069 , B60L3/04 , G01R27/08 , G01R31/006 , G01R31/02 , G01R31/2812 , G01R31/2813
摘要： A method is disclosed for checking the absence of voltage on a power electronic component connected to a high-voltage battery and to an electrical machine in a high-voltage network of a motor vehicle, which component has a higher voltage than a low-voltage network of the motor vehicle. The power electronic component includes an intermediate circuit capacitor, a passive discharge resistor, a plug-in terminal for at least one high-voltage load and a fuse which is connected upstream of the plug-in terminal. Following disconnection of the high-voltage battery from the high-voltage network and when the connector of the cable plugged into the plug-in terminal is withdrawn from the plug-in terminal—or a target terminal, a feed voltage is applied via the high-voltage contacts of the plug connection and the voltage curve and/or, after a defined charging time interval of the intermediate circuit capacitor, the resistance is measured by means of a measuring instrument, wherein an absence of voltage is determined in the event of a voltage curve lying in an intended range—or a resistance lying in an intended range.
摘要翻译：公开了一种用于检查连接到高电压电池的电力电子部件和机动车辆的高压网络中的电机的电压不存在的方法，该部件具有比低压电网更高的电压的汽车。电力电子部件包括中间电路电容器，无源放电电阻器，用于至少一个高压负载的插入式端子和连接在插入式端子上游的保险丝。在高压电池从高压网络断开连接之后，当插入插入式端子的电缆的连接器从插入式端子或目标端子拔出时，通过高电压 - 插头连接的电压触点和电压曲线和/或在中间电路电容器的确定的充电时间间隔之后，通过测量仪器测量电阻，其中在发生电压的情况下确定不存在电压电压曲线位于预期范围内，或位于预期范围内的电阻。

6. 发明申请

US20150309102A1 LINE TESTING DEVICE FOR ARRAY SUBSTRATE HAVING DENSE NUMBER OF WIRES AND METHOD FOR TESTING LINE OF THE ARRAY SUBSTRATE HAVING THE DENSE NUMBER OF WIRES 有权
标题翻译：具有电线数目的阵列基板的线路测试装置和测试具有电线数目的阵列基板的线路的方法
公开(公告)号：US20150309102A1
公开(公告)日：2015-10-29
申请号：US14241081
申请日：2014-01-13
申请人： SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
发明人： Xiangyang XU
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/021 , G01R31/2813 , G01R31/2851
摘要： A line testing device for an array substrate having a dense number of wires. includes a signal generating device that generates a detection signal, a signal receiving device that receives and processes the detection signal, and a control divice. The detection signal tests the array substrate having the dense number of wires, and the control device controls one or more of the signal generating device and the signal receiving device to move in a direction perpendicular to a direction of a scan line of the array substrate and in a plane parallel to the array substrate.
摘要翻译：一种具有密集数量的导线的阵列基片的线测试装置。包括产生检测信号的信号发生装置，接收并处理检测信号的信号接收装置，以及控制部。检测信号测试具有密集数量的导线的阵列基板，并且控制装置控制信号产生装置和信号接收装置中的一个或多个沿垂直于阵列基板的扫描线的方向的方向移动，在与阵列基板平行的平面内。

7. 发明授权

US09151795B2 Apparatus for inspecting passive component having signal transmission line 有权
标题翻译：用于检测具有信号传输线的无源部件的装置
公开(公告)号：US09151795B2
公开(公告)日：2015-10-06
申请号：US13682970
申请日：2012-11-21
申请人： Avago Technologies General IP (Singapore) Pte. Ltd.
发明人： Jin Jeong
IPC分类号： G01R31/08 , G01R31/11 , G01R31/28
CPC分类号： G01R31/11 , G01R31/2801 , G01R31/2812 , G01R31/2813
摘要： An apparatus for inspecting a passive component having a signal transmission line on a printed circuit board (PCB), includes a reflectometry unit for inputting an incident signal to an input port connected to the signal transmission line, receiving a reflected signal in response to the incident signal, and computing a plurality of frequency-based reflection coefficient values in a preset frequency range and a plurality of time-based reflection coefficient values in a preset time range based on the incident signal and the reflected signal; and a defect detection unit for determining whether the signal transmission line has a defect based on the plurality of frequency-based reflection coefficient values, and determining a location of the defect on the signal transmission line based on the plurality of time-based reflection coefficient values.
摘要翻译：一种用于检查在印刷电路板（PCB）上具有信号传输线的无源部件的装置，包括反射测量单元，用于将入射信号输入到连接到信号传输线的输入端口，响应于事件接收反射信号基于所述入射信号和所述反射信号，在预设的时间范围内，在预设频率范围和多个基于时间的反射系数值中计算多个基于频率的反射系数值; 以及缺陷检测单元，用于基于所述多个基于频率的反射系数值来确定所述信号传输线是否具有缺陷，以及基于所述多个基于时间的反射系数值来确定所述信号传输线上的所述缺陷的位置。

8. 发明授权

US08912802B2 Component-embedded circuit substrate and method of inspecting the same 有权
标题翻译：组件嵌入式电路基板及其检测方法
公开(公告)号：US08912802B2
公开(公告)日：2014-12-16
申请号：US14217002
申请日：2014-03-17
申请人： Taiyo Yuden Co., Ltd.
发明人： Shigeo Sakurai , Tetsuo Saji
IPC分类号： G01R31/02 , G01R27/26 , G01R31/04 , H05K1/18 , H05K1/02
CPC分类号： G01R31/048 , G01R27/26 , G01R31/028 , G01R31/2812 , G01R31/2813 , H05K1/0231 , H05K1/0268 , H05K1/185 , H05K3/4602 , H05K2201/10522 , H05K2201/10636 , Y02P70/611
摘要： In a component-embedded circuit substrate having a plurality of capacitors embedded therein, the capacitors are connected in parallel, inspection electrodes are formed, and the inspection electrodes connect to respective terminal electrodes of the capacitor through via conductors. At the terminal electrodes of the capacitor, the connection position of the via conductors for connecting the inspection electrodes differs from the connection position of via conductors for connecting respective terminal electrodes of the capacitor.
摘要翻译：在嵌入有多个电容器的分量嵌入式电路基板中，并联连接电容器，形成检查电极，检查电极通过通孔导体与电容器的各个端子电极连接。在电容器的端子电极上，用于连接检查电极的通路导体的连接位置与用于连接电容器的各个端子电极的通路导体的连接位置不同。

9. 发明授权

US08901946B2 Identifying a signal on a printed circuit board under test 有权
标题翻译：识别被测电路板上的信号
公开(公告)号：US08901946B2
公开(公告)日：2014-12-02
申请号：US12785572
申请日：2010-05-24
申请人： Bhyrav M. Mutnury , Nam H. Pham , Terence Rodrigues
发明人： Bhyrav M. Mutnury , Nam H. Pham , Terence Rodrigues
IPC分类号： G01R31/20 , G01R31/28
CPC分类号： G01R31/2813 , G01R31/2815
摘要： Apparatus and methods for identifying a signal on a printed circuit board (‘PCB’) under test, including an integrated circuit mounted on the PCB, the integrated circuit having a test signal generator that transmits a test signal to an output pin of the integrated circuit, with the output pin connected to a test point on the PCB; the integrated circuit also having signal identification logic that inserts into the test signal, an identifier of the signal; a test probe in contact with the test point; and a signal-identifying controller that receives the test signal and the identifier from the test probe and displays, in dependence upon the identifier, the identity of the signal.
摘要翻译：用于识别被测PCB板上的信号的装置和方法，包括安装在PCB上的集成电路，该集成电路具有测试信号发生器，该测试信号发生器将测试信号发送到集成电路的输出引脚，输出引脚连接到PCB上的测试点; 该集成电路还具有插入到测试信号中的信号识别逻辑，该信号的标识符; 与测试点接触的测试探针; 以及信号识别控制器，其从测试探针接收测试信号和标识符，并根据标识符显示信号的身份。

10. 发明申请

US20140139233A1 APPARATUS FOR INSPECTING PASSIVE COMPONENT HAVING SIGNAL TRANSMISSION LINE 有权
标题翻译：用于检查具有信号传输线的被动组件的装置
公开(公告)号：US20140139233A1
公开(公告)日：2014-05-22
申请号：US13682970
申请日：2012-11-21
申请人： AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. L
发明人： Jin JEONG
IPC分类号： G01R31/11 , G01R31/28
CPC分类号： G01R31/11 , G01R31/2801 , G01R31/2812 , G01R31/2813
摘要： An apparatus for inspecting a passive component having a signal transmission line on a printed circuit board (PCB), includes a reflectometry unit for inputting an incident signal to an input port connected to the signal transmission line, receiving a reflected signal in response to the incident signal, and computing a plurality of frequency-based reflection coefficient values in a preset frequency range and a plurality of time-based reflection coefficient values in a preset time range based on the incident signal and the reflected signal; and a defect detection unit for determining whether the signal transmission line has a defect based on the plurality of frequency-based reflection coefficient values, and determining a location of the defect on the signal transmission line based on the plurality of time-based reflection coefficient values.
摘要翻译：一种用于检查在印刷电路板（PCB）上具有信号传输线的无源部件的装置，包括反射测量单元，用于将入射信号输入到连接到信号传输线的输入端口，响应于事件接收反射信号基于所述入射信号和所述反射信号，在预设的时间范围内，在预设频率范围和多个基于时间的反射系数值中计算多个基于频率的反射系数值; 以及缺陷检测单元，用于基于所述多个基于频率的反射系数值来确定所述信号传输线是否具有缺陷，以及基于所述多个基于时间的反射系数值来确定所述信号传输线上的所述缺陷的位置。

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