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    • 42. 发明授权
    • Method of forming uniform features using photoresist
    • 使用光刻胶形成均匀特征的方法
    • US07560225B2
    • 2009-07-14
    • US10448501
    • 2003-05-29
    • Omar Eduardo Montero CamachoPei-C ChenCherngye HwangDiana PerezEric Yongjian Sun
    • Omar Eduardo Montero CamachoPei-C ChenCherngye HwangDiana PerezEric Yongjian Sun
    • G03F7/40B44C1/22
    • G11B5/3173G03F7/40G03F7/405G11B5/102
    • A process for ion milling using photoresist as a mask is described. In a preferred embodiment the invention is used in the fabricating air-bearing features on sliders for use in magnetic storage devices. According to the invention the photoresist (liquid or dry) is applied, developed and removed as in the prior art which includes baking steps. The embodiment of the invention includes an additional baking step beyond whatever baking steps are used in the photolithography process. The additional baking step is preferably performed immediately prior to ion milling. The additional baking step according to the invention yields increased uniformity of the depth of the ion milling which is believed to result from reduction of volatile material such as water in the photoresist. When the invention is used as part of the manufacturing process for ion milling the air-bearing features on a slider, the features are more uniform which improves the overall quality and performance.
    • 描述使用光致抗蚀剂作为掩模的离子铣削的方法。 在优选实施例中,本发明用于制造用于磁存储装置的滑块上的空气轴承特征。 根据本发明,如在包括烘烤步骤的现有技术中,应用,显影和去除光致抗蚀剂(液体或干燥)。 本发明的实施例包括除了在光刻工艺中使用的任何烘烤步骤之外的额外的烘烤步骤。 额外的烘烤步骤优选在离子研磨之前立即进行。 根据本发明的另外的烘烤步骤产生离子研磨深度的均匀性,这被认为是通过光致抗蚀剂中的挥发性物质例如水的还原引起的。 当将本发明用作离子铣削制造过程的一部分时,滑块上的空气轴承特征更加均匀,这提高了整体的质量和性能。
    • 50. 发明授权
    • Magnetoresistive sensor having antiferromagnetic layer for exchange bias
    • 具有用于交换偏置的反铁磁层的磁阻传感器
    • US5315468A
    • 1994-05-24
    • US920943
    • 1992-07-28
    • Tsann LinJames K. HowardCherngye HwangDaniele MauriNorbert Staud
    • Tsann LinJames K. HowardCherngye HwangDaniele MauriNorbert Staud
    • G11B5/39G11B5/127G11B5/33
    • G11B5/3903G11B5/3932
    • A magnetoresistive (MR) sensor comprising a sputtered layer of ferromagnetic material and a sputtered layer of antiferromagnetic nickel-manganese (Ni-Mn) to provide an exchange coupled longitudinal bias field in the MR element is described. The antiferromagnetic layer overlays the MR layer and may be patterned to provide the longitudinal bias field only in the end regions of the MR layer. Alternatively, the antiferromagnetic layer can underlay the MR layer with a Zr underlayer to enhance the exchange-coupled field. As initially deposited, the Ni-Mn layer is face-centered-cubic and exhibits little or no exchange-coupled field. After one annealing cycle at a relatively low temperature, the Ni-Mn layer is face-centered-tetragonal and exhibits increased crystallographic ordering and provides sufficient exchange coupling for the MR element to operate. Addition of chromium to the Ni-Mn alloy provides increased corrosion resistance.
    • 描述了一种磁阻(MR)传感器,其包括铁磁材料的溅射层和反铁磁镍锰(Ni-Mn)的溅射层,以在MR元件中提供交换耦合的纵向偏置场。 反铁磁层覆盖MR层,并且可以被图案化以仅在MR层的端部区域中提供纵向偏置场。 或者,反铁磁层可以用Zr底层来衬底MR层以增强交换耦合场。 最初沉积时,Ni-Mn层是面心立方体,表现出很少或没有交换耦合场。 在相对较低温度下的一个退火循环之后,Ni-Mn层是面对中心的四边形,并且显示出增加的晶体学顺序,并提供用于MR元件操作的足够的交换耦合。 向Ni-Mn合金中添加铬提高了耐腐蚀性。