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    • 42. 发明授权
    • Surface detect test apparatus
    • 表面检测试验装置
    • US4162126A
    • 1979-07-24
    • US859206
    • 1977-12-09
    • Yasuo NakagawaToshimitsu Hamada
    • Yasuo NakagawaToshimitsu Hamada
    • G01N21/952G01N21/48
    • G01N21/952
    • Apparatus and method for testing surface defect on an object are disclosed, which comprise an illumination means for illuminating collimated lights onto a surface of the object obliquely to the surface and from two symmetrical directions, a sensor composed of a TV camera or a linear image sensor for sensing diffused reflected lights from the surface of the object in the direction perpendicular to the surface, a classification means for discriminating the sensed image signal by a threshold level which is higher than an average level of the image signal and a threshold level which is lower than the average level to determine the surface defect pattern as a broken cavity pattern or a pit or crack pattern by the discriminated signals, and a discrimination means for calculating L.sup.2 -4.pi.S, where S is an area of the defect and L is a length of the contour, when signal discriminated by the lower threshold level is produced to discriminate the pit pattern and the crack pattern by determining whether L.sup.2 -4.pi.S exceeds a predetermined value or not. In this manner, the defects that exist on the surface of the object can be classified and evaluated.
    • 公开了一种用于测试物体上的表面缺陷的装置和方法,该装置和方法包括用于将准直光照射到物体表面上的表面和两个对称方向的照明装置,由TV照相机或线性图像传感器 用于在垂直于表面的方向上感测来自物体表面的漫反射光;分类装置,用于将感测到的图像信号鉴别出高于图像信号的平均电平的阈值电平和较低的阈值电平 比通过鉴别信号确定表面缺陷图案为断裂图案或凹坑或裂纹图案的平均水平,以及用于计算L2-4 pi S的鉴别装置,其中S是缺陷的面积,L是 当产生由较低阈值电平鉴别的信号时,轮廓的长度可通过确定wh来区分凹坑图案和裂纹图案 醚L2-4 pi S超过预定值。 以这种方式,可以分类和评估存在于物体表面上的缺陷。