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    • 1. 发明授权
    • Apparatus for the detection of surface defects
    • 用于检测表面缺陷的装置
    • US5565980A
    • 1996-10-15
    • US360838
    • 1995-01-03
    • Iain S. DavidsonThomas G. RiceMark Hague
    • Iain S. DavidsonThomas G. RiceMark Hague
    • G01B11/30G01N21/88G01N21/93G01N21/95G01N21/952G21C17/06G01N21/48
    • G21C17/06G01N21/952G21Y2002/201G21Y2002/205G21Y2004/30G21Y2004/401
    • An apparatus for the detection of surface defects on cylindrical objects which includes means for conveying the objects to be inspected one-by-one each on its end to a first inspection station, means for inspecting the free end of each object as it passes through the first inspection station, means for conveying the objects one-by-one each on its side to a second inspection station the means for tipping the objects from their ends to their sides, means for rotating each object whilst passing it on its side through the second inspection station, means for inspecting the curved surface of each object as it passes through the second inspection station, means for conveying the objects one-by-one to a third inspection station the said means including means for tipping the objects onto their end inspected at the first inspection station and means for inspecting the free end of each object as it passes through the third inspection station.
    • PCT No.PCT / GB94 / 00940 Sec。 371日期1995年1月3日 102(e)日期1995年1月3日PCT提交1994年5月3日PCT公布。 出版物WO94 / 25858 日期1994年11月10日一种用于检测圆柱形物体上的表面缺陷的装置,包括用于将其末端检查的每个检查对象传送到第一检查站的装置,用于检查每个物体的自由端的装置 当通过第一检查站时,用于将物体在其侧面一个接一个地传送到第二检查站的装置用于将物体从其端部倾斜到其侧面的装置,用于在将物体通过时旋转每个物体的装置 通过第二检查站的侧面,用于检查每个物体通过第二检查站的弯曲表面的装置,用于将物体一个接一个地传送到第三检查站的装置,所述装置包括用于倾倒物体的装置 在第一检查站检查他们的终端,并且当每个物体通过第三检查站时检查每个物体的自由端的装置。
    • 2. 发明授权
    • Surface defect inspection system
    • 表面缺陷检查系统
    • US4403294A
    • 1983-09-06
    • US211113
    • 1980-11-28
    • Toshimitsu HamadaHiroshi MakihiraYasuo NakagawaMakoto Udaka
    • Toshimitsu HamadaHiroshi MakihiraYasuo NakagawaMakoto Udaka
    • G01B11/00G01B11/24G01B11/30G01N21/88G06T1/00G06T7/00G01N21/48
    • G01N21/88G06T7/001G06T2207/30164
    • A surface defect inspection system comprises an image pick-up device for picking up an image by sequentially scanning the surface of an object two-dimensionally, a threshold circuit for quantizing the image signal produced from the image pick-up device as a binary code, a pattern feature extracting device for making calculations for extracting the features of image patterns from the quantized signal in synchronism with the scanning, and for temporarily storing the result of the calculations, a pattern region end decision device for deciding that individual pattern regions have ended in one direction, and a defect decision device for reading out from the pattern feature extracting device the result of the calculations on the pattern features corresponding to the positions each of the patterns in the direction perpendicular to the one direction each time of the decision that each pattern region has ended, so that the feature of each pattern scanned is compared with a predetermined reference, thus deciding and an indication of producing the presence or absence of a defect.
    • 表面缺陷检查系统包括用于通过二维顺序地扫描对象的表面来拾取图像的图像拾取装置,用于量化由图像拾取装置产生的图像信号作为二进制代码的阈值电路, 图案特征提取装置,用于进行与扫描同步地从量化信号中提取图像图案的特征的计算,并且用于临时存储计算结果;图案区域结束判定装置,用于决定各个图案区域已经结束 一个方向,以及缺陷判定装置,用于从每个图案特征提取装置的每个图案每次都从与图形特征相对应的图案特征相对应的图案特征提取装置读出与每个方向垂直的方向上的位置的计算结果 区域已经结束,使得所扫描的每个图案的特征与预定的裁剪进行比较 因此,决定和产生缺陷的存在或缺失的指示。
    • 3. 发明授权
    • Device for measuring the reflection of a plane, specularly reflecting
surface
    • 用于测量平面的反射的装置,镜面反射表面
    • US4201479A
    • 1980-05-06
    • US909808
    • 1978-05-26
    • Marcel A. Lardon
    • Marcel A. Lardon
    • G01N21/55G01N21/48
    • G01N21/55
    • The present invention relates to a device for measuring the reflection of a plane, specularly reflecting surface, in which a measuring beam of radiation is directed onto the surface to be measured through an optical converging lens and the radiation reflected from the surface is directed through the same lens to a radiation receiver. In such a system, preferably, the optical connections between the source of radiation and the converging lens and between the lens and the radiation receiver are established by means of a fiber-optical photoconductor or a lens and mirror systems. Such a device may be employed, for example, for measuring the reflection of thin layers deposited in a vacuum evaporator.
    • 本发明涉及一种用于测量反射表面的反射面的装置,其中测量光束通过光学会聚透镜被引导到待测量的表面上,并且从表面反射的辐射被引导通过 相同的镜头到辐射接收器。 在这种系统中,优选地,通过光纤光电导体或透镜和镜系统来建立辐射源和会聚透镜之间以及透镜和辐射接收器之间的光学连接。 这种装置可以用于例如测量沉积在真空蒸发器中的薄层的反射。
    • 5. 发明授权
    • Optical web inspection system
    • 光学网检查系统
    • US4170419A
    • 1979-10-09
    • US771103
    • 1977-02-23
    • Richard G. Van TyneWeldon A. Sanders, Jr.Richard D. De La MatyrDavid L. Gates
    • Richard G. Van TyneWeldon A. Sanders, Jr.Richard D. De La MatyrDavid L. Gates
    • G01N21/89G01N21/898G01N21/32G01N21/26G01N21/48
    • G01N21/8915G01N21/8983
    • The specification discloses an optical web inspection system for detecting imperfections in a web having a longitudinal axis and moving in a plane across an inspection area. Radiation means is disposed above the plane of the web and transverse to the longitudinal axis of the web for directing radiant energy on the web at the inspection area. A plurality of sensors are mounted transverse to the longitudinal axis of the web and above the inspection area for receiving reflected radiation from successive transverse portions of the web passing across the inspection area. The plurality of sensors generate electrical output signals representing the intensity of the reflected radiation from the successive transverse portions of the web. Circuitry for periodically summing the electrical output signals from selected ones of the sensors is provided to generate a summation signal representative of the sum of reflected radiation from selected discrete segments of a plurality of the transverse portions of the web. The system further includes circuitry for comparing at least one of the electrical output signals with the summation signal for determining whether an imperfection exists within the web.
    • 本说明书公开了一种用于检测具有纵向轴线并在跨越检查区域的平面中移动的幅材中的缺陷的光学卷材检查系统。 辐射装置设置在幅材的平面上方并且横向于幅材的纵向轴线,以在检查区域上引导幅材上的辐射能量。 多个传感器横向于幅材的纵向轴线并且在检查区域上方安装,用于接收穿过检查区域的幅材的连续横向部分的反射辐射。 多个传感器产生表示来自幅材的连续横向部分的反射辐射的强度的电输出信号。 提供用于周期性地对来自选定传感器的电输出信号进行求和的电路以产生表示来自幅材的多个横向部分的所选离散段的反射辐射之和的求和信号。 该系统还包括用于将至少一个电输出信号与求和信号进行比较的电路,用于确定网内是否存在缺陷。
    • 6. 发明授权
    • Laser mirror scatter and reflectivity measuring system
    • 激光镜散射和反射率测量系统
    • US4156571A
    • 1979-05-29
    • US831113
    • 1977-09-07
    • Bo H. G. Ljung
    • Bo H. G. Ljung
    • G01N21/47H01S3/139G01N21/48
    • G01N21/4738H01S3/1398
    • A measuring system for a ring laser mirror, or the like, is provided, whereby the mirror can be quickly scanned and the backscatter levels measured and presented in the form of a map which directly indicates the spots of the mirror where acceptable backscatter levels exist. When such a spot has been identified, the system of the invention is also capable of measuring the reflectivity of the spot, which normally must be approximately 99.7% to be acceptable. The system of the invention has the capability of measuring the reflectivity of the mirror in addition to measuring the backscatter in a single set-up, and without having to manipulate the mirror.
    • 提供了一种用于环形激光反射镜等的测量系统,由此可以快速扫描反射镜,并且以地图的形式测量和呈现后向散射电平,其直接指示存在可接受的反向散射电平的反射镜的点。 当已经识别出这样一个点时,本发明的系统也能够测量点的反射率,这通常必须是大约99.7%是可接受的。 除了在单个装置中测量反向散射之外,本发明的系统还具有测量反射镜的反射率的能力,并且不必操纵反射镜。
    • 7. 发明授权
    • Surface-gloss measuring device
    • 表面光泽测量装置
    • US4124303A
    • 1978-11-07
    • US784718
    • 1977-04-05
    • Burkett C. Herrick
    • Burkett C. Herrick
    • G01N21/57G01N21/48
    • G01N21/57
    • An elongated cylinder having a hollow interior is provided with a first open end and a second closed end. Reflecting media are provided on the interior portion of the closed end and on half of the inner surface of the circumferential wall surface of the cylinder. First and second scales are provided on the other half of the wall surface, each being translucent in part so that incident light directed into the interior of the elongated cylinder will pass therethrough. The gloss of a surface may be measured by placing the closed end of the elongated cylinder on the surface and directing an incident light into the hollow interior via the first open end, and noting the reflection of the scales in the surface being measured. The glossier the surface, the more of the scales that will be reflected.
    • 具有中空内部的细长圆柱体设置有第一开口端和第二闭合端。 反射介质设置在封闭端的内部和圆筒的圆周壁表面的内表面的一半上。 第一和第二标尺设置在壁表面的另一半上,每个都部分地是半透明的,使得引导到细长圆筒内部的入射光将通过。 表面的光泽度可以通过将细长圆筒的封闭端放置在表面上并通过第一开口端将入射光引导到中空的内部并注意测量的表面中的氧化皮的反射来测量。 表面光泽度越大,反映的尺度就越多。
    • 9. 发明授权
    • Digital reflection densitometer system
    • 数字反射密度计系统
    • US4053235A
    • 1977-10-11
    • US355024
    • 1973-04-27
    • Perry Dwaine HamptonJames R. Cox
    • Perry Dwaine HamptonJames R. Cox
    • G01N21/47G01J3/50G01N21/48
    • G01N21/474
    • A digital reflection densitometer system comprises a power supply unit and a digital reflection densitometer instrument which is connected to the power supply unit by means of an electrical cable. The instrument is manually positionable over a surface and includes a housing which is supported on a foot. The foot is adapted for engagement with the surface and includes target apparatus for designating a predetermined area of the surface. The housing is normally pivotally separated from the foot by a spring and is manually pivotable to an operating position adjacent the foot.A plurality of lamps are mounted in the housing for illuminating the predetermined area of the surface when the housing is in the operating position. Light reflected from the predetermined area is directed through an optical system to a light sensitive apparatus comprising a planar silicon sensor. The output of the planar silicon sensor is directed through an operational amplifier and a logarithmic amplifier to a digital volt meter which actuates a digital display device mounted in the housing of the instrument to provide a visual digital readout indicative of the output of the planar silicon sensor. The instrument further includes apparatus for selectively positioning any one of a plurality of filters in the path of light passing through the optical system to the planar silicon sensor, and for simultaneously adjusting the gain of the operational amplifier and the sensitivity of the digital volt meter to compensate for differences between the filters.
    • 10. 发明授权
    • Printing plate water sensing means and method
    • 印版水感测手段及方法
    • US4052937A
    • 1977-10-11
    • US597989
    • 1975-07-22
    • Leslie Edward LawsonJohn Sleeman RogersPeter Edward Watts
    • Leslie Edward LawsonJohn Sleeman RogersPeter Edward Watts
    • B41F7/24B41F33/00B41M1/06B41L25/02G01N21/48
    • B41F33/0054B41F7/24B41M1/06
    • The amount of water present on a lithographic printing plate during printing is determined by measuring the amount of water present on a surface which is other than that of the printing plate but which carries an amount of water related to the amount of water present on the printing plate. The surface upon which the measurement is made may be the surface of a control pad mounted on the printing roller in the gap between opposite ends of the printing plate, the surface of one of the rollers of the damp train applying water to the printing plate, or the surface of an auxiliary roller contacting one of the rollers of the damp train applying water to the printing plate. The amount of water subsequently applied to the printing plate may be regulated in dependence upon the amount of water determined as being already present on the printing plate.
    • 在印刷过程中平版印刷版上存在的水的量通过测量与印刷版不同的表面上存在的水的量来确定,但是与印刷中存在的水的量相关的水的量 盘子。 在其上进行测量的表面可以是安装在印刷辊上的控制垫的表面,该印刷辊在印版的相对端之间的间隙中,湿纸巾的一个辊的表面向印刷板施加水, 或者将辅助辊的表面接触到将印刷板施加水的湿织物的辊之一。 随后施加到印版的水的量可以根据确定为已经存在于印版上的水的量来调节。