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    • 41. 发明授权
    • Integrated circuit having an on-board reference generator
    • 具有板载参考发生器的集成电路
    • US06288954B1
    • 2001-09-11
    • US09233774
    • 1999-01-19
    • Troy Manning
    • Troy Manning
    • G11C2900
    • G11C29/12
    • An integrated circuit includes a differential amplifier having a first terminal that is operable to receive an input signal and having a second terminal. The integrated circuit also includes a reference circuit that generates a reference signal on the second terminal of the amplifier. During testing of the integrated circuit, the reference circuit can be activated to generate the reference signal such that a tester need not supply it as a test signal. During normal operation, however, either the reference circuit can generate the reference signal or the reference signal can be supplied by an external source.
    • 集成电路包括具有可操作以接收输入信号并具有第二端子的第一端子的差分放大器。 集成电路还包括在放大器的第二端子上产生参考信号的参考电路。 在集成电路测试期间,可以激活参考电路以产生参考信号,使得测试仪不需要将其作为测试信号提供。 然而,在正常操作期间,参考电路可以产生参考信号,或者参考信号可以由外部源提供。
    • 44. 发明授权
    • Integrated circuit memory with back end mode disable
    • 集成电路存储器,后端模式禁用
    • US5793692A
    • 1998-08-11
    • US826276
    • 1997-03-27
    • Todd MerrittTroy Manning
    • Todd MerrittTroy Manning
    • G11C11/401G11C7/10G11C7/00
    • G11C7/1045
    • A memory circuit is described which can operate in one of a number of operating modes. The operating mode of the memory circuit can be changed in a non-volatile manner after the memory circuit is packaged to reduce production scrap or meet market demands. Disable circuitry is described which includes an anti-fuse that can be externally selectively blown to disable an operating mode. Control circuitry included in the memory circuit enables a new operating mode after the first operating mode is disable. A method of selectively disabling an operating mode is described. A hierarchical scheme is also described for enabling a new operating mode from a group of operating modes, for example page-mode, extended data output (EDO), or burst EDO.
    • 描述了可以以多种操作模式之一操作的存储器电路。 在存储器电路被封装以减少生产废料或满足市场需求之后,可以以非易失性的方式改变存储器电路的工作模式。 描述禁止电路,其包括可以从外部选择性地吹制以禁用操作模式的反熔丝。 包含在存储器电路中的控制电路在第一操作模式被禁用之后启用新的操作模式。 描述了选择性地禁用操作模式的方法。 还描述了分层方案,用于从一组操作模式启用新的操作模式,例如页面模式,扩展数据输出(EDO)或突发EDO。
    • 49. 发明申请
    • APPARATUS AND METHOD FOR REPAIRING A SEMICONDUCTOR MEMORY
    • 用于修复半导体存储器的装置和方法
    • US20080037342A1
    • 2008-02-14
    • US11876477
    • 2007-10-22
    • Chris MartinTroy ManningBrent Keeth
    • Chris MartinTroy ManningBrent Keeth
    • G11C7/00G11C17/18
    • G11C17/165G11C29/4401G11C29/789G11C29/802G11C29/808G11C2029/4402
    • An apparatus and method for repairing a semiconductor memory device includes a first memory cell array, a first redundant cell array and a repair circuit configured to nonvolatilely store a first address designating at least one defective memory cell in the first memory cell array. A first volatile cache stores a first cached address corresponding to the first address designating the at least one defective memory cell. The repair circuit distributes the first address designating the at least one defective memory cell of the first memory cell array to the first volatile cache. Match circuitry substitutes at least one redundant memory cell from the first redundant cell array for the at least one defective memory cell in the first memory cell array when a first memory access corresponds to the first cached address.
    • 用于修复半导体存储器件的装置和方法包括:第一存储单元阵列,第一冗余单元阵列和修复电路,被配置为在第一存储单元阵列中非易失性地存储指定至少一个有缺陷的存储单元的第一地址。 第一易失性高速缓存存储对应于指定所述至少一个有缺陷的存储器单元的第一地址的第一高速缓存地址。 修复电路将指定第一存储单元阵列的至少一个缺陷存储单元的第一地址分配给第一易失性高速缓存。 当第一存储器访问对应于第一缓存地址时,匹配电路将来自第一冗余单元阵列的至少一个冗余存储单元替换为第一存储单元阵列中的至少一个有缺陷的存储单元。