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    • 42. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US4676630A
    • 1987-06-30
    • US854541
    • 1986-04-22
    • Koichi MatsushitaJunji IsohataHironori YamamotoMakoto MiyazakiKunitaka OzawaHideki Yoshinari
    • Koichi MatsushitaJunji IsohataHironori YamamotoMakoto MiyazakiKunitaka OzawaHideki Yoshinari
    • G03F7/20G03B27/42
    • G03F7/70691
    • An exposure apparatus for exposing a plate-like member to a pattern with radiation in a step-and-repeat manner thereby to transfer images of the pattern onto different regions on a surface of the plate-like member. The apparatus includes an X-Y stage for moving the plate-like member in X and Y directions, a .theta.-stage for moving the plate-like member in a .theta. (rotational) direction relative to the X-Y stage, and laser interferometers for measuring an amount of movement of the plate-like member, by the X-Y stage, in each of the X and Y directions by use of a mirror mounted on the .theta.-stage. Placement of the mirror on the .theta.-stage allows correction of yawing if it occurs during movement of the plate-like member by X-Y stage. Also, deviation of the plate-like member in the Y direction if it occurs during movement of the plate-like member by the X-Y stage in the X direction, is detected by the laser interferometers. This allows detection of a positional error of the mirror in the .theta. direction and allows correction of the .theta.-error by the .theta.-stage.
    • 一种用于以逐步重复的方式将板状构件暴露于具有辐射的图案的曝光装置,从而将图案的图像转印到板状构件的表面上的不同区域上。 该装置包括用于在X和Y方向上移动板状构件的XY平台,用于相对于XY平台以θ(旋转)方向移动板状构件的θ级和用于测量量的激光干涉仪 通过使用安装在θ级上的反射镜,通过XY台在X和Y方向中的每一个中移动板状构件。 如果在X-Y平台上移动板状构件时发生偏转,则可以在θ级放置镜子。 此外,通过激光干涉仪检测板状构件在X方向上通过X-Y台移动期间在Y方向上的偏移。 这允许在θ方向上检测反射镜的位置误差,并且允许通过θ级校正θ-误差。
    • 44. 发明授权
    • Information processing apparatus, information processing method, and memory medium
    • 信息处理装置,信息处理方法和存储介质
    • US09057966B2
    • 2015-06-16
    • US12356251
    • 2009-01-20
    • Daisuke ItaiYoshihiro KawauchiKunitaka Ozawa
    • Daisuke ItaiYoshihiro KawauchiKunitaka Ozawa
    • G06F17/18G03F7/20
    • G03F7/70525
    • An information processing apparatus for processing information generated by an exposure apparatus which exposes a substrate to radiant energy, comprises an information collecting unit configured to collect first apparatus information obtained by the exposure apparatus via an operation thereof with respect to each of a plurality of first regions which form a first array defined on the substrate, a converting unit configured to convert at least a part of the first apparatus information collected with respect to each of the plurality of first regions by the information collecting unit into second apparatus information with respect to each of a plurality of second regions which form a second array, a statistical processing unit configured to statistically process the second apparatus information, and an analyzing unit configured to analyze the statistical processing result obtained by the statistical processing unit.
    • 一种信息处理设备,用于处理由曝光基板产生的辐射能量的曝光装置产生的信息,包括信息收集单元,被配置为收集由曝光装置获得的第一装置信息,该信息通过其对多个第一区域 其形成在所述基板上限定的第一阵列,转换单元,被配置为将由所述信息收集单元将针对所述多个第一区域中的每一个收集的所述第一装置信息的至少一部分转换为关于每个所述第一装置信息的第二装置信息 形成第二阵列的多个第二区域,统计处理单元,被配置为统计处理第二装置信息;以及分析单元,被配置为分析由统计处理单元获得的统计处理结果。
    • 45. 发明授权
    • Information processing method and information processing apparatus for transmitting data generated by device manufacturing apparatus
    • 用于发送由装置制造装置生成的数据的信息处理方法和信息处理装置
    • US08516145B2
    • 2013-08-20
    • US12838210
    • 2010-07-16
    • Daisuke ItaiHiroaki FujiwaraMitsuhiro MasudaKunitaka Ozawa
    • Daisuke ItaiHiroaki FujiwaraMitsuhiro MasudaKunitaka Ozawa
    • G06F15/16
    • G03F7/70525G03F7/70508G03F7/70991
    • An apparatus which transmits data generated by a device manufacturing apparatus to at least one terminal, comprises a communication unit, a transmission request processor configured to accept or reject a transmission request which the communication unit has received from the terminal, and a transmission controller configured to control the communication unit to transmit, in response to a transmission request accepted by the transmission request processor, data corresponding to the transmission request to a terminal, of the at least one terminal, which has transmitted the transmission request, wherein the transmission request processor accepts a new transmission request if a sum of transmission rates of the respective data concurrently transmitted from the communication unit in response to transmission requests which the transmission request processor has already accepted and a transmission rate at which data is transmitted in response to the new transmission request does not exceed a preset allowable transmission rate.
    • 将由装置制造装置生成的数据发送到至少一个终端的装置包括通信单元,被配置为接收或拒绝通信单元从终端接收到的发送请求的发送请求处理器,以及配置为 控制所述通信单元响应于所述传输请求处理器接受的传输请求,将已经发送了所述传输请求的所述至少一个终端的发送请求的数据发送到终端,其中,所述传输请求处理器接受 如果根据传输请求处理器已经接受的传输请求以及响应于新的传输请求发送数据的传输速率而从通信单元同时发送的各个数据的传输速率的总和,则发送新的传输请求 不超过 复位允许传输速率。
    • 46. 发明申请
    • INFORMATION PROCESSING METHOD AND INFORMATION PROCESSING APPARATUS FOR TRANSMITTING DATA GENERATED BY DEVICE MANUFACTURING APPARATUS
    • 信息处理方法和信息处理装置,用于发送设备制造设备生成的数据
    • US20110029685A1
    • 2011-02-03
    • US12838210
    • 2010-07-16
    • Daisuke ItaiHiroaki FujiwaraMitsuhiro MasudaKunitaka Ozawa
    • Daisuke ItaiHiroaki FujiwaraMitsuhiro MasudaKunitaka Ozawa
    • G06F15/16
    • G03F7/70525G03F7/70508G03F7/70991
    • An apparatus which transmits data generated by a device manufacturing apparatus to at least one terminal, comprises a communication unit, a transmission request processor configured to accept or reject a transmission request which the communication unit has received from the terminal, and a transmission controller configured to control the communication unit to transmit, in response to a transmission request accepted by the transmission request processor, data corresponding to the transmission request to a terminal, of the at least one terminal, which has transmitted the transmission request, wherein the transmission request processor accepts a new transmission request if a sum of transmission rates of the respective data concurrently transmitted from the communication unit in response to transmission requests which the transmission request processor has already accepted and a transmission rate at which data is transmitted in response to the new transmission request does not exceed a preset allowable transmission rate.
    • 将由装置制造装置生成的数据发送到至少一个终端的装置包括通信单元,被配置为接收或拒绝通信单元从终端接收到的发送请求的发送请求处理器,以及配置为 控制所述通信单元响应于所述传输请求处理器接受的传输请求,将已经发送了所述传输请求的所述至少一个终端的发送请求的数据发送到终端,其中,所述传输请求处理器接受 如果根据传输请求处理器已经接受的传输请求以及响应于新的传输请求发送数据的传输速率而从通信单元同时发送的各个数据的传输速率的总和,则新的传输请求 不超过 复位允许传输速率。
    • 48. 发明授权
    • Exposure apparatus and method of manufacturing a device using the same
    • 曝光装置及其制造方法
    • US5898477A
    • 1999-04-27
    • US782297
    • 1997-01-15
    • Keiji YoshimuraKunitaka OzawaHiroshi KurosawaNoriyasu Hasegawa
    • Keiji YoshimuraKunitaka OzawaHiroshi KurosawaNoriyasu Hasegawa
    • G03F7/20H01L21/027G03B27/42G03B27/32
    • G03F7/70358G03F7/70058G03F7/70558
    • An exposure apparatus includes a mask scanning device for scanning a mask on which a pattern is formed, a projection optical system for projecting the pattern on the mask onto a wafer, a wafer scanning device for scanning the wafer, onto which the pattern is projected by the projection optical system, an illuminating device for illuminating the mask in an illumination area narrower than the pattern by synchronously scanning the mask and the wafer relative to each other, using the mask scanning device and the wafer scanning device, so as to expose and transfer the pattern on the wafer, a detection device for detecting information regarding exposure before exposing and transferring the pattern onto the wafer by the illuminating device and for producing detection results, and a display for displaying exposure information obtained from the detection results. Also disclosed are methods of manufacturing semiconductor devices, for example, using such an exposure apparatus.
    • 曝光装置包括用于扫描其上形成有图案的掩模的掩模扫描装置,用于将掩模上的图案投影到晶片上的投影光学系统,用于扫描晶片的晶片扫描装置,其上突出有图案的晶片扫描装置 投影光学系统,使用掩模扫描装置和晶片扫描装置通过使掩模和晶片相对于彼此同步扫描而在比图案窄的照明区域中照亮掩模的照明装置,以便曝光和转印 晶片上的图案,用于检测关于在通过照明装置曝光并将图案转印到晶片上并且用于产生检测结果之前的曝光的信息的检测装置,以及用于显示从检测结果获得的曝光信息的显示器。 还公开了制造半导体器件的方法,例如使用这种曝光装置。
    • 50. 发明授权
    • Exposure method
    • 曝光方法
    • US5610965A
    • 1997-03-11
    • US197569
    • 1994-02-17
    • Makiko MoriKunitaka OzawaKoji UdaIsamu ShimodaShunichi UzawaEiji Sakamoto
    • Makiko MoriKunitaka OzawaKoji UdaIsamu ShimodaShunichi UzawaEiji Sakamoto
    • G03F1/76G03F7/20H01L21/027G21K5/00
    • G03F7/70866G03F7/70875
    • A method of exposing a wafer to exposure energy such as ultraviolet rays or X-rays through a mask to transfer a pattern of the mask onto the wafer, for example. The temperature of the mask and/or the wafer increases during the exposure operation by absorption of the exposure energy. While the wafer is being exposed, the temperature of the mask and/or the wafer is detected. If the temperature is going to exceed an exposable temperature range determined on the basis of the line width of the pattern to be transferred, the exposure operation is interrupted. Then, the heat accumulated in the mask and/or the wafer is removed. Thereafter, the exposure operation is resumed. This is repeated until the predetermined or required amount of exposure is reached, for one shot. By this, thermal expansion of the mask and the wafer during the exposure operation is prevented to assure the precision of the pattern transfer.
    • 例如,通过掩模将晶片暴露于诸如紫外线或X射线的曝光能量以将掩模的图案转印到晶片上的方法。 掩模和/或晶片的温度在曝光操作期间通过吸收曝光能量而增加。 当晶片被暴露时,检测掩模和/或晶片的温度。 如果温度超过基于要传送的图案的线宽确定的可曝光温度范围,则曝光操作被中断。 然后,除去积存在掩模和/或晶片中的热量。 此后,恢复曝光操作。 一直重复直到达到预定或所需的曝光量。 由此,防止曝光操作期间的掩模和晶片的热膨胀,从而确保图案转印的精度。