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    • 45. 发明申请
    • Polishing apparatus
    • 抛光设备
    • US20050159090A1
    • 2005-07-21
    • US11033884
    • 2005-01-13
    • Makoto Nakajima
    • Makoto Nakajima
    • B24B37/08B24B47/12H01L21/304B24B7/00
    • B24B37/08B24B37/105B24B47/12
    • The small polishing apparatus is capable of simultaneously polishing both side faces of a work piece, and a lower polishing plate, an internal gear and a sun gear are respectively driven by direct drive (DD) motors. The polishing apparatus comprises: an upper and a lower polishing plates; a sun gear and an internal gear; and a carrier provided between the polishing plates and engaged with the gears. Both side faces of the work piece held by the carrier are simultaneously polished by the polishing plates. DDmotors respectively rotate the lower polishing plate and the gears. Each DD motor has a ring-shaped output member. A first DD motor has the output member directly connected to a rotary holding member rotatably holding the lower polishing plate. A second DD motor is provided under the first DD motor. One end of a rotary shaft, which is pierced through the first DD motor, is connected to a rotary holding member rotatably holding one of the gears, and the other end is directly connected to the output member of the second DD motor.
    • 小型抛光装置能够同时抛光工件的两个侧面,并且下部抛光板,内部齿轮和太阳齿轮分别由直接驱动(DD)电动机驱动。 抛光装置包括:上和下抛光板; 太阳齿轮和内齿轮; 以及设置在所述研磨板之间并与所述齿轮接合的载体。 由载体保持的工件的两个侧面由抛光板同时抛光。 DDmotors分别旋转下抛光板和齿轮。 每个DD电机具有环形输出部件。 第一DD马达具有直接连接到可旋转地保持下抛光板的旋转保持构件的输出构件。 第一DD电机设置在第一DD电机下面。 旋转轴的穿过第一DD电动机的一端连接到可旋转地保持其中一个齿轮的旋转保持构件,另一端直接连接到第二DD电动机的输出构件。
    • 48. 发明授权
    • Resist underlayer film forming composition containing silicon having sulfide bond
    • 含有硫化物键的硅的抗蚀剂下层膜形成组合物
    • US09217921B2
    • 2015-12-22
    • US13375517
    • 2010-05-28
    • Yuta KannoMakoto NakajimaWataru Shibayama
    • Yuta KannoMakoto NakajimaWataru Shibayama
    • H01L21/312G03F7/11G03F7/075G03F7/09
    • G03F7/11G03F7/0752G03F7/091Y10T428/31663
    • There is provided a resist underlayer film forming composition for lithography for forming a resist underlayer film capable of being used as a hard mask; and a forming method of a resist pattern using the underlayer film forming composition for lithography. A resist underlayer film forming composition for lithography comprising: as a silicon atom-containing compound, a hydrolyzable organosilane containing a sulfur atom-containing group, a hydrolysis product thereof, or a hydrolysis-condensation product thereof, wherein in the whole silicon atom-containing compound, the ratio of a sulfur atom to a silicon atom is less than 5% by mole. The hydrolyzable organosilane is preferably a compound of Formula (1): [R1aSi(R2)3-a]bR3 wherein R3 has a partial structure of Formula (2): R4—S—R5.
    • 提供了用于形成能够用作硬掩模的抗蚀剂下层膜的光刻用抗蚀剂下层膜形成组合物; 以及使用用于光刻的下层膜形成组合物的抗蚀剂图案的形成方法。 一种用于光刻的抗蚀剂下层膜形成组合物,包括:含硅原子的化合物,含有含硫原子的基团的可水解的有机硅烷,其水解产物或其水解缩合产物,其中在整个含硅原子的 化合物,硫原子与硅原子的比例小于5摩尔%。 可水解的有机硅烷优选为式(1)的化合物:[R a Si(R 2)3-a] b R 3,其中R 3具有式(2)的部分结构:R4-S-R5。