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    • 42. 发明授权
    • Semiconductor neural network and operating method thereof
    • 半导体神经网络及其操作方法
    • US5202956A
    • 1993-04-13
    • US605717
    • 1990-10-30
    • Koichiro Mashiko
    • Koichiro Mashiko
    • G06G7/60G06F15/18G06N3/04G06N3/063G06N99/00
    • G06N3/063
    • A semiconductor neural network includes a coupling matrix having coupling elements arranged in a matrix which couple with specific coupling strengths internal data input lines to internal data output lines. The internal data output lines are divided into groups. The neural network further comprises weighting addition circuits provided corresponding to the groups of the internal data output lines. A weighting addition circuit includes weighing elements for adding weights to signals on the internal data output lines in the corresponding group and outputting the weighted signals, and an addition circuit for outputting a total sum of the outputs of those weighting elements. The internal data output lines are arranged to form pairs and the addition circuit has a first input terminal for receiving one weighting element output of each of the pairs in common, a second input terminal for receiving the other weighting element output of each of the pairs in common, and sense amplifier for differentially amplifying signals at the first and second input terminals. The neural network further includes a circuit for detecting a change time of an input signals, a circuit responsive to an input signal change for equalizing the first and second input terminals for a predetermined period, and a circuit for activating the sense amplifier after the equalization is completed. The information retention capability of each coupling element is set according to the weight of an associated weighting element. This neural network can provide multi-valued expression of coupling strength with fewer coupling elements.
    • 半导体神经网络包括耦合矩阵,其具有以矩阵布置的耦合元件,其耦合特定的耦合强度将内部数据输入线耦合到内部数据输出线。 内部数据输出线分为几组。 神经网络还包括对应于内部数据输出线的组提供的加权加法电路。 加权加法电路包括称重元件,用于对相应组中的内部数据输出线上的信号加权,并输出加权信号,以及加法电路,用于输出这些加权元件的输出的总和。 内部数据输出线被布置成形成对,并且加法电路具有用于共同地接收每对的一个加权元件输出的第一输入端子,用于接收每对中的每对的其他加权元件输出的第二输入端子 公共和读出放大器,用于在第一和第二输入端子处差分放大信号。 所述神经网络还包括用于检测输入信号的变化时间的电路,响应于输入信号变化以对第一和第二输入端子进行预定时间段的均衡的电路和用于在均衡之后激活读出放大器的电路 完成 每个耦合元件的信息保持能力根据相关加权元件的权重来设置。 该神经网络可以提供耦合强度的多值表达式,较少的耦合元件。
    • 44. 发明授权
    • Dynamic type semiconductor memory device having an error checking and
correcting circuit
    • 具有错误检查和校正电路的动态型半导体存储器件
    • US5012472A
    • 1991-04-30
    • US288218
    • 1988-12-22
    • Kazutami ArimotoKiyohiro FurutaniKoichiro Mashiko
    • Kazutami ArimotoKiyohiro FurutaniKoichiro Mashiko
    • G11C11/413G06F11/10G11C11/401G11C29/00G11C29/42H01L21/66H01L27/10
    • G06F11/1008G06F11/1076
    • In a memory cell comprising a data cell array and a parity cell array, an error checking.multidot.correcting circuit is connected to each of the arrays through a selector. The selector is constituted by transistors connected to each of the bit lines in the memory cell. The number of circuit elements constituting the error checking.multidot.correcting circuit corresponds to one-half of the number of the bit line pairs included in the data cell array and the parity cell array. In an error correcting mode, half of the data appeared on the bit line pairs in data cell array and the parity cell array are transferred to the error checking.multidot.correcting circuit by the selector, so that the errors are corrected. Thereafter, the data of the remaining half of the bit line pairs are processed in the same manner. Therefore, the number of circuit elements of the error checking.multidot.correcting circuit can be reduced compared with the prior art, improving the degree of integration of the device.
    • 在包括数据单元阵列和奇偶校验单元阵列的存储单元中,错误校正校正电路通过选择器连接到每个阵列。 选择器由连接到存储单元中每个位线的晶体管构成。 构成误差校正电路的电路元件的数量对应于包括在数据单元阵列和奇偶校验单元阵列中的位线对的数目的一半。 在纠错模式中,一半的数据出现在数据单元阵列中的位线对上,并且奇偶校验单元阵列被选择器传送到错误校正电路,从而纠正错误。 此后,以相同的方式处理剩余的一半的位线对的数据。 因此,与现有技术相比,可以减少误差校正电路的电路元件的数量,从而提高器件的集成度。
    • 47. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US4817056A
    • 1989-03-28
    • US077622
    • 1987-07-24
    • Kiyohiro FurutaniKoichiro MashikoKazutami ArimotoNoriaki MatsumotoYoshio Matsuda
    • Kiyohiro FurutaniKoichiro MashikoKazutami ArimotoNoriaki MatsumotoYoshio Matsuda
    • G11C11/401G11C11/408G11C29/00G11C29/04G11C7/00
    • G11C29/84
    • In a semiconductor memory device of a redundancy configuration having lines (rows or columns) of main memory cells and a line of spare memory cells made to substitute a defective line responsive to the address of the defective line, a comparator compares an address input to the memory device, with the address of the defective line which has been programmed in it, and a spare line selector selects the spare line when the input address is found to coincide with the programmed address. The comparator comprises a dynamic NOR gate having discharge paths each formed of a gate element receiving a bit or its inversion of the input address to be opened or closed depending on the value of the particular bit of the input address currently applied, and a PROM element in series with the gate element. The dynamic NOR gate has a first node forming an output thereof and a second node, each of the series connections of the PROM element and the gate element is connected across the first and the second nodes. The potential on the second node is caused to be identical with the potential on the first node during the precharge period.
    • 在具有主存储单元的行(行或列)和响应于缺陷行的地址而替代缺陷行的备用存储单元的行的冗余配置的半导体存储器件中,比较器将输入到 存储器件,其中已经编程的缺陷线的地址,并且当发现输入地址与编程地址一致时,备用线选择器选择备用线。 该比较器包括一个动态或非门,每个放电路径均由栅极元件形成,栅极元件根据当前施加的输入地址的特定位的值接收要打开或关闭的输入地址的位或其反相,以及PROM元件 与门元件串联。 动态NOR门具有形成其输出的第一节点和第二节点,PROM元件和门元件的每个串联连接跨越第一节点和第二节点连接。 在预充电期间,使第二节点上的电位与第一节点上的电位相同。