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    • 41. 发明授权
    • Data transfer system
    • 数据传输系统
    • US5706248A
    • 1998-01-06
    • US751023
    • 1996-11-15
    • Haruki Toda
    • Haruki Toda
    • G11C7/10G11C8/04
    • G11C7/1006G11C7/103
    • A data transfer system, comprising: a plurality of data input/output gates arranged by k-unit group by k-unit group in a predetermined sequence; gate selecter circuit each arranged for k-unit group of the gates, for selecting the gates in unit of k-unit group; a plurality of data transfer paths for transferring data via the gates selected by the gate selecting means; a first register group composed of a-units of data registers for transferring data simultaneously to and from the data transfer paths, the a-unit data registers being serial-accessed in a constant sequence; and a scrambler circuit for designating any required data input/output gates and for further selectively connecting the data transfer paths connected to said designated data input/output gates with the data registers so that the data transfer paths connected to the designated input/output gates can be connected to the serial-accessible registers in a predetermined sequence, when the number of the data transfer paths is (L.times.k) under the following conditions: if a (mod k).ident.0, 1, L=�a/k!+1 if other than the above, L=�a/k!+2 where L denotes a maximum number of the gate selecting means selectable simultaneously.
    • 一种数据传输系统,包括:以预定顺序由k-单元组以k-单元组排列的多个数据输入/输出门; 每个栅极选择器电路均设置用于k单元组的栅极,用于以k单元组为单位选择栅极; 用于经由门选择装置选择的门传送数据的多个数据传送路径; 由数据寄存器组成的第一寄存器组,用于同时传送数据传输路径和从数据传输路径传输数据,该单位数据寄存器以恒定顺序串行访问; 以及加扰电路,用于指定任何所需的数据输入/输出门,并且用于进一步选择性地将连接到所述指定的数据输入/输出门的数据传送路径与数据寄存器连接,使得连接到指定的输入/输出门的数据传送路径 在以下条件下,当数据传输路径的数量为(Lxk)时,以预定的顺序连接到可串行访问的寄存器:如果(mod k)= 0,1,L = [a / k] + 1if 除了上述之外,L = [a / k] + 2其中L表示同时选择的选通选择装置的最大数目。
    • 44. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5508970A
    • 1996-04-16
    • US345682
    • 1994-11-21
    • Haruki Toda
    • Haruki Toda
    • G11C11/407G11C7/10G11C11/401G11C11/409G11C8/04
    • G11C7/1051G11C7/1006G11C7/103
    • A semiconductor memory device having a memory cell array (MCA) composed of a plurality of memory cells arranged in a matrix pattern including a plurality of columns, a data register section provided with two first and second registers each having "a"-units of one-bit data register; a control section for selecting two sets of "a"-units of the column from a plurality of the columns for each "a"-cycles in accordance with inputted and read addresses, and for storing the "a"-units of data of the selected 2 "a"-units of column in either one of the first and second registers alternately on the basis of a sequence of the read addresses; and a data output section for scanning and outputting data of the 2 "a"-units of the one-bit data register in sequence. Data of column bits more than the number of the registers can be accessed continuously in spite of the minimum register configuration. Further, the head column address can be selected freely.
    • 一种具有存储单元阵列(MCA)的半导体存储器件,具有以包括多列的矩阵模式布置的多个存储单元组成的数据寄存器单元,具有两个第一和第二寄存器,每个寄存器具有“a” - 一个单位 位数据寄存器; 控制部分,用于根据输入和读取的地址从每个“a”的多个列中选择列的两组“a”组,并且用于存储“a” 根据读取地址的顺序交替地选择第一和第二寄存器中的任一个寄存器中的列“2”一个“一列” 以及数据输出部分,用于依次扫描和输出一位数据寄存器的2“a”个数据的数据。 尽管最小的寄存器配置,列位数大于寄存器数量的数据可以连续访问。 此外,可以自由选择头列地址。
    • 45. 发明授权
    • Clock-synchronous semiconductor memory device and method for accessing
the device
    • 时钟同步半导体存储器件和用于访问器件的方法
    • US5323358A
    • 1994-06-21
    • US024354
    • 1993-03-01
    • Haruki TodaYuji WatanabeHitoshi KuyamaShozo Saito
    • Haruki TodaYuji WatanabeHitoshi KuyamaShozo Saito
    • G11C11/407G11C7/22G11C8/18G11C11/401G11C11/41H01L27/10G11C7/00G11C8/00
    • G11C8/18G11C7/22
    • A method for accessing a clock-synchronous semiconductor memory device including memory cells arranged in matrix. The cells are divided into at least two blocks, access to the cells in these blocks is designated from address data provided from an external device, and access to the memory cell is executed synchronously with an externally-supplied clock signal, which comprises setting the other blocks in an access preparation state or in an access operation standby state while one block is in an access operating state, setting a certain block in the access operating state via the access preparation state when the certain block is designated for the access operation by the address data and if the certain block is in the access operating state, and setting a certain block in the access operating state immediately when the certain block is designated for the access operation by the address data and if the certain block is in the access preparation state or in the access operation standby state. In the device, the designation of the cell in the block to be accessed is set using address data designating a block externally-provided from outside of the device.
    • 一种用于访问包括以矩阵布置的存储单元的时钟同步半导体存储器件的方法。 单元被划分为至少两个块,从外部设备提供的地址数据指定对这些块中的单元的访问,并且与外部提供的时钟信号同步地执行对存储单元的访问,其中包括设置另一个 在一个块处于访问操作状态时处于访问准备状态或访问操作待机状态的块,当通过地址指定特定块进行访问操作时,经由访问准备状态将某个块设置在访问操作状态 数据,并且如果某个块处于访问操作状态,并且当特定块被地址数据指定用于访问操作时,并且特定块处于访问准备状态时,立即将某个块设置在访问操作状态,或者 在访问操作待机状态。 在设备中,使用指定从设备外部提供的块的地址数据来设置要访问的块中的小区的指定。
    • 47. 发明授权
    • Semiconductor memory device with column redundancy
    • 具有列冗余的半导体存储器件
    • US5168468A
    • 1992-12-01
    • US789036
    • 1991-11-07
    • Koichi MagomeHiroshi SaharaHaruki Toda
    • Koichi MagomeHiroshi SaharaHaruki Toda
    • G11C11/401G11C11/407G11C11/418G11C29/00G11C29/04
    • G11C29/818
    • A semiconductor memory device comprises a memory cell array, a redundant memory cell array, bit line pairs, spare bit line pairs, a column address information storage circuit having stored therein information of a column address of a faulty cell and a column address of a spare cell, column decoders, a first column selecting gate for connecting one of the bit line pairs and first data output line pairs, a second column selecting gate for connecting one of the bit line pairs and a second data output line pair, a spare column decoder for selecting a third or a fourth column selecting line, a third column selecting gate for connecting the spare bit line pairs and the first data output line pairs, a fourth column selecting gate for connecting the spare bit line pairs and the second data output line pair, a first buffer for selecting two data and amplifying and outputting, a second buffer for amplifying and outputting data from the second data output line pair, and a register for storing therein data from the first and/or second buffers.
    • 半导体存储器件包括存储单元阵列,冗余存储单元阵列,位线对,备用位线对,列存储有故障单元的列地址的信息和备用列列地址的列地址信息存储电路 单元,列解码器,用于连接位线对和第一数据输出线对中的一个的第一列选择栅极,用于连接位线对之一和第二数据输出线对的第二列选择栅极,备用列解码器 用于选择第三或第四列选择线,用于连接备用位线对和第一数据输出线对的第三列选择栅极,用于连接备用位线对和第二数据输出线对的第四列选择栅极 用于选择两个数据并放大和输出的第一缓冲器,用于放大和输出来自第二数据输出线对的数据的第二缓冲器,以及用于存储 控制来自第一和/或第二缓冲器的数据。
    • 48. 发明授权
    • Semiconductor memory system
    • 半导体存储系统
    • US5107464A
    • 1992-04-21
    • US480902
    • 1990-02-16
    • Hiroshi SaharaHaruki TodaShigeo Ohshima
    • Hiroshi SaharaHaruki TodaShigeo Ohshima
    • G11C11/401G11C29/00G11C29/04
    • G11C29/846
    • In a semiconductor memory system of the serial column access type, a redundant column is used for replacing a defective column. Redundant data lines are connected to the redundant column through a redundant column selection gate. A defective address detection circuit detects the address of a defective column to enable the redundant column selection gate. An address counter is provided for a defective address detection circuit. A redundant column selection circuit selects the redundant column in response to a detection signal from the defective address detection circuit. A data line switching circuit switches, in redundant column select mode, the data lines connecting to a data input/output drive circuit from said regular data lines to the redundant data lines. With this circuit arrangement, in a redundant column select mode, the regular data lines are separated from the data input/output drive circuit. Therefore, even if a shift register constituting a regular column selection circuit operates and the defective column selection gate is enabled to set up a connection of the defective column to the regular data lines, the error data from the defective column is never output. Further, the shift register is operable irrespective of the defective column detection.