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    • 47. 发明申请
    • DETERMINING AND ANALYZING INTEGRATED CIRCUIT YIELD AND QUALITY
    • 确定和分析集成电路的质量和质量
    • US20090210183A1
    • 2009-08-20
    • US12415806
    • 2009-03-31
    • Janusz RajskiGang ChenMartin KeimNagesh TamarapalliManish SharmaHuaxing Tang
    • Janusz RajskiGang ChenMartin KeimNagesh TamarapalliManish SharmaHuaxing Tang
    • G06F19/00
    • G06F11/2273G01R31/01G01R31/2846G01R31/2853G01R31/2894G01R31/31704G01R31/31835
    • Methods, apparatus, and systems for computing, analyzing, and improving integrated circuit yield and quality are disclosed herein. For example, in one exemplary method disclosed herein, information is received from processing test responses of integrated circuits designed for functional use in electronic devices. In this embodiment, the information is indicative of integrated circuit failures observed during testing of the integrated circuits and of possible yield limiting factors causing the integrated circuit failures. Probabilities that one or more of the possible yield limiting factors in the integrated circuits actually caused the integrated circuit failures are determined by statistically analyzing the received information. The probabilities that one or more possible yield limiting factors actually caused the integrated circuit failures are reported. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the described methods are also disclosed.
    • 本文公开了用于计算,分析和改进集成电路产量和质量的方法,装置和系统。 例如,在本文公开的一个示例性方法中,从设计用于电子设备中的功能使用的集成电路的处理测试响应中接收信息。 在该实施例中,该信息表示在集成电路测试期间观察到的集成电路故障以及导致集成电路故障的可能的产量限制因素。 通过统计分析接收的信息来确定集成电路中的一个或多个可能的屈服限制因素实际上引起集成电路故障的概率。 报告了一个或多个可能的屈服限制因素实际上导致集成电路故障的概率。 还公开了包括用于使计算机执行任何所述方法的计算机可执行指令的有形计算机可读介质。