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    • 45. 发明授权
    • Pupil reaction ascertaining device and fatigue recovery promoting device
    • 瞳孔反应确定装置和疲劳恢复促进装置
    • US07503654B2
    • 2009-03-17
    • US10593881
    • 2005-03-16
    • Akio Nakagawa
    • Akio Nakagawa
    • A61B3/10
    • A61B3/032A61B3/0008A61B3/112
    • It is an object of the present invention to provide a pupillary reflex checking apparatus that enables a subject to check his own pupillary reflex and that keeps down cost and to provide a fatigue recovery facilitating apparatus that includes the pupillary reflex checking apparatus. The pupillary reflex apparatus of the present invention includes, as essential elements of its structure, a reflecting unit and a stimulus applying unit. Of these, the reflecting unit has a structure which includes an optical reflecting surface disposed in a plane that intersects with a visual axis of a subject such that an image of a pupil of a subject's eye is formed on the optical reflecting surface. Further, the stimulus applying unit applies a stimulus to induce the pupillary reflex in the subject. Specifically, it is possible to use a light source which gives a light stimulus to the subject's eye, such as an LED light source, an electric bulb, a strobe, or the like, as the stimulus applying unit.
    • 本发明的目的是提供一种瞳孔反射检查装置,其能够使对象检查自己的瞳孔反射并降低成本,并提供包括瞳孔反射检查装置的疲劳恢复促进装置。 本发明的瞳孔反射装置包括作为其结构的基本要素的反射单元和刺激施加单元。 其中,反射单元具有包括设置在与被摄体的视轴相交的平面中的光反射面的结构,使得在光反射面上形成被检眼的瞳孔图像。 此外,刺激施加单元施加刺激以诱导受试者中的瞳孔反射。 具体地说,作为刺激施加单元,可以使用给予对象眼睛的光刺激的光源,例如LED光源,电灯泡,闪光灯等。
    • 46. 发明申请
    • Pupil Reaction Ascertaining Device and Fatigue Recovery Promoting Device
    • 瞳孔反应确定装置和疲劳恢复促进装置
    • US20070242223A1
    • 2007-10-18
    • US10593881
    • 2005-03-16
    • Akio Nakagawa
    • Akio Nakagawa
    • A61B5/16
    • A61B3/032A61B3/0008A61B3/112
    • It is an object of the present invention to provide a pupillary reflex checking apparatus that enables a subject to check his own pupillary reflex and that keeps down cost and to provide a fatigue recovery facilitating apparatus that includes the pupillary reflex checking apparatus. The pupillary reflex apparatus of the present invention includes, as essential elements of its structure, a reflecting unit and a stimulus applying unit. Of these, the reflecting unit has a structure which includes an optical reflecting surface disposed in a plane that intersects with a visual axis of a subject such that an image of a pupil of a subject's eye is formed on the optical reflecting surface. Further, the stimulus applying unit applies a stimulus to induce the pupillary reflex in the subject. Specifically, it is possible to use a light source which gives a light stimulus to the subject's eye, such as an LED light source, an electric bulb, a strobe, or the like, as the stimulus applying unit.
    • 本发明的目的是提供一种瞳孔反射检查装置,其能够使对象检查自己的瞳孔反射并降低成本,并提供包括瞳孔反射检查装置的疲劳恢复促进装置。 本发明的瞳孔反射装置包括作为其结构的基本要素的反射单元和刺激施加单元。 其中,反射单元具有包括设置在与被摄体的视轴相交的平面中的光反射面的结构,使得在光反射面上形成被检眼的瞳孔图像。 此外,刺激施加单元施加刺激以诱导受试者中的瞳孔反射。 具体地说,作为刺激施加单元,可以使用给予对象眼睛的光刺激的光源,例如LED光源,电灯泡,闪光灯等。
    • 47. 发明授权
    • Semiconductor device having a vertical MOS trench gate structure
    • 具有垂直MOS沟槽栅极结构的半导体器件
    • US07227225B2
    • 2007-06-05
    • US10829173
    • 2004-04-22
    • Syotaro OnoYusuke KawaguchiAkio Nakagawa
    • Syotaro OnoYusuke KawaguchiAkio Nakagawa
    • H01L29/76
    • H01L29/7813H01L29/0847H01L29/0878H01L29/1095H01L29/407H01L29/41741H01L29/4236H01L29/42368H01L29/4238H01L29/4933
    • A second semiconductor region is formed on a first semiconductor region. A third semiconductor region is formed on a part of the second semiconductor region. A trench ranges from a surface of the third semiconductor region to the third semiconductor region and the second semiconductor region. The trench penetrates the third semiconductor region, and the depth of the trench is shorter than that of a deepest bottom portion of the second semiconductor region, and the second semiconductor region does not exist under a bottom surface of the trench. A gate insulating film is formed on facing side surfaces of the trench. First and second gate electrodes are formed on the gate insulating film. The first and second gate electrodes are separated from each other. The conductive material is formed between the first and second gate electrodes on the side surfaces of the trench, with an insulating film intervened therebetween.
    • 在第一半导体区域上形成第二半导体区域。 在第二半导体区域的一部分上形成第三半导体区域。 沟槽的范围从第三半导体区域的表面到第三半导体区域和第二半导体区域。 沟槽穿透第三半导体区域,并且沟槽的深度比第二半导体区域的最深底部的深度短,并且第二半导体区域不存在于沟槽的底表面之下。 栅极绝缘膜形成在沟槽的相对的侧表面上。 在栅极绝缘膜上形成第一和第二栅电极。 第一和第二栅电极彼此分离。 导电材料形成在沟槽的侧表面上的第一和第二栅电极之间,绝缘膜介于其间。
    • 48. 发明申请
    • Electric power unit operating in continuous and discontinuous conduction modes and control method therefor
    • 电力单元在连续和不连续导通模式下工作及其控制方法
    • US20070013351A1
    • 2007-01-18
    • US11485466
    • 2006-07-13
    • Toshiyuki NakaAkio NakagawaKazutoshi Nakamura
    • Toshiyuki NakaAkio NakagawaKazutoshi Nakamura
    • G05F1/00
    • H02M3/157H02M3/1588Y02B70/1466
    • An electronic power unit includes first and second MOS transistors and a digital control circuit. The first MOS transistor applies a voltage to the load. The second MOS transistor remains on while the first MOS transistor remains off and rectifies the current flowing in the load. The digital control circuit turns on the first transistor upon lapse of a first time interval from the time the second MOS transistor is turned off. The digital control circuit turns on the second MOS transistor upon lapse of a second time interval from the time the first MOS transistor is turned off. The digital control circuit controls the on-period of the first MOS transistor so that the voltage applied to the load is constant in a discontinuous conduction mode. The digital control circuit determines, while the voltage applied to the load is constant, an optimal value of the first time from the duty.
    • 电子功率单元包括第一和第二MOS晶体管和数字控制电路。 第一个MOS晶体管向负载施加电压。 第二MOS晶体管保持导通,而第一MOS晶体管保持关断并且对负载中流动的电流进行整流。 数字控制电路在从第二MOS晶体管截止时起第一时间间隔开启第一晶体管。 数字控制电路在从第一MOS晶体管截止时经过第二时间间隔开启第二MOS晶体管。 数字控制电路控制第一MOS晶体管的导通周期,使得施加到负载的电压在不连续导通模式下是恒定的。 数字控制电路在施加到负载的电压是恒定的情况下确定第一次从占空比的最佳值。
    • 50. 再颁专利
    • Semiconductor device
    • 半导体器件
    • USRE38907E1
    • 2005-12-06
    • US10452203
    • 2003-06-02
    • Tomoko MatsudaiTsutomu KojimaAkio Nakagawa
    • Tomoko MatsudaiTsutomu KojimaAkio Nakagawa
    • H03K5/22H03K5/24H03K17/082H03K17/10H03K17/14
    • H03K17/102H03K5/2481H03K17/0828H03K17/145
    • The differential amplifier of a comparator circuit includes first and second n-type MOSFETs for receiving an input signal, first and second p-type MOSFETs of a current mirror circuit, and a third n-type MOSFET of a current source circuit. The output stage includes a third p-type MOSFET for transmitting a signal, and a fourth n-type MOSFET of the current source circuit. The differential amplifier further includes fifth and sixth n-type MOSFETs respectively series-connected to the first and second n-type MOSFETs. The output stage further includes a seventh n-type MOSFET series-connected to the fourth n-type MOSFET. The gates of the fifth, sixth, and seventh n-type MOSFETs are connected to voltage bias circuits. The fifth, sixth, and seventh n-type MOSFETs suppress variations in voltage at an output node caused by poor saturation characteristics of the first, second, and fourth main n-type MOSFETs.
    • 比较器电路的差分放大器包括用于接收输入信号的第一和第二n型MOSFET,电流镜电路的第一和第二p型MOSFET以及电流源电路的第三n型MOSFET。 输出级包括用于传输信号的第三p型MOSFET和电流源电路的第四n型MOSFET。 差分放大器还包括分别串联连接到第一和第二n型MOSFET的第五和第六n型MOSFET。 输出级还包括与第四n型MOSFET串联连接的第七n型MOSFET。 第五,第六和第七n型MOSFET的栅极连接到电压偏置电路。 第五,第六和第七n型MOSFET抑制由于第一,第二和第四主n型MOSFET的饱和特性不良引起的输出节点的电压变化。