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41. 发明授权

US07723981B2 Method for transferring test trays in a side-docking type test handler 有权
标题翻译：用于在侧对接式测试处理器中传送测试托盘的方法
公开(公告)号：US07723981B2
公开(公告)日：2010-05-25
申请号：US12389469
申请日：2009-02-20
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Tae Hung Ku , Dong Han Kim
IPC分类号： G01R31/26 , G01R31/28 , B07C5/00
CPC分类号： G01R31/2893 , Y10S414/135 , Y10S414/138
摘要： The present invention relates to a test tray for a test handler. According to this invention, there is disclosed a technique that an insert loaded in a loading part which is arranged in a matrix pattern in a frame of the test tray allows an amount and direction of free movement thereof to be determined in accordance with a location of the loading part, where the insert is loaded, on the matrix, thereby enabling a thermal expansion or contraction of a match plate or the test tray to be compensated.
摘要翻译：本发明涉及一种用于测试处理器的测试托盘。根据本发明，公开了一种技术，即装入装载部件中的镶嵌在测试托盘的框架中的矩阵图案的技术允许根据其位置来确定其自由运动的量和方向加载部件，其中插入物被加载在基体上，从而使匹配板或测试托盘的热膨胀或收缩得以补偿。

42. 发明申请

US20090199395A1 SIDE-DOCKING TYPE TEST HANDLER AND APPARATUS FOR TRANSFERRING TEST TRAY FOR SAME 有权
标题翻译：用于传送测试托盘的侧锁式测试操作器和设备
公开(公告)号：US20090199395A1
公开(公告)日：2009-08-13
申请号：US12415662
申请日：2009-03-31
申请人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Dong-Hyun Yo , Bong-Soo Kim , Choung-Min Joung
发明人： Jae Gyun Shim , Yun Sung Na , In Gu Jeon , Dong-Hyun Yo , Bong-Soo Kim , Choung-Min Joung
IPC分类号： B23P17/04 , B65G47/22 , H01L21/02 , B65G47/90 , H01L21/68 , H01L21/677
CPC分类号： G01R31/2893 , Y10T29/52
摘要： In a side-docking type test handler, a descending mechanism lowers a horizontally postured test tray, which has been transferred into a soak chamber, down to a descent finish position and a vertical posture changing mechanism changes the posture of the test tray, which has been lowered to the descent finish position, from the horizontal state to a vertical state, to transfer the test tray into a test chamber. Further, a horizontal posture changing mechanism changes the posture of the test tray in the test chamber from the vertical state to the horizontal state while transferring the test tray to an ascent start position in a desoak chamber.
摘要翻译：在侧对接式测试处理机中，下降机构降低已经被传送到浸泡室中的水平姿态的测试盘，直到下降完成位置，并且垂直姿势改变机构改变测试托盘的姿态，已经从水平状态下降到下降完成位置到垂直状态，以将测试托盘传送到测试室中。此外，水平姿势改变机构将测试盘中的测试托盘的姿势从垂直状态改变到水平状态，同时将测试托盘转移到脱泡室中的上升开始位置。

43. 发明授权

US07538542B2 Test handler and operation method thereof 有权
标题翻译：测试处理程序及其操作方法
公开(公告)号：US07538542B2
公开(公告)日：2009-05-26
申请号：US11639418
申请日：2006-12-15
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Dong-Han Kim
IPC分类号： G01R31/26
CPC分类号： G01R31/2867
摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.
摘要翻译：公开了一种测试处理程序。用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

44. 发明申请

US20080238470A1 OPERATING METHOD OF TEST HANDLER 有权
标题翻译：测试手术操作方法
公开(公告)号：US20080238470A1
公开(公告)日：2008-10-02
申请号：US12051959
申请日：2008-03-20
申请人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
发明人： Yun Sung Na , In Gu Jeon , Dong Hyun Yo , Hyun Song
IPC分类号： G01R31/26
CPC分类号： G01R31/2893
摘要： Operation methods of test handler are disclosed. The pick-and-place apparatus picks up semiconductor devices from first loading compartments arrayed in a matrix on a first loading element, moves, and places onto second loading compartments arrayed in a matrix on a second loading element. Pickers of the pick-and-place apparatus pick up the semiconductor devices from the first loading compartments and place them selectively onto a plurality of adjacent odd rows or a plurality of adjacent even rows of the second loading compartments during one operation. The pick-and-place apparatus includes a relatively large number of the pickers, preferably arrayed in a matrix, and thus performs loading and unloading of semiconductor devices at a relatively high speed.
摘要翻译：公开了测试处理器的操作方法。拾取和放置装置从在第一加载元件上排列成矩阵的第一加载隔间拾取半导体器件，移动并放置在第二加载元件上排列成矩阵的第二加载隔间上。拾取和放置装置的拾取器从第一加载隔间拾取半导体器件，并且在一次操作期间将它们选择性地放置在第二加载隔间的多个相邻奇数行或多个相邻偶数行上。拾取和放置装置包括相对大量的拾取器，优选地排列成矩阵，并且因此以相对高的速度执行半导体器件的装载和卸载。

45. 发明申请

US20080213078A1 PICK AND PLACE APPARATUS 有权
标题翻译：拍摄和放置设备
公开(公告)号：US20080213078A1
公开(公告)日：2008-09-04
申请号：US12103306
申请日：2008-04-15
申请人： Jae Gyun SHIM , Yun Sung NA , In Gu JEON , Tae Hung KU , Dong Hyun YO
发明人： Jae Gyun SHIM , Yun Sung NA , In Gu JEON , Tae Hung KU , Dong Hyun YO
IPC分类号： B65G1/133
CPC分类号： G01R31/2893 , H05K13/0482
摘要： A pick and place apparatus includes a plurality of device holing elements in a predetermined arrangement; a power supply mechanism for supplying a power for controlling a horizontal pitch between the plurality of device holding elements; a power transmission mechanism for delivering the power from the power supply mechanism to the plurality of device holding elements as a translational force in a horizontal direction; a first linear motion guide mechanism for guiding horizontal movements of some of the plurality of device holding elements; and a second linear motion guide mechanism disposed below the first linear motion guide mechanism, for guiding horizontal movements of the other device holding elements. The plurality of device holding elements are slidably coupled to the first and the second linear motion guide mechanism alternately.
摘要翻译：拾取和放置装置包括预定布置的多个装置孔元件; 电源机构，用于提供用于控制所述多个设备保持元件之间的水平间距的电力; 动力传递机构，用于将来自供电机构的动力作为水平方向的平移力传递到多个装置保持元件; 用于引导所述多个装置保持元件中的一些的水平移动的第一线性运动引导机构; 以及第二线性运动引导机构，其设置在所述第一线性运动引导机构的下方，用于引导所述另一装置保持元件的水平运动。多个装置保持元件交替地可滑动地联接到第一和第二直线运动引导机构。

46. 发明申请

US20080018354A1 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US20080018354A1
公开(公告)日：2008-01-24
申请号：US11727851
申请日：2007-03-28
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
IPC分类号： G01R1/04
CPC分类号： G01R31/2893
摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.
摘要翻译：在本发明中公开了一种测试处理器。测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元，以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。此外，测试处理程序可以应用于各种类型的测试器。

47. 发明授权

US08496426B2 Pick and place apparatus for electronic device inspection equipment, picking apparatus thereof, and method for loading electronic devices onto loading element 有权
标题翻译：用于电子设备检查设备的拾取和放置设备，其拾取设备以及将电子设备加载到加载元件上的方法
公开(公告)号：US08496426B2
公开(公告)日：2013-07-30
申请号：US12794975
申请日：2010-06-07
申请人： Yun-Sung Na , In-Gu Jeon , Dong Hyun Yo , Young-Chul Lee
发明人： Yun-Sung Na , In-Gu Jeon , Dong Hyun Yo , Young-Chul Lee
IPC分类号： B25J15/06
CPC分类号： H01L21/677 , G01R31/2893 , Y10S901/16
摘要： A technology related to a pick-and-place apparatus for electronic device inspection equipment is provided. The pick-and-place apparatus includes the guiding unit that can interact with a loading element and can guide the picker to load the electronic devices at a correct position on the loading element. Therefore, the pick-and-place apparatus can allow the electronic devices, for example, semiconductor devices having a ball type of electrical contact lead (BGA, FBGA, etc.), to electrically contact the tester in a stable manner when the tester inspects the electronic devices.
摘要翻译：提供了与电子设备检查设备的拾放装置相关的技术。拾取和放置装置包括可以与加载元件相互作用并且可以引导拾取器将电子装置加载到加载元件上的正确位置的引导单元。因此，拾取和放置装置可以允许电子装置，例如具有球型电接触引线（BGA，FBGA等）的半导体器件在测试器检查时以稳定的方式电气接触测试仪电子设备。

48. 发明申请

US20110265316A1 OPENER FOR TEST HANDLER 有权
标题翻译：打开测试人员
公开(公告)号：US20110265316A1
公开(公告)日：2011-11-03
申请号：US13083829
申请日：2011-04-11
申请人： Yun-Sung NA , Tae-Hung KU , Jung-Woo HWANG
发明人： Yun-Sung NA , Tae-Hung KU , Jung-Woo HWANG
IPC分类号： B23P19/00
CPC分类号： G01R31/2893
摘要： An opener for a test handler is provided. Even when holding members of inserts of a carrier board are manipulated to release semiconductor devices that have been in a held state, a predetermined distance can remain between an upper surface of the opening plate and a lower surface of the insert, thus preventing the inserts from becoming defective.
摘要翻译：提供了一个测试处理程序的开启者。即使当操作承载板的插入件的部件以释放已经处于保持状态的半导体器件时，在开口板的上表面和插入件的下表面之间仍可保留预定距离，从而防止插入物变得有缺陷。

49. 发明授权

US08026735B2 Test handler 有权
标题翻译：测试处理程序
公开(公告)号：US08026735B2
公开(公告)日：2011-09-27
申请号：US12368930
申请日：2009-02-10
申请人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
发明人： Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku , Jae-Sung Park , Su-Myung Lee
IPC分类号： G01R31/26 , G01R31/28
CPC分类号： G01R31/2893
摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.
摘要翻译：在本发明中公开了一种测试处理器。测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元，以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。此外，测试处理程序可以应用于各种类型的测试器。

50. 发明申请

US20100320348A1 OPENER AND BUFFER TABLE FOR TEST HANDLER 有权
标题翻译：打开和缓冲表测试处理器
公开(公告)号：US20100320348A1
公开(公告)日：2010-12-23
申请号：US12666124
申请日：2008-07-02
申请人： Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
发明人： Yun-Sung Na , In-Gu Jeon , Seung-Chul Ahn , Dong-Han Kim , Jae-Hyun Son
IPC分类号： G01R31/26 , F16M13/00 , B25B11/00
CPC分类号： G01R31/2893
摘要： An opener and a buffer table for a test handler are disclosed. The opener includes an opening plate, a plurality of pin blocks forming pairs, and at least one or more interval retaining apparatus for retaining an interval between the pin blocks forming a pair. Each of the pin blocks is movably coupled to the opening plate, and includes opening pins for releasing a holding state of a holding apparatus that holds semiconductor devices in a carrier board. Although semiconductor devices to be tested are altered in size and a carrier board loading with the semiconductor devices is thus replaced, the opener does not need to be replaced, thereby reducing the replacement cost and the waste of resources.
摘要翻译：公开了用于测试处理器的开启器和缓冲表。开启器包括开口板，多个成对的销块，以及用于保持形成一对的销块之间的间隔的至少一个或多个间隔保持装置。每个销块可移动地联接到开启板，并且包括用于释放将半导体器件保持在承载板中的保持装置的保持状态的打开销。尽管要测试的半导体器件的尺寸被改变，并且因此更换了与半导体器件的载体板，但是开关器不需要更换，从而降低了重置成本和浪费资源。

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