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    • 40. 发明授权
    • Particle measuring device and particle measuring method
    • 粒子测量装置和粒子测量方法
    • US09372072B2
    • 2016-06-21
    • US13637614
    • 2011-04-01
    • Nobuaki Ito
    • Nobuaki Ito
    • G06K9/78H04N7/18G01B11/08G01N15/14G01N21/88G01N21/47
    • G01B11/08G01N15/0227G01N15/1463G01N21/8806G01N2021/4771
    • This particle measuring device includes a stage, a reflected light illuminating device, a transmitted light illuminating device, an illumination control device, an imaging device, and an image processing device. Based on a transmitted light image acquired by imaging an opaque fine particle group using transmitted light and a reflected light image acquired by imaging an opaque fine particle group using reflected light, by associating transmitted light particles present in the transmitted light image and reflected light particles present in the reflected light image with each other using a predetermined method, various characteristics (the position, the size, the brightness level, and the like) of individual particles out of a fine particle group are simultaneously measured.
    • 该粒子测量装置包括载物台,反射光照明装置,透射光照明装置,照明控制装置,成像装置和图像处理装置。 基于通过使用透射光成像不透明微粒组而获得的透射光图像和通过使用反射光成像不透明微粒组而获得的反射光图像,通过将透射光图像中存在的透射光粒子与存在于反射光粒子中的反射光粒子相关联 在使用预定方法的反射光图像中,同时测量细颗粒组中的各个颗粒的各种特性(位置,大小,亮度水平等)。