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    • 35. 发明授权
    • Row decoder circuit for electrically programmable and erasable non volatile memories
    • 行解码器电路,用于电可编程和可擦除非易失性存储器
    • US07447103B2
    • 2008-11-04
    • US11504539
    • 2006-08-14
    • Paolo Rolandi
    • Paolo Rolandi
    • G11C8/00
    • G11C8/10G11C16/16
    • The invention relates to a row decoder circuit for non volatile memory devices of the electrically programmable and erasable type, for example of the Flash EEPROM type having a NOR architecture. The proposed row decoder circuit allows to carry out the erasing step very quickly, for example with a granularity emulating at least 16kB and even overcoming by at least 2kB Flash memories of the NAND type. The memory can thus maintain high performances in terms of random access speed but shows a high erasing speed typical of memory architectures of the NAND type.
    • 本发明涉及一种用于电可编程和可擦除类型的非易失性存储器件的行解码器电路,例如具有NOR架构的闪速EEPROM类型。 所提出的行解码器电路允许非常快速地执行擦除步骤,例如以至少16kB的粒度进行甚至由NAND类型的至少2kB的闪存进行克服的粒度。 因此,存储器可以在随机访问速度方面保持高性能,但是显示出NAND类型的存储器架构的典型的高擦除速度。
    • 37. 发明申请
    • METHOD AND SYSTEM FOR REFRESHING A MEMORY DEVICE DURING READING THEREOF
    • 在读取存储器件时刷新的方法和系统
    • US20070279996A1
    • 2007-12-06
    • US11695552
    • 2007-04-02
    • Paolo RolandiLuigi Pascucci
    • Paolo RolandiLuigi Pascucci
    • G11C16/06
    • G11C16/3431G11C11/5628G11C16/3418
    • A refresh circuit for refreshing a memory device is proposed. The refresh circuit includes: reading means for reading a set of memory cells, the reading means including means for applying a biasing voltage having a substantially monotone time pattern to the memory cells and to a set of reference cells each one having a reference threshold voltage, means for detecting the reaching of a comparison current by a cell current of each memory cell and by a reference current of each reference cell, and means for determining a condition of each memory cell according to a temporal relation of the reaching of the comparison current by the corresponding cell current and the reference currents, and writing means for applying a writing voltage to at least one selected of the memory cells; the refresh circuit further includes control means for enabling the writing means during at least part of the application of the biasing voltage after the determination of the condition of each selected memory cell.
    • 提出了刷新存储器件的刷新电路。 刷新电路包括:用于读取一组存储单元的读取装置,所述读取装置包括用于向存储单元施加具有基本上单调的时间模式的偏置电压的装置和具有参考阈值电压的一组参考单元, 用于通过每个存储单元的单元电流和每个参考单元的参考电流来检测比较电流达到的装置,以及用于根据达到比较电流的时间关系确定每个存储单元的状态的装置 对应的单元电流和参考电流;以及写入装置,用于向至少一个选择的存储单元施加写入电压; 刷新电路还包括控制装置,用于在确定每个所选择的存储单元的状态之后,在施加偏置电压的至少一部分期间使写入装置能够使能。