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    • 33. 发明授权
    • Method and apparatus distribution power suply pad of semiconductor integrated circuit
    • 半导体集成电路的方法和装置配电电源板
    • US07454724B2
    • 2008-11-18
    • US10823649
    • 2004-04-14
    • Takashi KuriharaKazutaka Takeuchi
    • Takashi KuriharaKazutaka Takeuchi
    • G06F17/50
    • G06F17/5036G06F17/5068
    • A method for accurately determining the provisional quantity and provisional locations of power supply pads prior to detailed layout of a semiconductor integrated circuit. The method decreases redesigning, shortens the design time, and lowers design costs. The method includes performing a power supply network analysis of the core section to obtain voltage values of the nodes, calculating current values between the nodes from the voltage values of the nodes and the resistances between the nodes, and calculating current values of the power supply pads from the current values between the nodes. The method further includes determining whether to eliminate or add a power supply pad depending on whether the current value of each power supply pad exceeds the current capacity of an associated IO buffer.
    • 一种用于在半导体集成电路的详细布局之前准确地确定电源焊盘的临时位置和临时位置的方法。 该方法减少了重新设计,缩短了设计时间,降低了设计成本。 该方法包括执行核心部分的电源网络分析以获得节点的电压值,从节点的电压值和节点之间的电阻计算节点之间的电流值,并计算电源焊盘的电流值 从节点之间的当前值。 该方法还包括根据每个电源焊盘的当前值是否超过相关联的IO缓冲器的当前容量来确定是否消除或添加电源焊盘。
    • 35. 发明授权
    • Diagnostic X-ray system
    • 诊断X射线系统
    • US07116752B2
    • 2006-10-03
    • US10659310
    • 2003-09-11
    • Tooru TakahashiTakashi Kurihara
    • Tooru TakahashiTakashi Kurihara
    • G01N23/04
    • A61B6/504A61B6/583
    • A region affected by X-ray beam limiting within a fluoroscopic image is specified based on position information on beam limiting by an X-ray beam limiting device. A judgment is made as to whether the region affected superposes a first brightness measuring region (region of interest) within the X-ray fluoroscopic image, and when superposition is not judged, automatic brightness control is performed based on the first brightness measuring region. When superposition is judged, the first brightness measuring region is transformed, and automatic brightness control is performed with reference to a second automatic brightness measuring region that does not superpose the region affected.
    • 基于X射线束限制装置的束限制的位置信息来指定在透视图像内受X射线束限制影响的区域。 判断受影响区域是否在X射线透视图像内叠加第一亮度测量区域(感兴趣区域),并且当未判断叠加时,基于第一亮度测量区域执行自动亮度控制。 当判断叠加时,变换第一亮度测量区域,参照不影响区域的第二自动亮度测量区域执行自动亮度控制。
    • 39. 发明申请
    • Method and apparatus for designing semiconductor integrated circuit
    • 半导体集成电路设计方法及设备
    • US20050050502A1
    • 2005-03-03
    • US10823649
    • 2004-04-14
    • Takashi KuriharaKazutaka Takeuchi
    • Takashi KuriharaKazutaka Takeuchi
    • G06F17/50G06F9/45H01L21/82H01L21/822H01L27/04
    • G06F17/5036G06F17/5068
    • A method for accurately determining the provisional quantity and provisional locations of power supply pads prior to detailed layout of a semiconductor integrated circuit. The method decreases redesigning, shortens the design time, and lowers design costs. The method includes performing a power supply network analysis of the core section to obtain voltage values of the nodes, calculating current values between the nodes from the voltage values of the nodes and the resistances between the nodes, and calculating current values of the power supply pads from the current values between the nodes. The method further includes determining whether to eliminate or add a power supply pad depending on whether the current value of each power supply pad exceeds the current capacity of an associated IO buffer.
    • 一种用于在半导体集成电路的详细布局之前准确地确定电源焊盘的临时位置和临时位置的方法。 该方法减少了重新设计,缩短了设计时间,降低了设计成本。 该方法包括执行核心部分的电源网络分析以获得节点的电压值,从节点的电压值和节点之间的电阻计算节点之间的电流值,并计算电源焊盘的电流值 从节点之间的当前值。 该方法还包括根据每个电源焊盘的当前值是否超过相关联的IO缓冲器的当前容量来确定是否消除或添加电源焊盘。
    • 40. 发明授权
    • Method and apparatus for laying out power supply wiring
    • 布线电源线路的方法和装置
    • US06854094B2
    • 2005-02-08
    • US10261491
    • 2002-10-02
    • Masuo InuiTakashi Kurihara
    • Masuo InuiTakashi Kurihara
    • G06F17/50H01L21/82H01L21/822H01L27/04
    • G06F17/5077
    • A method for designing power supply wiring of a semiconductor integrated circuit having a logic circuit. A first power consumption value of the logic circuit is calculated based on logic connection information, and the power supply wiring is laid out in accordance with the first power consumption value. Logic modification connection information relating to the modified logic circuit is generated when the logic circuit is modified after the power supply wiring is laid out. A second power consumption value of the modified logic circuit is calculated based on the logic modification connection information. When the second power consumption value exceeds the first power consumption value, it is determined that the power supply wiring must be re-laid out. It is thus easily determined whether to re-lay out the power supply wiring without performing power supply network analysis.
    • 一种用于设计具有逻辑电路的半导体集成电路的电源布线的方法。 基于逻辑连接信息计算逻辑电路的第一功耗消耗值,并且根据第一功耗值布置电源布线。 在布置电源布线之后,当修改逻辑电路时,产生与修改的逻辑电路相关的逻辑修改连接信息。 基于逻辑修改连接信息计算修改后的逻辑电路的第二功耗值。 当第二功率消耗值超过第一功耗值时,确定必须重新布置电源布线。 因此容易确定是否重新布线电源线,而不进行电源网络分析。