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    • 36. 发明授权
    • Integrated circuit and method of detecting a signal edge transition
    • 检测信号边沿转换的集成电路和方法
    • US07782093B2
    • 2010-08-24
    • US11805305
    • 2007-05-23
    • Cyrille Dray
    • Cyrille Dray
    • H03K5/22
    • G11C7/22G11C7/222G11C8/18H03K5/1534
    • The invention relates to an edge transition detector, and a method of operating an edge transition detector. An integrated circuit includes an edge transition detector for producing an output signal at an output node in response to an input signal. The edge transition detector includes a switch coupled to the output node. The edge transition detector includes a logic device with a first input coupled to the input node and an output coupled to a control terminal of the switch to enable the switch to conduct, thereby effecting a transition of the output signal from a first logic level to a second logic level in response to the input signal. A feedback path is provided from the output node to a second input of the logic device to disable switch conductivity when the output signal completes the logic transition from the first logic level to the second logic level.
    • 本发明涉及一种边缘转换检测器,以及一种操作边缘转换检测器的方法。 集成电路包括用于响应于输入信号在输出节点产生输出信号的边沿转换检测器。 边缘转换检测器包括耦合到输出节点的开关。 边缘跃迁检测器包括具有耦合到输入节点的第一输入和耦合到开关的控制端的输出的逻辑器件,以使开关能导通,从而实现输出信号从第一逻辑电平到 响应于输入信号的第二逻辑电平。 当输出信号完成从第一逻辑电平到第二逻辑电平的逻辑转换时,反馈路径从输出节点提供给逻辑器件的第二输入,以禁止开关电导率。
    • 39. 发明授权
    • Recursive device for switching over a high potential greater than a nominal potential of a technology in which the device is made and related system and method
    • 用于切换高于设备制造技术的标称电位的高电位的递归设备及相关系统和方法
    • US07489559B2
    • 2009-02-10
    • US11643009
    • 2006-12-19
    • Cyrille DrayStéphane Gamet
    • Cyrille DrayStéphane Gamet
    • G11C11/34
    • H03K17/102H03K17/693
    • An embodiment of the invention pertains to an nth order selector switch device comprising: a first arm comprising n transistors series-connected between a first input to which a 0-ranking potential is applied, and an output; and a second arm comprising n transistors series-connected between a second input to which a 0-ranking potential is applied, and the output. The device according to the invention also comprises: a means to produce n−1 potentials ranked 1 to n−1 included between the potential ranked 0 and the potential ranked n; and a driving means for the production, from the n+1 potentials ranked 0 to n, of control signals suited to driving the gates of the transistors of the first arm and the gates of the transistors of the second arm so that the transistors of one of the arms are on and the transistors of the other arm are off depending on the value of the n-ranking potential relative to the value of the 0-ranking potential.
    • 本发明的实施例涉及一种第n级选择器开关装置,包括:第一臂,包括串联连接在施加0级电位的第一输入端和输出端之间的n个晶体管; 以及第二臂,包括串联连接在施加0级电位的第二输入和输出之间的n个晶体管。 根据本发明的装置还包括:产生潜在排名0和潜在等级为n之间的包括1至n-1的n-1个电位的装置; 以及用于从适于驱动第一臂的晶体管的栅极和第二臂的晶体管的栅极的控制信号产生从0到n的n + 1个电位的驱动装置,使得一个晶体管 根据相对于0级电位值的n级势的值,另一臂的晶体管截止。
    • 40. 发明申请
    • SRAM MEMORY DEVICE WITH IMPROVED WRITE OPERATION AND METHOD THEREOF
    • 具有改进的写操作的SRAM存储器件及其方法
    • US20080159014A1
    • 2008-07-03
    • US11617336
    • 2006-12-28
    • Cyrille DrayFrancois Jacquet
    • Cyrille DrayFrancois Jacquet
    • G11C5/14
    • G11C11/413
    • The invention relates to a device, and also to a corresponding method of implementation, for SRAM memory information storage, powered by a voltage VDD and comprising: an array of base cells organised in base columns, and at least one mirror column of mirror cells, liable to simulate the behaviour of the cells in a base column, The invention is characterised in that the device further comprises: Emulation means, in a mirror column, of the most restricting cell in a base column, Means for varying the mirror power supply voltage (VDDMMOCK) for the mirror column, and Means for copying the mirror power supply voltage in the emulated base column.
    • 本发明涉及一种由电压VDD供电的SRAM存储器信息存储器的器件以及相应的实现方法,包括:组合在基本列中的基本单元阵列,以及镜像单元的至少一个反射镜列, 本发明的特征在于,该装置还包括:在反射镜列中的仿真装置,其是基极柱中最大限制电池的装置,用于改变反射镜电源电压的装置 (VDDMMOCK),以及用于复制仿真基列中的反射镜电源电压的装置。