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    • 33. 发明授权
    • Memory array with multiple read ports
    • 具有多个读端口的内存阵列
    • US07092310B2
    • 2006-08-15
    • US11010902
    • 2004-12-13
    • Martin EckertJuergen PilleDieter Wendel
    • Martin EckertJuergen PilleDieter Wendel
    • G11C8/00
    • G11C7/1075G11C8/16
    • A multiport array comprises a read section which is separated from an array of memory cells and which forms a plurality of data-out ports each consisting of a predetermined number of output lines. The read section comprises a multiplex network containing a plurality of multiplex arrays each associated with one of the data-out ports (0,1, . . . ,15). The multiplex arrays are connected to the data read lines of the memory cells and are selected by read addresses. The multiplex arrays comprise transmission elements which connect selected ones of the data read lines to the associated data-out port.
    • 多端口阵列包括与存储器单元阵列分离并且形成多个数据输出端口的读取部件,每个数据输出端口由预定数量的输出线路组成。 读取部分包括多路复用网络,该多路复用网络包含多个多路复用阵列,每个多路复用阵列与数据输出端口(0,1,...,15)之一相关联。 多路复用阵列连接到存储单元的数据读取线,并通过读地址进行选择。 多路复用阵列包括将选定数据读取线连接到相关联的数据输出端口的传输元件。
    • 37. 发明申请
    • Provision of a personalized indicator datum when setting up a telecommunication
    • 在建立电信时提供个性化指标基准
    • US20050265532A1
    • 2005-12-01
    • US11082464
    • 2005-03-16
    • Marian TrinkelMartin EckertDetlef HardtFrank Daussmann
    • Marian TrinkelMartin EckertDetlef HardtFrank Daussmann
    • H04M3/42H04M3/00H04M5/00
    • H04M3/42H04M3/42042H04M3/42093
    • A method and system which provide a personalized indicator datum on at least one terminal when establishing a telecommunication or when setting up a call between at least two terminals. In a first database, able to be accessed by an intelligent network of the network of the first terminal, an identification datum assigned to a first terminal is assigned the identification datum of at least one second terminal. And, as a function of the assignment, at least one indicator datum is stored in the first or a further database able to be accessed by the intelligent network of the TCN of the first terminal. When a call set-up is initiated between at least two terminals, in response to the identification datum of the first terminal, the intelligent network of the TCN of the first terminal compares the identification datum of the at least one further terminal with the identification datum of the at least one second terminal. In response to an assignment match, the indicator datum stored as a function of the assignment is called up and transmitted to at least one of the further terminals in accordance with the assignment.
    • 一种在建立通信时或者在至少两个终端之间建立呼叫时在至少一个终端上提供个性化指示符数据的方法和系统。 在能够由第一终端的网络的智能网络访问的第一数据库中,分配给第一终端的识别数据被分配至少一个第二终端的标识数据。 并且,作为分配的功能,至少一个指示符数据存储在能够由第一终端的TCN的智能网络访问的第一或另外的数据库中。 当在至少两个终端之间启动呼叫建立时,响应于第一终端的识别数据,第一终端的TCN的智能网络将至少一个另外的终端的识别数据与识别数据进行比较 的至少一个第二终端。 响应于分配匹配,根据分配被调用并发送到至少一个其它终端,作为分配的函数存储的指示符数据。
    • 38. 发明授权
    • Method and system for performing self-tests in an electronic system
    • 在电子系统中执行自检的方法和系统
    • US08659310B2
    • 2014-02-25
    • US13087550
    • 2011-04-15
    • Martin EckertRoland FrechJochen SupperOtto A. Torreiter
    • Martin EckertRoland FrechJochen SupperOtto A. Torreiter
    • G01R31/3187
    • G01R31/31721G01R31/3004
    • A method and system for performing a self-test of power supply quality for an integrated circuit chip within an electronic system. The electronic system is subjected to a well-defined repetitive activity, such as by using an amplitude modulated system clock tree. With the repetitive activity causing current consumption within the chip, time-domain local power supply voltage (U(t)) is measured for a location on the chip. A set of time-domain measured voltage data (U(t)) is accumulated and transformed into the frequency domain to yield a local voltage profile (U(f)). The local voltage profile (U(f)) is compared with a reference voltage profile (U0(f)) to verify whether power supply quality at the chip location under test is adequate. Alternatively, a local impedance profile Z(f) evaluated from the local voltage profile (U(f)) may be compared to a reference impedance profile Z0(f).
    • 一种用于对电子系统内的集成电路芯片进行电源质量自检的方法和系统。 电子系统受到明确的重复活动,例如通过使用调幅系统时钟树。 由于重复的活动导致芯片内的电流消耗,对于芯片上的位置测量时域本地电源电压(U(t))。 一组时域测量电压数据(U(t))被积累并变换到频域以产生局部电压分布(U(f))。 将本地电压曲线(U(f))与参考电压曲线(U0(f))进行比较,以验证被测芯片位置的电源质量是否足够。 或者,可以将从局部电压分布(U(f))估计的局部阻抗曲线Z(f)与参考阻抗曲线Z0(f)进行比较。