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31. 发明申请

US20070296437A1 MINI-PROBER FOR TFT-LCD TESTING 有权
标题翻译：用于TFT-LCD测试的微型探测器
公开(公告)号：US20070296437A1
公开(公告)日：2007-12-27
申请号：US11746515
申请日：2007-05-09
申请人： Benjamin Johnston , Sriram Krishnaswami , Hung Nguyen , Matthias Brunner , Yong Liu
发明人： Benjamin Johnston , Sriram Krishnaswami , Hung Nguyen , Matthias Brunner , Yong Liu
IPC分类号： G01R31/02
CPC分类号： G01R31/2808 , G09G3/006
摘要： An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
摘要翻译：描述了用于测试大面积基板的装置和方法。大面积基板包括电连接到显示器的显示器和接触点的图案。该装置包括可相对于大面积基板移动的探测器组件，并且可以被配置为测试各种显示和接触点的图案。探测器组件还被配置成测试大面积衬底的分数段。该装置还包括被配置为在内部容积内存储至少两个探测器组件的测试室。

32. 发明授权

US07135875B2 Apparatus and method for contacting of test objects 有权
标题翻译：测试对象接触的装置和方法
公开(公告)号：US07135875B2
公开(公告)日：2006-11-14
申请号：US10716102
申请日：2003-11-18
申请人： Matthias Brunner
发明人： Matthias Brunner
IPC分类号： G01R31/305 , G01R31/28
CPC分类号： G09G3/006 , G01R31/2887 , G01R31/302
摘要： The invention relates to methods for positioning of a substrate 140 and contacting of the test object 301 for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder 130. The substrate is positioned relative to the optical axis. A contact unit 150 is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.
摘要翻译：本发明涉及一种用于定位基片140的方法，以及用于测试的测试对象301与具有光轴和对应装置的测试装置的接触。由此，将基板放置在保持器130上。基板相对于光轴定位。接触单元150也相对于光轴定位，由此接触单元独立于衬底的定位活动而定位。从而可以实现测试对象在基板上的柔性接触。

33. 发明申请

US20060181290A1 Apparatus and method for contacting of test objects 有权
公开(公告)号：US20060181290A1
公开(公告)日：2006-08-17
申请号：US11398052
申请日：2006-04-05
申请人： Matthias Brunner
发明人： Matthias Brunner
IPC分类号： G01R31/305
CPC分类号： G09G3/006 , G01R31/2887 , G01R31/302
摘要： The invention relates to methods for positioning of a substrate and contacting of the test object for testing with a test apparatus with an optical axis and corresponding devices. Thereby, the substrate is put on the holder. The substrate is positioned relative to the optical axis. A contact unit is also positioned relative to the optical axis, whereby the contact unit is positioned independent of the positioning activity of the substrate. Thereby, a flexible contacting of test objects on the substrate can be realized.

34. 发明授权

US4985681A Particle beam measuring method for non-contact testing of interconnect networks 失效
标题翻译：用于互连网络非接触测试的粒子束测量方法
公开(公告)号：US4985681A
公开(公告)日：1991-01-15
申请号：US813875
申请日：1985-12-27
申请人： Matthias Brunner , Juergen Frosien , Reinhold Schmitt , Burkhard Lischke
发明人： Matthias Brunner , Juergen Frosien , Reinhold Schmitt , Burkhard Lischke
IPC分类号： G01N23/225 , G01R31/02 , G01R31/302 , G01R31/305 , H01L21/66
CPC分类号： G01R31/024 , G01R31/305
摘要： For testing an interconnect network for shorts and interruptions, a point of the network to be tested is charged with a particle beam. Subsequently, a potential at least one further contact point is read with the same particle beam and an unaltered primary energy. An identification of potential occurs by documenting the secondary electrons triggered at the contact points. In order to avoid a disturbing change of potential during the measuring phase, the measuring time is only a fraction of the time for charging the network.
摘要翻译：为了测试短路和中断的互连网络，要测试的网络的一点充满了粒子束。随后，用相同的粒子束和未改变的一次能量读取潜在的至少一个另外的接触点。通过记录在接触点处触发的二次电子来发生电位的识别。为了避免测量阶段电位的干扰变化，测量时间只是网络充电时间的一小部分。

35. 发明申请

US20140253160A1 ROLL TO ROLL TESTER AND METHOD OF TESTING FLEXIBLE SUBSTRATES ROLL TO ROLL 有权
标题翻译：滚动测试仪和测试柔性基底的方法滚动
公开(公告)号：US20140253160A1
公开(公告)日：2014-09-11
申请号：US14352043
申请日：2011-10-19
申请人： Matthias Brunner
发明人： Matthias Brunner
IPC分类号： G01R1/02
CPC分类号： G01R1/02 , G01R31/01 , G09G3/006
摘要： An apparatus for testing of a plurality of electronic devices on a flexible substrate is described. The apparatus includes at least two rollers (110) configured for guiding the flexible substrate (10) into a testing area along transport direction, at least one prober (122) configured for electrically contacting one or more of the electronic devices, at least one probing support (124) configured for supporting a portion of the flexible substrate during electrical contact with the at least one prober, and a test device for functional testing of one or more of the electronic devices.
摘要翻译：描述了一种用于在柔性基板上测试多个电子装置的装置。该设备包括至少两个辊子（110），其构造成用于将柔性基板（10）沿传送方向引导到测试区域中，至少一个探测器（122）被配置用于电接触一个或多个电子设备，至少一个探测支撑件（124），其被配置为在与所述至少一个探测器电接触期间支撑所述柔性基板的一部分;以及测试装置，用于一个或多个所述电子设备的功能测试。

36. 发明授权

US08220825B2 Method and device for fastening an airbag in a motor vehicle 失效
标题翻译：用于将气囊紧固在机动车辆中的方法和装置
公开(公告)号：US08220825B2
公开(公告)日：2012-07-17
申请号：US12438912
申请日：2007-08-22
申请人： Frank Bonarens , Dietmar Breidert , Matthias Brunner , Benjamin De Buysscher , Johannes Diehl , Mathias Grube , Waldemar Medla
发明人： Frank Bonarens , Dietmar Breidert , Matthias Brunner , Benjamin De Buysscher , Johannes Diehl , Mathias Grube , Waldemar Medla
IPC分类号： B60R21/20
CPC分类号： B60R21/213 , B60R21/232 , F16B37/043 , Y10T29/49963
摘要： A method is provided for fastening an airbag to a motor vehicle, that includes, but is not limited to the steps of fastening an airbag, which can be filled with a gas and which has a fastening tab, to a fastening device which comprises a plate and a clip device fastened to the plate and the plate comprises a first plate section with a first opening having a screw thread and a second plate section, and the clip device is fastened on the first plate section, and the airbag is fastened to the fastening device by bending the second plate section in such a manner that the first plate section and the second plate section at least partially enclose the fastening tab on both sides. A fastening device is also provided for an airbag, an airbag, and a motor vehicle.
摘要翻译：提供一种用于将气囊紧固到机动车辆的方法，其包括但不限于将可以填充有气体并且具有紧固突片的气囊紧固到紧固装置的步骤，所述紧固装置包括板以及固定在所述板上的夹子装置，所述板包括具有第一开口的第一板部分，所述第一开口具有螺纹和第二板部分，所述夹紧装置紧固在所述第一板部分上，并且所述气囊被紧固到所述紧固件该装置通过使第二板部分弯曲成使得第一板部分和第二板部分至少部分地围绕两侧的紧固片。还设置有用于气囊，气囊和机动车辆的紧固装置。

37. 发明授权

US07602199B2 Mini-prober for TFT-LCD testing 有权
标题翻译：微型探针用于TFT-LCD测试
公开(公告)号：US07602199B2
公开(公告)日：2009-10-13
申请号：US11746515
申请日：2007-05-09
申请人： Benjamin M. Johnston , Sriram Krishnaswami , Hung T. Nguyen , Matthias Brunner , Yong Liu
发明人： Benjamin M. Johnston , Sriram Krishnaswami , Hung T. Nguyen , Matthias Brunner , Yong Liu
IPC分类号： G01R31/02 , G01R31/00 , G01R31/26 , G01R31/28 , G02F1/133
CPC分类号： G01R31/2808 , G09G3/006
摘要： An apparatus and method for testing large area substrates is described. The large area substrates include patterns of displays and contact points electrically coupled to the displays. The apparatus includes a prober assembly that is movable relative to the large area substrate and may be configured to test various patterns of displays and contact points. The prober assembly is also configured to test fractional sections of the large area substrate. The apparatus also includes a test chamber configured to store at least two prober assemblies within an interior volume.
摘要翻译：描述了用于测试大面积基板的装置和方法。大面积基板包括电连接到显示器的显示器和接触点的图案。该装置包括可相对于大面积基板移动的探测器组件，并且可以被配置为测试各种显示和接触点的图案。探测器组件还被配置成测试大面积衬底的分数段。该装置还包括被配置为在内部容积内存储至少两个探测器组件的测试室。

38. 发明申请

US20060022694A1 Large substrate test system 失效
标题翻译：大基板测试系统
公开(公告)号：US20060022694A1
公开(公告)日：2006-02-02
申请号：US10901936
申请日：2004-07-29
申请人： Matthias Brunner , Shinichi Kurita , Wendell Blonigan , Edgar Kehrberg
发明人： Matthias Brunner , Shinichi Kurita , Wendell Blonigan , Edgar Kehrberg
IPC分类号： G01R31/26
CPC分类号： H01J37/185 , G01R31/2886 , H01J2237/204
摘要： A method and system for testing one or more large substrates are provided. In one or more embodiments, the system includes a testing chamber having a substrate table disposed therein. The substrate table is adapted to move a substrate within the testing chamber in various directions. More particularly, the substrate table includes a first stage movable in a first direction, and a second stage movable in a second direction, wherein each of the stages moves in an X-direction, Y-direction or both X and Y directions. The system further includes a load lock chamber at least partially disposed below the testing chamber, and a transfer chamber coupled to the load lock chamber and the testing chamber. In one or more embodiments, the transfer chamber includes a robot disposed therein which is adapted to transfer substrates between the load lock chamber and the testing chamber.
摘要翻译：提供了用于测试一个或多个大基板的方法和系统。在一个或多个实施例中，系统包括具有设置在其中的衬底台的测试室。衬底台适于在各个方向上移动测试室内的衬底。更具体地，衬底台包括可在第一方向上移动的第一阶段和沿第二方向移动的第二阶段，其中每个阶段沿X方向，Y方向或X方向和Y方向两者移动。该系统还包括至少部分地设置在测试室下方的负载锁定室和耦合到负载锁定室和测试室的传送室。在一个或多个实施例中，传送室包括设置在其中的机器人，其适于在载荷锁定室和测试室之间传送基板。

39. 发明申请

US20050212782A1 Control device having improved testing properties 审中-公开
标题翻译：具有改进的测试性能的控制装置
公开(公告)号：US20050212782A1
公开(公告)日：2005-09-29
申请号：US10518780
申请日：2003-06-18
申请人： Matthias Brunner
发明人： Matthias Brunner
IPC分类号： G01R31/316 , G02F1/13 , G09F9/00 , G09G3/00 , G09G3/20 , G09G3/36 , G09G5/00
CPC分类号： G09G3/006 , G02F1/1309
摘要： The invention relates to a drive electronics for driving a display with a matrix 101 of picture elements. The drive circuit 102x and 102y for generating signals for driving the pixels via control lines 103 is provided with signals at the input terminals 110 via contact areas 104. In addition to the contact areas used for the generation of arbitrary pictures, there exist contact areas 105 used within the framework of a testing method. These contact areas for the testing method are also connected with the input terminals 110 of the drive circuit and are used for generating a test pattern.
摘要翻译：本发明涉及一种驱动电子装置，用于驱动具有像素矩阵101的显示器。用于通过控制线103产生用于驱动像素的信号的驱动电路102x和102y通过接触区域104在输入端110处被提供有信号。除了用于生成任意图片的接触区域之外，存在在测试方法的框架内使用的接触区域105。用于测试方法的这些接触区域也与驱动电路的输入端子110连接，并用于产生测试图案。

40. 发明授权

US5268638A Method for particle beam testing of substrates for liquid crystal displays "LCD" 失效
标题翻译：液晶显示器基板的粒子束测试方法“LCD”
公开(公告)号：US5268638A
公开(公告)日：1993-12-07
申请号：US882657
申请日：1992-05-13
申请人： Matthias Brunner , Reinhold Schmitt
发明人： Matthias Brunner , Reinhold Schmitt
IPC分类号： G01R31/02 , G01R31/302 , G01R31/305 , G01R31/308 , G02F1/136 , G02F1/1362 , G02F1/1368 , G09F9/35 , G09G3/18 , G01R31/00
CPC分类号： G01R31/305 , G01R31/302 , G01R31/308 , G02F2001/136254
摘要： Method for particle beam testing of substrates for liquid crystal displays (LCD). This invention is directed to methods wherein, given a substrate (SUB1) for a liquid crystal display, either potentials or, respectively, currents are set in defined fashion with a particle beam (S1, S2 and S4) and/or potentials are measured by detecting secondary electrons (S5) at different switch statuses of the switch elements (T) of the substrate (SUB1). The geometrical integrity and the electrical functionability of the substrate (SUB1) are thereby tested, even though, for example, a supplementary plane electrode is not present for forming a capacitor. An important advantage of the method is that faulty substrates can be repaired or can be segregated even before further-processing and, thus, costs can be reduced.
摘要翻译：液晶显示器（LCD）基板的粒子束测试方法。本发明涉及一种方法，其中给定用于液晶显示器的衬底（SUB1），电势或电流分别以粒子束（S1，S2和S4）定义为电流，和/或电位通过在衬底（SUB1）的开关元件（T）的不同开关状态下检测二次电子（S5）。因此，即使例如辅助平面电极不存在用于形成电容器，也可以测试基板（SUB1）的几何完整性和电功能性。该方法的一个重要优点是，即使在进一步处理之前，有缺陷的基板可以被修复或者可以被分离，因此可以降低成本。

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