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    • 21. 发明申请
    • Laser Control with Phase Plate Feedback
    • 激光控制与相位反馈
    • US20110216314A1
    • 2011-09-08
    • US13111664
    • 2011-05-19
    • Josef F. Bille
    • Josef F. Bille
    • G01J3/40
    • A61B3/1225A61B3/1015
    • An ophthalmic imaging system includes a light source, focusing optics, compensating optics, and a computer that coordinates both of the optics to optimize the Diffraction Limited Point Spread Function (DL-PSF) of the imaging light beam. In detail, the compensating optics includes a customized phase plate that provides substantially complete compensation for static aberrations introduced by an eye into the imaging light beam. Further, the computer measures an operational error signal that results from dynamic aberrations. The computer then uses the error signal to control the compensating optics and thereby optimize the DL-PSF by compensating for both static and dynamic aberrations. For an alternate embodiment, an active mirror can be included in the compensating optics to provide additional compensation for the dynamic aberrations.
    • 眼科成像系统包括光源,聚焦光学元件,补偿光学元件和协调两个光学元件以优化成像光束的衍射有限点扩展函数(DL-PSF)的计算机。 详细地,补偿光学器件包括定制的相位板,其为由眼睛引入到成像光束中的静态像差提供基本上完全的补偿。 此外,计算机测量由动态像差产生的操作误差信号。 计算机然后使用误差信号来控制补偿光学元件,从而通过补偿静态和动态像差来优化DL-PSF。 对于替代实施例,可以在补偿光学器件中包括有源反射镜以为动态像差提供额外的补偿。
    • 23. 发明申请
    • METHOD AND APPARATUS FOR AUTOMATED SPECTRAL CALIBRATION
    • 自动光谱校准的方法和装置
    • US20110085164A1
    • 2011-04-14
    • US12897376
    • 2010-10-04
    • Matthew NelsonPatrick Treado
    • Matthew NelsonPatrick Treado
    • G01J3/00G01J3/44G01J3/42G01J3/40
    • A61B5/0059A61B2560/0223G01J3/28G01J3/42
    • A method and apparatus for automated spectral calibration of a spectroscopy device. A method for simultaneous calibration and spectral imaging of a sample by: simultaneously illuminating the sample and a calibrant with a plurality of illuminating photons; receiving, at the spectrometer, a first plurality of photons collected from the sample and a second plurality of photons collected from the calibrant; forming a calibrant spectrum from the first plurality of collected photons and a sample spectrum from the second plurality of collected photons; comparing the calibrant spectrum with a reference spectrum of the calibrant to determine a wavelength-shift in the calibrant spectrum; applying the wavelength-shift to the sample spectrum to obtain a calibrated sample spectrum.
    • 一种用于光谱装置的自动光谱校准的方法和装置。 一种通过以下步骤同时校准和光谱成像的方法:同时用多个照明光子照射样品和校准物; 在光谱仪处接收从样品收集的第一组多个光子和从校准物收集的第二组多个光子; 从所述第一多个收集的光子形成校准谱,以及来自所述第二多个收集的光子的样品光谱; 将校准谱与校准物的参考光谱进行比较,以确定校准谱中的波长漂移; 将波长偏移应用于样本光谱以获得校准的样本光谱。
    • 26. 发明授权
    • Optical analysis system and optical train
    • 光学分析系统和光学列车
    • US07834999B2
    • 2010-11-16
    • US12094467
    • 2006-11-27
    • Michael L. MyrickJonathan H. JamesJohn C. BlackburnRobert P. Freese
    • Michael L. MyrickJonathan H. JamesJohn C. BlackburnRobert P. Freese
    • G01J3/40
    • G06E3/001
    • A multivariate optical computing and analysis system includes a light source configured to radiate a first light along a first ray path; a modulator disposed in the first ray path, the modulator configured to modulate the first light to a desired frequency; a spectral element disposed proximate the modulator, the spectral element configured to filter the first light for a spectral range of interest of a sample; a cavity disposed in communication with the spectral element, the cavity configured to direct the first light in a direction of the sample; a tube disposed proximate the cavity, the tube configured to receive and direct a second light generated by a reflection of the first light from the sample, the tube being further configured to separate the first and second lights; a beamsplitter configured to split the second light into a first beam and a second beam; an optical filter mechanism disposed to receive the first beam, the optical filter mechanism configured to optically filter data carried by the first beam into at least one orthogonal component of the first beam; and a detector mechanism in communication with the optical filter mechanism to measure a property of the orthogonal component to measure the data.
    • 多变量光学计算和分析系统包括配置成沿第一射线路径辐射第一光的光源; 调制器,设置在第一射线路径中,调制器被配置为将第一光调制到期望的频率; 设置在所述调制器附近的光谱元件,所述光谱元件被配置为过滤所述第一光以获得样品的感兴趣的光谱范围; 设置成与所述光谱元件连通的空腔,所述空腔被配置为沿所述样品的方向引导所述第一光; 管,其设置在所述空腔附近,所述管被配置为接收和引导由来自所述样品的所述第一光的反射产生的第二光,所述管还被配置为分离所述第一和第二光; 分束器,被配置为将所述第二光分成第一光束和第二光束; 滤光器机构,设置成接收第一光束,滤光器机构被配置为将由第一光束承载的数据光学滤波成第一光束的至少一个正交分量; 以及与光学滤波器机构通信以测量正交分量的特性以测量数据的检测器机构。
    • 27. 发明申请
    • METHOD AND APPARATUS FOR MEASURING SCATTERED LIGHT ON AN OPTICAL SYSTEM
    • 用于测量光学系统上的散射光的方法和装置
    • US20100208254A1
    • 2010-08-19
    • US12703829
    • 2010-02-11
    • Michael ARNZ
    • Michael ARNZ
    • G01J3/40
    • G03F7/70941
    • A method of measuring scattered light on an optical system includes: providing a first measuring field and a second measuring field, both measuring fields respectively being either of a first light manipulation type or a second light manipulation type, which first light manipulation type is configured to cause incoming light to enter the optical system and which second light manipulation type is configured to prevent incoming light from entering the optical system, and both measuring fields respectively having a second light manipulation type reference structure and a respective measuring structure, which measuring structures are of the second light manipulation type in the case where the measuring fields are of the first light manipulation type, and are first light manipulation type regions of the measuring fields in the case where the measuring fields are of the second light manipulation type, wherein the measuring structures of the respective measuring fields are offset in different directions in relation to the respective reference structure, imaging the first measuring field with the optical system into an image plane and measuring a first light intensity produced herewith at a location in the region of the image of the reference structure of the first measuring field, and imaging the second measuring field with the optical system into the image plane and measuring a second light intensity produced herewith at a location in the region of the image of the reference structure of the second measuring field.
    • 测量光学系统上的散射光的方法包括:提供第一测量场和第二测量场,两个测量场分别是第一光操作类型或第二光操作类型,第一光操作类型被配置为 使得入射光进入光学系统,并且第二光操作类型被配置为防止入射光进入光学系统,并且两个测量场分别具有第二光操作型参考结构和相应的测量结构,测量结构为 在测量场是第一光操作型的情况下的第二光操作型,并且在测量场是第二光操作型的情况下是测量场的第一光操作型区域,其中测量结构 各个测量场的偏移量不同 与相应的参考结构相关的方向,将具有光学系统的第一测量场成像到图像平面中,并测量在此处产生的在第一测量场的参考结构的图像的区域中的位置处的第一光强;以及 使用光学系统将第二测量场成像到图像平面中,并且测量在第二测量场的参考结构的图像的区域中产生的第二光强度。
    • 30. 发明申请
    • OPTICAL MEASURING APPARATUS
    • 光学测量装置
    • US20100014079A1
    • 2010-01-21
    • US12480042
    • 2009-06-08
    • Tomoyu YAMASHITAMotoki IMAMURA
    • Tomoyu YAMASHITAMotoki IMAMURA
    • G01J3/40
    • G01N21/3581G01J3/42G01J11/00
    • An object of the present invention is to enable a change in a frequency for which an electric signal based on an optical signal is measured by a spectrum analyzer. An optical measurement device 1 includes a photoconductive switch 18 which receives predetermined pulse light from a first laser light source 11, and outputs terahertz light L1 having the same repetition frequency frep1 as the repetition frequency of the predetermined pulse light, a photoconductive switch 21 which receives the terahertz light L1 and a sampling light pulse L2, and outputs signal corresponding to a power of the terahertz light L1 at a time point when the sampling light pulse L2 is received, an RF spectrum analyzer 26 which measures a magnitude of the signal corresponding to a measured frequency which changes over time, an optical coupler 32 which outputs a simultaneous light pulse when the predetermined pulse light and the sampling light pulse L2 are simultaneously input, a photo detector 36 which converts the simultaneous light pulse into an electric signal as a trigger signal EXT, and an optical delay circuit 34 which delays the trigger signal EXT.
    • 本发明的目的是能够通过频谱分析仪来测量基于光信号的电信号的频率的变化。 光学测量装置1包括接收来自第一激光光源11的预定脉冲光的光电导开关18,并输出具有与预定脉冲光的重复频率相同的重复频率frep1的太赫兹光L1,光接收开关21接收 太赫兹光L1和采样光脉冲L2,在接收采样光脉冲L2的时间点输出与太赫兹光L1的功率相对应的信号; RF频谱分析器26,其测量对应于 随时间变化的测量频率,当同时输入预定脉冲光和采样光脉冲L2时输出同时光脉冲的光耦合器32,将同步光脉冲转换为电信号作为触发器的光电检测器36 信号EXT以及延迟触发信号EXT的光学延迟电路34。