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21. 发明申请

US20140286833A1 EX VIVO ANTIMICROBIAL DEVICES AND METHODS 有权
公开(公告)号：US20140286833A1
公开(公告)日：2014-09-25
申请号：US14090624
申请日：2013-11-26
申请人： ArgentumCidal Electrics, Inc.
发明人： Thomas A. FULLER , Richard WYSK , Wayne J. SEBASTIANELLI , Paul H. COHEN , Robert C. VOIGT
IPC分类号： A61L2/14
CPC分类号： A61L2/03 , A61L2/14 , A61L2/238 , E05B1/0069 , H01J27/022 , H01J27/22 , H01J27/26
摘要： A method and device for destroying and inhibiting exposure to microbes and infection includes a first element and a second element, and a power source. At least one of the elements includes antimicrobial metal, which, when energized by the power source, produces ions that are lethal to microbes. The device can be incorporated into virtually any useful object. During normal use of the object, electrical communication is established between the two elements, causing current supplied from the power source to flow through the antimicrobial metal. The two elements are configured and arranged to ensure that ions flowing from the antimicrobial metal flow through the region in which it is desired to kill microbes. The antimicrobial metal can be on the surface of the element, incorporated into the material making up the element, or provided in any other way that allows the antimicrobial effect to be achieved.

22. 发明授权

US08822949B2 Apparatus and method for thermal assisted desorption ionization systems 有权
标题翻译：热辅助解吸电离系统的装置和方法
公开(公告)号：US08822949B2
公开(公告)日：2014-09-02
申请号：US13364322
申请日：2012-02-02
申请人： Jordan Krechmer , Brian D. Musselman
发明人： Jordan Krechmer , Brian D. Musselman
IPC分类号： H01J49/30 , H01J37/08 , H01J49/12 , H01J49/04 , H01J27/26
CPC分类号： H01J49/049 , G01N27/622 , G01N27/626 , G01N27/64 , H01J27/26 , H01J49/004 , H01J49/04 , H01J49/0431 , H01J49/10 , H01J49/126 , H01J49/14 , H01J49/24 , Y10T436/24
摘要： The present invention is directed to a method and device to desorb an analyte using heat to allow desorption of the analyte molecules, where the desorbed analyte molecules are ionized with ambient temperature ionizing species. In various embodiments of the invention a current is passed through a mesh upon which the analyte molecules are present. The current heats the mesh and results in desorption of the analyte molecules which then interact with gas phase metastable neutral molecules or atoms to form analyte ions characteristic of the analyte molecules.
摘要翻译：本发明涉及一种使用热解析分析物以允许分析物分子解吸的方法和装置，其中解吸的分析物分子与环境温度电离物质电离。在本发明的各种实施方案中，电流通过其上存在分析物分子的网。电流加热网格并导致分析物分子的解吸，然后分析物分子与气相亚稳态的中性分子或原子相互作用以形成分析物分子特征的分析物离子。

23. 发明申请

US20140239837A1 ION GENERATION DEVICE AND ELECTRICAL APPARATUS 有权
标题翻译：离子发生装置和电子装置
公开(公告)号：US20140239837A1
公开(公告)日：2014-08-28
申请号：US14351594
申请日：2012-10-17
申请人： SHARP KABUSHIKI KAISHA
发明人： Kazuharu Date
IPC分类号： H01J27/26
CPC分类号： H01J27/26 , H01T19/04 , H01T23/00
摘要： An ion generation device includes: a high voltage generation circuit; and an ion generation element. The high voltage generation circuit includes: a capacitor; a high voltage transformer; a switching element; and a pulse signal generation portion which generates a pulse signal for controlling the turning on and off of the switching element. The pulse signal generation portion adjusts a pulse width of an on-period such that the pulse width of the on-period of the pulse signal is substantially equal to a time obtained by multiplying the reciprocal of an output voltage frequency at the time of a forward operation of the high voltage transformer by one-fourth.
摘要翻译：离子产生装置包括：高压发生电路; 和离子产生元件。高压发生电路包括：电容器; 高压变压器; 开关元件; 以及产生用于控制开关元件的导通和截止的脉冲信号的脉冲信号产生部分。脉冲信号产生部分调节接通周期的脉冲宽度，使得脉冲信号的导通周期的脉冲宽度基本上等于在前进时乘以输出电压频率的倒数而获得的时间高压变压器运行四分之一。

24. 发明授权

US08785849B2 Ultra high precision measurement tool 有权
标题翻译：超高精度测量工具
公开(公告)号：US08785849B2
公开(公告)日：2014-07-22
申请号：US12133298
申请日：2008-06-04
申请人： Juergen Frosien , Dieter Winkler , Udo Weigel , Stefan Grimm
发明人： Juergen Frosien , Dieter Winkler , Udo Weigel , Stefan Grimm
IPC分类号： G21K5/04
CPC分类号： H01J37/08 , H01J27/26 , H01J37/28 , H01J2237/004 , H01J2237/061 , H01J2237/0807 , H01J2237/244 , H01J2237/24514 , H01J2237/24535 , H01J2237/24564 , H01J2237/24578 , H01J2237/2594 , H01J2237/2623 , H01J2237/2816 , H01J2237/2817
摘要： A focused ion beam device is described comprising a gas field ion source with an analyzer for analyzing and classifying the structure of a specimen, a controller for controlling and/or modifying the structure of the specimen according to the analysis of the analyzer, an emitter tip, the emitter tip has a base tip comprising a first material and a supertip comprising a material different from the first material, wherein the supertip is a single atom tip and the base tip is a single crystal base tip. Furthermore, the focused ion beam device has a probe current control and a sample charge control. A method of operating a focused ion beam device is provided comprising applying a voltage between a single emission center of the supertip and an electrode, supplying gas to the emitter tip, analyzing and classifying the structure of a specimen, and controlling the structure of the specimen.
摘要翻译：描述了一种聚焦离子束装置，其包括气体离子源，其具有用于分析和分类样品结构的分析器，用于根据分析仪的分析来控制和/或改变样品的结构的控制器，发射器尖端发射极尖端具有包括第一材料和超高压头的基座尖端，所述第一材料和第一材料包括不同于所述第一材料的材料，其中所述超高压是单个原子尖端，并且所述基座尖端是单晶基底尖端。此外，聚焦离子束装置具有探针电流控制和样品充电控制。提供了一种操作聚焦离子束装置的方法，包括在超高压的单个发射中心和电极之间施加电压，向发射极尖端供应气体，分析和分类样品的结构，以及控制样品的结构。

25. 发明授权

US08754365B2 Apparatus and method for thermal assisted desorption ionization systems 有权
公开(公告)号：US08754365B2
公开(公告)日：2014-06-17
申请号：US13797409
申请日：2013-03-12
申请人： Ionsense Inc.
发明人： Jordan Krechmer , Brian D. Musselman
IPC分类号： G01N27/64 , H01J49/04 , H01J49/00 , G01N27/62
CPC分类号： H01J49/049 , G01N27/622 , G01N27/626 , G01N27/64 , H01J27/26 , H01J49/004 , H01J49/04 , H01J49/0431 , H01J49/10 , H01J49/126 , H01J49/14 , H01J49/24 , Y10T436/24
摘要： The present invention is directed to a method and device to desorb an analyte using heat to allow desorption of the analyte molecules, where the desorbed analyte molecules are ionized with ambient temperature ionizing species. In various embodiments of the invention a current is passed through a mesh upon which the analyte molecules are present. The current heats the mesh and results in desorption of the analyte molecules which then interact with gas phase metastable neutral molecules or atoms to form analyte ions characteristic of the analyte molecules.

26. 发明授权

US08709350B2 Compact ion accelerator source 有权
标题翻译：紧凑型离子加速器源
公开(公告)号：US08709350B2
公开(公告)日：2014-04-29
申请号：US13451459
申请日：2012-04-19
申请人： Thomas Schenkel , Arun Persaud , Rehan Kapadia , Ali Javey
发明人： Thomas Schenkel , Arun Persaud , Rehan Kapadia , Ali Javey
IPC分类号： B01J19/08
CPC分类号： G21G4/02 , B82Y30/00 , H01J27/26
摘要： An ion source includes a conductive substrate, the substrate including a plurality of conductive nanostructures with free-standing tips formed on the substrate. A conductive catalytic coating is formed on the nanostructures and substrate for dissociation of a molecular species into an atomic species, the molecular species being brought in contact with the catalytic coating. A target electrode placed apart from the substrate, the target electrode being biased relative to the substrate with a first bias voltage to ionize the atomic species in proximity to the free-standing tips and attract the ionized atomic species from the substrate in the direction of the target electrode.
摘要翻译：离子源包括导电衬底，衬底包括形成在衬底上的多个具有独立尖端的导电纳米结构。在纳米结构和衬底上形成导电催化涂层，用于将分子物质解离成原子物质，使分子物质与催化涂层接触。目标电极与衬底分开放置，目标电极相对于衬底被偏压，具有第一偏置电压，以将原子物质离子化成离开独立的尖端，并从衬底沿着方向吸引离子化的原子物质目标电极。

27. 发明授权

US08530865B2 Gas field ion source, charged particle microscope, and apparatus 有权
公开(公告)号：US08530865B2
公开(公告)日：2013-09-10
申请号：US13355104
申请日：2012-01-20
申请人： Hiroyasu Shichi , Shinichi Matsubara , Takashi Ohshima , Satoshi Tomimatsu , Tomihiro Hashizume , Tohru Ishitani
发明人： Hiroyasu Shichi , Shinichi Matsubara , Takashi Ohshima , Satoshi Tomimatsu , Tomihiro Hashizume , Tohru Ishitani
IPC分类号： H01J49/26 , H01J49/00 , H01J37/08
CPC分类号： H01J27/26 , H01J37/08 , H01J2237/0805 , H01J2237/0807 , H01J2237/182
摘要： A gas field ion source that can simultaneously increase a conductance during rough vacuuming and reduce an extraction electrode aperture diameter from the viewpoint of the increase of ion current. The gas field ion source has a mechanism to change a conductance in vacuuming a gas molecule ionization chamber. That is, the conductance in vacuuming a gas molecule ionization chamber is changed in accordance with whether or not an ion beam is extracted from the gas molecule ionization chamber. By forming lids as parts of the members constituting the mechanism to change the conductance with a bimetal alloy, the conductance can be changed in accordance with the temperature of the gas molecule ionization chamber, for example the conductance is changed to a relatively small conductance at a relatively low temperature and to a relatively large conductance at a relatively high temperature.

28. 发明申请

US20130228700A1 METHOD AND APPARATUS FOR A POROUS ELECTROSPRAY EMITTER 有权
公开(公告)号：US20130228700A1
公开(公告)日：2013-09-05
申请号：US13839064
申请日：2013-03-15
申请人： MASSACHUSETTS INSTITUTE OF TECHNOLOGY
发明人： Paulo C. Lozano , Natalya Anna Brikner , Chase Spencer Coffman
IPC分类号： H01J37/08 , C25F3/14
CPC分类号： H01J37/08 , C25F3/14 , F03H1/0012 , H01J9/025 , H01J27/26 , H01J2237/0802
摘要： An ionic liquid ion source can include a microfabricated body including a base and a tip. The body can be formed of a porous material compatible with at least one of an ionic liquid or room-temperature molten salt. The body can have a pore size gradient that decreases from the base of the body to the tip of the body, such that the at least one of an ionic liquid or room-temperature molten salt is capable of being transported through capillarity from the base to the tip.

29. 发明申请

US20130112138A1 PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME 有权
标题翻译：颗粒源及其制造方法
公开(公告)号：US20130112138A1
公开(公告)日：2013-05-09
申请号：US13726971
申请日：2012-12-26
申请人： 38th Research Institute, China Electronics Technology Group Corporation
发明人： Huarong LIU
IPC分类号： C23F4/02 , H01J1/00
CPC分类号： C23F4/02 , B82Y99/00 , H01J1/00 , H01J1/3044 , H01J9/025 , H01J27/26 , H01J37/04 , H01J37/06 , H01J37/073 , H01J37/08 , H01J2201/30415 , H01J2237/0807
摘要： The present disclosure provides a method for manufacturing a particle source, comprising: placing a metal wire in vacuum, introducing active gas and catalyst gas, adjusting a temperature of the metal wire, and applying a positive high voltage V to the metal wire to dissociate the active gas at the surface of the metal wire, in order to generate at a peripheral surface of the head of the metal wire an etching zone in which field induced chemical etching (FICE) is performed; increasing by the FICE a surface electric field at the top of the metal wire head to be greater than the to evaporation field of the material for the metal wire, so that metal atoms at the wire apex are evaporated off; after the field evaporation is activated by the FICE, causing mutual adjustment between the FICE and the field evaporation, until the head of the metal wire has a shape of combination of a base and a tip on the base; and stopping the FICE and the field evaporation when the head of the metal wire takes a predetermine shape.
摘要翻译：本公开提供了一种制造颗粒源的方法，包括：将金属丝放置在真空中，引入活性气体和催化剂气体，调节金属丝的温度，以及向金属丝施加正高电压V以使在金属线的表面处的活性气体，以在金属线的头部的外周表面上产生进行场诱导化学蚀刻（FICE）的蚀刻区域; 通过FICE增加金属丝头顶部的表面电场大于金属线材料的蒸发场，使金属丝顶端的金属原子蒸发掉; 在通过FICE激活场蒸发之后，引起FICE和场蒸发之间的相互调节，直到金属丝的头部具有基部和底部的尖端的组合的形状; 并且当金属丝的头部具有预定形状时，停止FICE和场蒸发。

30. 发明申请

US20130099133A1 FOCUSED ION BEAM APPARATUS 有权
标题翻译：聚焦离子束设备
公开(公告)号：US20130099133A1
公开(公告)日：2013-04-25
申请号：US13654509
申请日：2012-10-18
申请人： Anto YASAKA , Fumio ARAMAKI , Yasuhiko SUGIYAMA , Tomokazu KOZAKAI , Osamu MATSUDA
发明人： Anto YASAKA , Fumio ARAMAKI , Yasuhiko SUGIYAMA , Tomokazu KOZAKAI , Osamu MATSUDA
IPC分类号： G21K5/04
CPC分类号： H01J27/024 , H01J27/26 , H01J37/08 , H01J37/3056 , H01J2237/0807 , H01J2237/182
摘要： Provided is a focused ion beam apparatus including a gas field ion source, the gas field ion source including: an emitter (41) for emitting an ion beam (1); an ion source chamber (40) for containing the emitter (41); a gas supply unit (46) for supplying nitrogen to the ion source chamber (40); an extracting electrode (49) to which a voltage for ionizing the nitrogen and for extracting nitrogen ions is applied; and a temperature control unit (34) for cooling the emitter (41).
摘要翻译：提供了一种包括气体离子源的聚焦离子束装置，该气体场离子源包括：用于发射离子束（1）的发射体（41）; 离子源室（40），用于容纳发射器（41）; 用于向离子源室（40）供给氮气的气体供给单元（46）; 提供用于电离氮并用于提取氮离子的电压的提取电极（49）; 和用于冷却发射器（41）的温度控制单元（34）。

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