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    • 21. 发明授权
    • System and method for detecting data stored in multi-bit memory cells
    • 用于检测存储在多位存储单元中的数据的系统和方法
    • US09196374B1
    • 2015-11-24
    • US14492418
    • 2014-09-22
    • Marvell International Ltd.
    • Xueshi YangZining Wu
    • G11C16/04G11C16/26G11C11/56
    • G11C16/26G11C11/5642G11C16/3436
    • A control module for a memory system including a plurality of multi-bit memory cells. The control module includes a read module configured to receive, from a first storage region of a first memory cell of the plurality of multi-bit memory cells, a first signal, and generate a second signal based on the first signal. A signal detection module is configured to determine distances between the second signal and respective estimates of a plurality of noiseless signals associated with the first memory cell. The noiseless signals correspond to a combination of an ideal signal and an interference signal. The signal detection module is further configured to determine, from the estimates of the plurality of noiseless signals, a noiseless signal that matches most closely to the second signal. A data conversion module is configured to detect data stored in the first storage region based on the noiseless signal that matches most closely to the second signal.
    • 一种用于包括多个多位存储器单元的存储器系统的控制模块。 控制模块包括读取模块,其被配置为从多个多位存储器单元中的第一存储单元的第一存储区域接收第一信号,并且基于第一信号生成第二信号。 信号检测模块被配置为确定第二信号与与第一存储器单元相关联的多个无噪声信号的相应估计之间的距离。 无噪声信号对应于理想信号和干扰信号的组合。 信号检测模块还被配置为从多个无噪声信号的估计中确定与第二信号最紧密匹配的无噪声信号。 数据转换模块被配置为基于与第二信号最紧密匹配的无噪声信号来检测存储在第一存储区域中的数据。
    • 24. 发明申请
    • ECC METHOD FOR FLASH MEMORY
    • 闪存存储器的ECC方法
    • US20150205665A1
    • 2015-07-23
    • US14158613
    • 2014-01-17
    • Macronix International Co., Ltd.
    • Nai-Ping KuoShih-Chang HuangChin-Hung ChangKen-Hui ChenKuen-Long ChangChun-Hsiung Hung
    • G06F11/10
    • G06F11/1048G06F2212/1036G11C16/3436
    • A method of operating a memory storing data sets, and ECCs for the data sets is provided. The method includes when writing new data in a data set, computing and storing an ECC, if a number of addressable segments storing the new data and data previously programmed in the data set includes at least a predetermined number of addressable segments. The method includes storing indications for whether to enable or disable use of the ECCs, using the ECC and a first additional ECC bit derived from the ECC. The method includes reading from a data set an extended ECC including an ECC and a first additional ECC bit derived from the ECC, and enabling or disabling use of the ECC according to the indications stored for the data set. The method includes enabling use of ECCs for blank data sets, using the indications and a second additional ECC bit.
    • 提供了一种操作存储数据集的存储器和数据集的ECC的方法。 如果存储新数据的多个可寻址段和先前在数据集中编程的数据包括至少预定数量的可寻址段,则该方法包括在将新数据写入数据集时,计算和存储ECC。 该方法包括使用ECC和从ECC导出的第一附加ECC比特来存储是否启用或禁止使用ECC的指示。 该方法包括从数据集读取包括ECC的扩展ECC和从ECC导出的第一附加ECC位,以及根据为数据集存储的指示启用或禁用ECC的使用。 该方法包括使用所述指示和第二附加ECC位使能ECC空白数据集。
    • 27. 发明授权
    • Non-volatile memory device
    • 非易失性存储器件
    • US09030875B2
    • 2015-05-12
    • US13716511
    • 2012-12-17
    • Samsung Electronics Co., Ltd.
    • Tomohisa Miyamoto
    • G11C16/04G11C16/06G11C16/08G11C16/26G11C16/32G11C16/34
    • G11C16/06G11C16/0483G11C16/08G11C16/26G11C16/32G11C16/3436
    • A non-volatile memory device includes a memory cell array in which a plurality of bit lines intersect a plurality of word lines and a non-volatile memory cell is disposed at each intersection, a page buffer which is provided for each bit line and which includes a latch configured to store data to be written to a memory cell connected to a word line selected from among the plurality of word lines or data read from the memory cell, and a control circuit configured to control a data input time from the bit line to the page buffer and a data detection time of the latch according to a voltage level of a common source line connected to sources of the respective bit lines during an operation of reading data from the memory cell.
    • 非易失性存储器件包括存储单元阵列,其中多个位线与多条字线相交,并且非易失性存储单元设置在每个交叉点处,为每个位线提供的页缓冲器,其包括 锁存器,被配置为存储要写入到与从所述多个字线中选择的字线连接的存储器单元或从所述存储单元读取的数据的数据;以及控制电路,被配置为控制从所述位线到 所述页缓冲器和所述锁存器的数据检测时间根据在从所述存储器单元读取数据的操作期间连接到各个位线的源的公共源极线的电压电平。
    • 28. 发明授权
    • Nonvolatile memory device and method of operating the same
    • 非易失存储器件及其操作方法
    • US09019773B2
    • 2015-04-28
    • US14037582
    • 2013-09-26
    • Samsung Electronics Co., Ltd.
    • Il Han ParkSeung-Bum Kim
    • G11C16/04G11C16/06G11C16/34G11C11/56
    • G11C16/3445G11C11/5635G11C16/0483G11C16/3436G11C16/344
    • A nonvolatile memory device includes a memory cell array and control logic. The memory cell array includes multiple memory blocks, each memory block including memory cells connected to word lines and bit lines. The control logic is configured to perform an erase operation in which an erase voltage is applied to a memory block of the multiple memory blocks to erase the memory cells of the memory block, and in which an erase verification voltage is applied a selected word line of the memory block to verify respective erase states of memory cells connected to the selected word line. The control logic is further configured to apply a read voltage to the selected word line to extract erase state information of the memory cells, and to control a level of the erase verification voltage based on the erase state information.
    • 非易失性存储器件包括存储单元阵列和控制逻辑。 存储单元阵列包括多个存储块,每个存储块包括连接到字线和位线的存储器单元。 控制逻辑被配置为执行擦除操作,其中擦除电压被施加到多个存储块的存储块以擦除存储块的存储单元,并且其中擦除验证电压被施加到所选择的字线 所述存储块用于验证连接到所选字线的存储单元的相应擦除状态。 控制逻辑还被配置为向所选字线施加读取电压以提取存储器单元的擦除状态信息,并且基于擦除状态信息来控制擦除验证电压的电平。