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    • 28. 发明授权
    • Optical measuring device
    • 光学测量装置
    • US07911610B2
    • 2011-03-22
    • US11996057
    • 2006-01-17
    • Naoji MoriyaYuzo NagumoYukihisa WadaNaofumi SakauchiFujio InoueMasahiro TakebeKenji TakuboShinichiro Totoki
    • Naoji MoriyaYuzo NagumoYukihisa WadaNaofumi SakauchiFujio InoueMasahiro TakebeKenji TakuboShinichiro Totoki
    • G01N21/00
    • G01N15/0211G01N21/4788G01N2021/1721
    • The present invention relates to an optical measuring device which includes container for storing a sample, and an electrode pair for generating an electric field distribution upon impression of a voltage by an electrical power supply, thereby generating or extinguishing diffraction grating formed by a density modulation of particles within the sample. The particles within the sample are evaluated based upon a temporal change of an intensity of a diffracted light beam obtained by irradiating a light beam upon the diffraction grating formed by the density modulation of the particles. The electrodes constituting the electrode pair are configured to have a comb-like electrode teeth that are parallel with each other and are arranged such that the electrode teeth of one electrode are inserted between the electrode teeth of the other electrode. From such configuration, an optical measuring device of a high sensitivity and excellent S/N ratio can be obtained.
    • 本发明涉及一种光学测量装置,该光学测量装置包括用于存储样品的容器和用于通过电源印制电压而产生电场分布的电极对,由此产生或熄灭由密度调制形成的衍射光栅 样品内的颗粒。 基于通过对通过颗粒的密度调制形成的衍射光栅照射光束而获得的衍射光束的强度的时间变化来评估样品内的颗粒。 构成电极对的电极被构造为具有彼此平行的梳状电极齿,并且被布置成使得一个电极的电极齿插入另一个电极的电极齿之间。 由此,可以得到灵敏度高,S / N比优异的光学测量装置。
    • 30. 发明申请
    • Particle diameters measuring method and device
    • 粒径测量方法和装置
    • US20080049213A1
    • 2008-02-28
    • US11785803
    • 2007-04-20
    • Yukihisa Wada
    • Yukihisa Wada
    • G01N1/00
    • G01N21/45G01N2013/003G01N2015/0038G01N2015/0693G01N2021/458
    • The invention provides particle diameters measuring method and device capable of preventing noise from occurring due to an error in the formation of electrodes, capable of obtaining a high S/N ratio and the diffusion coefficients of the particles to be measured, and capable of exactly measuring the particle diameters of minute particles, such as nanoparticles. A particle diameters measuring method includes: forming a concentration gradient of a particles to be measured by impressing an electric field upon a sample in which the particles are movably dispersed within a medium through an electrode pair 2 provided to be in contact with or close to the sample; detecting a refractive index at a portion where the concentration gradient is formed by introducing a light beam Ls to a portion where the concentration gradient is formed and which is apart from the electrode pair 2 by a predetermined distance; obtaining a diffusion coefficients of the particles to be measured within the medium from a temporal variation in the refractive index after the impression of the electric field upon the particles stops or changes; and calculating the particle diameters of particles to be measured by applying the diffusion coefficients to Einstein-Stokes equation.
    • 本发明提供了能够防止由于电极形成错误而产生的噪声的粒径测量方法和装置,其能够获得高的S / N比和待测量的颗粒的扩散系数,并且能够精确测量 微粒的粒径,如纳米粒子。 粒径测量方法包括:通过将电场施加到其中颗粒通过设置成与介质接触或接近的电极对2中可移动地分散在介质中的样品上来形成待测量的颗粒的浓度梯度 样品; 通过将光束Ls引入到形成浓度梯度的部分并且与电极对2分开预定距离来检测在形成浓度梯度的部分处的折射率; 在颗粒上的电场的印模停止或变化之后,从折射率的时间变化中获得待测介质颗粒的扩散系数; 并通过将扩散系数应用于爱因斯坦 - 斯托克斯方程来计算要测量的颗粒的粒径。