会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 22. 发明授权
    • Exposure apparatus including interferometer system
    • 曝光装置包括干涉仪系统
    • US06819433B2
    • 2004-11-16
    • US10073593
    • 2002-02-12
    • Ryo TakaiKazunori Iwamoto
    • Ryo TakaiKazunori Iwamoto
    • G01B902
    • G03F7/70691G01B11/028G01B11/245
    • To accurately measure the position and posture of a stage apparatus used in an exposure apparatus or the like, the Z position and displacement of a top stage (27) are measured using as a reference a lens barrel support (35) independently of the top stage in terms of vibrations by an interferometer system which includes a projection optical system (34) for projecting a pattern formed on a master onto a substrate, stages (27, 31, 40) capable of moving with respect to the projection optical system (34) while holding the substrate or master, and a lens barrel support (35) that supports the projection optical system (34), and which uses a Z measuring mirror (30) that is arranged on a Y stage (31) and has a reflecting surface almost parallel to the XY plane, and a Z interferometer (25) arranged on the Y stage (31).
    • 为了精确地测量在曝光设备等中使用的舞台装置的位置和姿势,以独立于顶级的镜头筒支撑件(35)为基准来测量顶级(27)的Z位置和位移, 在通过干涉仪系统的振动方面,包括用于将形成在母板上的图案投影到基板上的投影光学系统(34),能够相对于投影光学系统(34)移动的台(27,31,40) 同时保持基板或主机,以及支撑投影光学系统(34)的镜筒支撑件(35),并且使用布置在Y台(31)上的Z测量镜(30)并具有反射表面 几乎平行于XY平面,以及布置在Y平台(31)上的Z干涉仪(25)。
    • 24. 发明授权
    • Scanning exposure apparatus
    • 扫描曝光装置
    • US6008885A
    • 1999-12-28
    • US941629
    • 1997-09-29
    • Kazuhiro TakahashiKazunori Iwamoto
    • Kazuhiro TakahashiKazunori Iwamoto
    • G03F7/20H01L21/027G03B27/54G03B27/42
    • G03F7/70058G03F7/70358G03F7/70691G03F7/70833
    • A scanning exposure apparatus includes a light source, an illumination optical system for forming a secondary light source with light from the light source, and for illuminating a portion of a reticle having a pattern, a projection optical system for projecting the pattern of the reticle as illuminated, onto a wafer, a reticle stage for supporting the reticle and for scanningly moving the reticle in a predetermined scan direction, relative to the projection optical system, a wafer stage for supporting the wafer and for scanningly moving the wafer relative to the projection optical system, and a base for supporting the reticle stage and being supported by dampers, wherein the illumination optical system is divided into a first portion being supported by the base and a second portion supported by a floor, independently from the base, and wherein the predetermined direction of the reticle stage is substantially or approximately parallel to an optical axis direction at a location where the illumination optical system is divided.
    • 扫描曝光装置包括光源,用于利用来自光源的光形成二次光源并照射具有图案的掩模版的一部分的照明光学系统,用于将掩模版的图案投影的投影光学系统 照射到晶片上,用于支撑掩模版并且相对于投影光学系统以预定扫描方向扫描地移动掩模版的光罩台,用于支撑晶片并用于相对于投影光学器件扫描地移动晶片的晶片台 系统,以及用于支撑标线台并由阻尼器支撑的基座,其中所述照明光学系统被分为由所述基座支撑的第一部分和由所述基座独立地由地板支撑的第二部分,并且其中所述预定 标线片台的方向基本上或近似平行于光轴的方向 照明光学系统划分。