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    • 23. 发明授权
    • CVD film formation method
    • CVD膜形成方法
    • US06169032A
    • 2001-01-02
    • US09102911
    • 1998-06-23
    • Seishi MurakamiTatsuo Hatano
    • Seishi MurakamiTatsuo Hatano
    • H01L2144
    • C23C16/34C23C16/46C23C16/54H01L21/67017H01L21/76843
    • The present invention provides an apparatus and method for forming a film by loading an object to be processed into a process chamber, moving up supporting pins to receive the susceptor, heating the object to be processed with heat radiation for a predetermined time by means of a heater housed in the susceptor while the supporting pins is being moved up, mounting the object to be processed on the susceptor, introducing arbitrarily chosen gases to adjust an inner pressure and temperature in accordance with the film formation conditions, and introducing a raw material gas into the process chamber, thereby starting film formation. After completion of the film-formation, only the supply of the raw material gas is stopped, whereas supply of other gases is gradually stopped. When the object to be processed is unloaded from the process chamber after completion of the film formation process, first, supporting pins are moved up to move the object to be processed away from the heater housed in the susceptor. The object to be processed is cooled in this manner. By virtue of a series of operations, a rapid change temperature and, a rapid change in pressure applied to the object to be processed is avoided, resulting in preventing a rapid temperature change.
    • 本发明提供了一种用于通过将待加工物体加载到处理室中形成膜的装置和方法,使支撑销向上移动以接收基座,通过热辐射将热处理的物体加热预定时间 收纳在基座上的加热器,同时支撑销向上移动,将待处理对象安装在基座上,引入任意选择的气体,以根据成膜条件调节内部压力和温度,并将原料气体引入 处理室,从而开始成膜。 在成膜完成之后,仅停止供应原料气体,而逐渐停止供应其它气体。 当在成膜处理完成之后待处理物体从处理室中卸载时,首先,向上移动支撑销以将被处理物体从容纳在基座中的加热器移开。 以这种方式冷却被处理物体。 通过一系列操作,避免了快速变化的温度和施加到待处理物体上的压力的快速变化,从而防止了快速的温度变化。
    • 26. 发明授权
    • Semiconductor processing apparatus
    • 半导体处理装置
    • US5462603A
    • 1995-10-31
    • US265139
    • 1994-06-24
    • Seishi Murakami
    • Seishi Murakami
    • H01L21/205C23C16/44C23C16/458C23C16/46H01L21/00H01L21/302H01L21/3065C23C16/00
    • H01L21/67115C23C16/4586C23C16/46H01L2924/0002
    • A CVD apparatus for a semiconductor wafer comprises a process chamber made of aluminum. A cylindrical quartz made case having a lower end opening is provided in the process chamber to mount the wafer. A flange of the lower end of the case is airtightly connected to a bottom wall of the process chamber to surround an opening formed in the bottom wall of the process chamber. The inner space of the case is airtightly isolated from a process space. The opening of the bottom wall is closed by a cover from the outside of the process chamber. A resistance heating body is provided in the case to be opposite to a top plate. Feed lines, and a thermocouple are introduced into the case from an atmospheric side through the cover. An inactive gas supply pipe and an exhausting pipe are connected to the cover. The inside of the case is in an inactive gas atmosphere, and oxidation of the resistance heating body is prevented.
    • 用于半导体晶片的CVD装置包括由铝制成的处理室。 在处理室中设置具有下端开口的圆柱形石英制壳体以安装晶片。 壳体下端的凸缘气密地连接到处理室的底壁,以围绕形成在处理室的底壁中的开口。 外壳的内部空间与工艺空间密封隔离。 底壁的开口由处理室外部的盖子封闭。 在壳体中设置与顶板相反的电阻加热体。 进料管线和热电偶从大气层通过盖子引入壳体。 无源气体供给管和排气管连接到盖。 壳体内部处于惰性气体气氛中,防止电阻加热体的氧化。