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    • 21. 发明申请
    • MONITORING AND DIAGNOSING DEVICE FOR WORKING MACHINE
    • 工作机械监控与诊断装置
    • US20120317444A1
    • 2012-12-13
    • US13575668
    • 2010-01-28
    • Hideaki SuzukiYoshinori FurunoKozo NakamuraShinya YudaHiroki Uchiyama
    • Hideaki SuzukiYoshinori FurunoKozo NakamuraShinya YudaHiroki Uchiyama
    • G06F11/30
    • E02F9/2025B66C13/16E02F9/264E02F9/267G05B23/0278G06Q10/06
    • Monitoring and diagnosing device including: a classification information storage section; frequency information storage section; a first data classifier section reading out reference classification information from the classification information storage section, comparing operational data, detected by a plurality of sensors and inputted in time sequence, with the reference classification information to classify the operational data, and then generating operational data classification information; a frequency comparator section compiling the operational data classification information, generating operational data frequency information by adding, to the operational data classification information, appearance frequency information for each classification of operational data, reading out reference frequency information from the frequency information storage section, and then generating operational data frequency comparison information by comparing operational data frequency information with the reference frequency information; and an abnormality diagnosing section performing an abnormality diagnosis upon the working machine by use of the operational data classification information and operational data frequency comparison information.
    • 监测和诊断装置包括:分类信息存储部分; 频率信息存储部分; 从分类信息存储部分读取参考分类信息的第一数据分类器部分,将由多个传感器检测并且按时间顺序输入的操作数据与参考分类信息进行比较,以分类操作数据,然后生成操作数据分类 信息; 频率比较器部分,编译操作数据分类信息,通过向操作数据分类信息添加用于操作数据的每个分类的出现频率信息,从频率信息存储部分读出参考频率信息,生成操作数据频率信息,然后 通过将操作数据频率信息与参考频率信息进行比较来产生操作数据频率比较信息; 以及异常诊断部,其通过使用所述操作数据分类信息和操作数据频率比较信息对所述作业机进行异常诊断。
    • 22. 发明申请
    • FAILURE CAUSE DIAGNOSIS SYSTEM AND METHOD
    • 故障原因诊断系统和方法
    • US20120310597A1
    • 2012-12-06
    • US13578034
    • 2010-02-26
    • Hiroki UchiyamaShinya YudaHideaki SuzukiKozo Nakamura
    • Hiroki UchiyamaShinya YudaHideaki SuzukiKozo Nakamura
    • G06F15/00
    • G05B23/0221G05B23/0278G05B2219/24019G05B2219/24042
    • Conditional base maintenance has been gaining widespread acceptance, with numerous sensors attached to equipment for constant monitoring of its operational state, the resulting sensor data being compared with those about the equipment in the normal state for a diagnosis to determine whether the equipment is currently operating normally, the result of the diagnosis being used to conduct maintenance. Conditional base maintenance can rapidly detect aging deterioration of the equipment, so that abnormal sates that were not detected before in time base maintenance can now be detected. However, although conventional diagnosis technology can distinguish between the normal state and anomaly, it has been difficult with such technology to identify causes including abnormal phenomena and parts. If it is determined that the target equipment to be diagnosed deviates from the normal state, the degree of deviation of each parameter from the normal state as the reference is calculated as an abnormal contribution ratio. A failure cause is estimated from a similarity ratio between the calculated abnormal contribution ratio and the abnormal contribution ratio of each of the failure causes collected in the past and including failure phenomena and failure parts.
    • 有条件的基地维护得到了广泛的接受,许多传感器连接到设备上,用于持续监控其运行状态,所得到的传感器数据与正常状态下的设备进行比较,以进行诊断,以确定设备是否正常运行 ,诊断结果用于进行维护。 有条件的基座维护可以快速检测设备的老化恶化,从而可以检测到在时基维护中未检测到的异常状态。 然而,虽然常规诊断技术可以区分正常状态和异常现象,但是通过这种技术难以识别出异常现象和部件的原因。 如果确定要诊断的目标设备偏离正常状态,则将每个参数与作为基准的正常状态的偏差程度计算为异常贡献率。 根据计算出的异常贡献率与过去收集的每个故障原因的异常贡献率,包括故障现象和故障部分之间的相似度估计故障原因。
    • 23. 发明申请
    • DIAGNOSIS SYSTEM AND DIAGNOSIS METHOD FOR CONSTRUCTION MACHINE
    • 建筑机械诊断系统及诊断方法
    • US20120209570A1
    • 2012-08-16
    • US13502896
    • 2009-10-19
    • Hiroki UchiyamaYoshinori FurunoHideaki SuzukiKozo Nakamura
    • Hiroki UchiyamaYoshinori FurunoHideaki SuzukiKozo Nakamura
    • G06F15/00
    • E02F9/2025E02F9/267G06Q10/20
    • Provided is a construction machine diagnosing system and method in which even a user who has little knowledge of any procedures and techniques for diagnosing construction machines can speedily diagnose a desired machine in a manner appropriate for particular data characteristics of the machine.A diagnosis device 10 acquires diagnostic data from a diagnostic data storage device 30, extracts data characteristics from the information contained in the diagnostic data, acquires from a diagnostic knowledge storage device 20 any diagnosing techniques considered to be effective for the data characteristics, and presents to a user the diagnosing techniques along with respective degrees of effectiveness. The user uses the presented degrees of effectiveness to select a desired diagnosing technique and conduct a diagnosis. In addition, in order to make effective use of the diagnostic knowledge stored within the diagnostic knowledge storage device 20, a diagnostic knowledge generating section 107 classifies common data characteristics by elements of diagnosing techniques and stores the classified data characteristics and the elements of the diagnosing techniques, as new diagnostic knowledge.
    • 提供了一种施工机械诊断系统和方法,其中即使对于用于诊断施工机械的任何程序和技术知之甚少的用户也可以以适合于机器的特定数据特性的方式快速地诊断期望的机器。 诊断装置10从诊断数据存储装置30获取诊断数据,从诊断数据中包含的信息中提取数据特征,从诊断知识存储装置20获取被认为对数据特性有效的诊断技术, 用户诊断技术以及相应的有效性程度。 用户使用呈现的有效性来选择所需的诊断技术并进行诊断。 此外,为了有效利用存储在诊断知识存储装置20内的诊断知识,诊断知识生成部107通过诊断技术的要素对公共数据特征进行分类,并存储分类数据特征和诊断技术的要素 ,作为新的诊断知识。
    • 24. 发明申请
    • DISPLAY DEVICE AND ELECTRIC APPARATUS USING THE SAME
    • 显示装置和使用该装置的电子装置
    • US20110304656A1
    • 2011-12-15
    • US13202083
    • 2009-09-24
    • Shun UekiToshiki MatsuokaKozo NakamuraTakuma Tomotoshi
    • Shun UekiToshiki MatsuokaKozo NakamuraTakuma Tomotoshi
    • G09G5/10G09G5/00
    • G02B26/004
    • A display device (10) includes an upper substrate (first substrate) (2), a lower substrate (second substrate) (3), and a conductive liquid (16) that is sealed in a display space (S) formed between the upper substrate (2) and the lower substrate (3) so as to be moved toward an effective display region (P1) or a non-effective display region (P2). Ribs (14) are provided on the lower substrate (3) so as to partition the inside of the display space (S) in accordance with each of a plurality of pixel regions (P). The ribs (14) include first rib members (14a) formed in a perpendicular direction perpendicular to the direction of movement of the conductive liquid (16) and second rib members (14b) formed in a parallel direction parallel to the direction of movement of the conductive liquid (16). Clearances (K) are formed between each of the ends of the first and second rib members (14a, 14b).
    • 显示装置(10)包括上基板(第一基板)(2),下基板(第二基板)(3)和导电液体(16),该导电液体密封在形成在上部 基板(2)和下基板(3)移动以朝向有效显示区域(P1)或非有效显示区域(P2)移动。 肋(14)设置在下基板(3)上,以便根据多个像素区域(P)中的每一个来分隔显示空间(S)的内部。 肋(14)包括沿与垂直于导电液体(16)的运动方向垂直的垂直方向形成的第一肋构件(14a)和形成在平行于所述导电液体(16)的运动方向的平行方向上的第二肋构件 导电液体(16)。 间隙(K)形成在第一和第二肋构件(14a,14b)的每个端部之间。
    • 27. 发明申请
    • SILICON WAFER HEAT TREATMENT METHOD
    • 硅波热处理方法
    • US20100075267A1
    • 2010-03-25
    • US12443365
    • 2007-09-28
    • Shinya SadoharaKozo NakamuraShiro Yoshino
    • Shinya SadoharaKozo NakamuraShiro Yoshino
    • C30B15/14
    • H01L21/324H01L21/3225H01L22/12
    • A silicon wafer preferable to a semiconductor device is produced by determining a heat treatment condition hardly causing slip dislocations and heat-treating the silicon wafer under the condition. The resistance is calculated by using a calculation formula used for predicting the slip resistance of the wafer from the density, size, and residual solid-solution oxygen concentration of the oxygen precipitation in the silicon wafer, the state of oxygen precipitation such that heat treatment not causing any slip dislocation can be carried out is designed, and thus a silicon wafer heat treatment method under the heat treatment condition not causing any slip dislocation is determined. A silicon wafer heat-treated under such a condition can be provided.
    • 通过确定在该条件下几乎不引起滑移位错和热处理硅晶片的热处理条件来制造优于半导体器件的硅晶片。 通过使用用于从硅晶片中的氧沉淀的密度,尺寸和残留固溶度氧浓度来预测晶片的滑动阻力的计算公式,氧沉淀的状态使得不进行热处理来计算电阻 导致任何滑移位错都可以进行设计,因此硅片热处理方法在热处理条件下不会产生滑脱错位。 可以提供在这种条件下热处理的硅晶片。
    • 28. 发明授权
    • Liquid crystal display device
    • 液晶显示装置
    • US07599021B2
    • 2009-10-06
    • US10564818
    • 2004-07-21
    • Kazuhiko TsudaShun UekiKozo NakamuraTokio Taguchi
    • Kazuhiko TsudaShun UekiKozo NakamuraTokio Taguchi
    • G02F1/1335
    • G02F1/133615G02B6/0056G02F1/13362G02F1/13471G02F2001/133618G02F2001/133626
    • A liquid crystal display device includes, from its back surface side towards its front surface side: a polarization selective reflection plate (12) which reflects x-directional linearly polarized light and transmits y-directional linearly polarized light; a first polarizing plate (4) which transmits the x-directional linearly polarized light; a liquid crystal display panel (13); and a second polarizing plate (8) which transmits the y-directional linearly polarized light. The polarization selective reflection plate (12) is arranged only on a back surface side of the liquid crystal display panel (13). The y-directional linearly polarized light incident on the back surface side is reflected from the polarization selective reflection plate (12), there by protecting privacy. The x-directional linearly polarized light transmitted reaches the front surface side, via the first polarizing plate (4), the liquid crystal display panel (13), and the second polarizing plate (8). In this way, it is possible to realize a liquid crystal display device which is capable of performing a good screen displaying even under a strong surrounding light environment.
    • 液晶显示装置从其背面侧朝向其前表面侧包括:反射x方向的线偏振光并透射y方向的线偏振光的偏振选择反射板(12) 第一偏振片(4),其透射x方向的线偏振光; 液晶显示面板(13); 以及透射y方向的直线偏振光的第二偏振板(8)。 偏振选择反射板(12)仅布置在液晶显示面板(13)的背面侧。 通过保护隐私,偏振选择反射板(12)反射入射在背面侧的y方向的直线偏振光。 通过第一偏振板(4),液晶显示面板(13)和第二偏振片(8),透射的x方向的直线偏振光到达前表面侧。 以这种方式,可以实现即使在强烈的环境光环境下也能够进行良好的屏幕显示的液晶显示装置。