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    • 22. 发明授权
    • Semiconductor device
    • 半导体器件
    • US07872308B2
    • 2011-01-18
    • US12332260
    • 2008-12-10
    • Miwako AkiyamaYusuke KawaguchiYoshihiro Yamaguchi
    • Miwako AkiyamaYusuke KawaguchiYoshihiro Yamaguchi
    • H01L29/76
    • H01L29/7813H01L21/26586H01L29/0634H01L29/0869H01L29/0878H01L29/1095H01L29/41741H01L29/41766H01L29/66727H01L29/66734
    • A semiconductor device includes: a first semiconductor layer of a first conductivity type; a second semiconductor layer of the first conductivity type provided on a main surface of the first semiconductor layer and having a lower impurity concentration than that of the first semiconductor layer; a third semiconductor layer of a second conductivity type provided on the second semiconductor layer; a fourth semiconductor layer of the first conductivity type selectively provided on the third semiconductor layer; a gate electrode provided in a trench passing through the third semiconductor layer and reaching the second semiconductor layer; a first main electrode contacting the fourth semiconductor layer and contacting the third semiconductor layer through a contact groove provided to pass through the fourth semiconductor layer between the contiguous gate electrodes; a second main electrode provided on an opposite surface to the main surface of the first semiconductor layer; and a fifth semiconductor layer of the second conductivity type provided in an interior portion of the second semiconductor layer corresponding to a part under the contact groove. An uppermost portion of the fifth semiconductor layer contacts the third semiconductor layer, a lowermost portion of the fifth semiconductor layer has a higher impurity concentration than that of the other portion in the fifth semiconductor layer and is located in the second semiconductor layer and not contacting the first semiconductor layer, and the fifth semiconductor layer is narrower from the uppermost portion to the lower most portion.
    • 半导体器件包括:第一导电类型的第一半导体层; 第一导电类型的第二半导体层设置在第一半导体层的主表面上并且具有比第一半导体层的杂质浓度低的第二半导体层; 设置在第二半导体层上的第二导电类型的第三半导体层; 选择性地设置在第三半导体层上的第一导电类型的第四半导体层; 设置在穿过所述第三半导体层并到达所述第二半导体层的沟槽中的栅电极; 与所述第四半导体层接触的第一主电极,并且通过设置成在所述连续的栅电极之间穿过所述第四半导体层的接触槽使所述第三半导体层接触; 设置在与所述第一半导体层的主表面相反的表面上的第二主电极; 以及第二导电类型的第五半导体层,设置在与所述接触槽下方的部分对应的所述第二半导体层的内部。 第五半导体层的最上部与第三半导体层接触,第五半导体层的最下部分的杂质浓度比第五半导体层中的其他部分杂质浓度高,位于第二半导体层中, 第一半导体层,第五半导体层从最上部到最下部较窄。
    • 23. 发明申请
    • PLASMA TORCH, PLASMA TORCH NOZZLE, AND PLASMA-WORKING MACHINE
    • 等离子喷枪,等离子喷枪喷嘴和等离子工作机
    • US20100155373A1
    • 2010-06-24
    • US12600616
    • 2008-06-27
    • Yoshihiro YamaguchiKazuhiro Kuraoka
    • Yoshihiro YamaguchiKazuhiro Kuraoka
    • B23K10/00
    • H05H1/34H05H2001/3426H05H2001/3457
    • A plasma torch includes a torch main unit and a nozzle. The torch main unit has a nozzle seat member on which the nozzle is mounted. The nozzle is arranged to move toward or away from the nozzle seat member in a direction substantially parallel to a center axis of the nozzle when the nozzle is mounted on or removed from the nozzle seat member. The nozzle has an electroconductive surface facing the nozzle seat member. The torch main unit has an elastic electric contact portion contacting with the electroconductive surface of the nozzle to form an electroconductive path for a pilot arc to the nozzle. The electroconductive surface of the nozzle presses the electric contact portion in the direction substantially parallel to the center axis when the nozzle is moved toward the nozzle seat member to mount the nozzle on the nozzle seat member.
    • 等离子体焰炬包括火炬主单元和喷嘴。 割炬主体具有安装喷嘴的喷嘴座构件。 喷嘴被布置成当喷嘴安装在喷嘴座构件上或从喷嘴座构件移除时沿大致平行于喷嘴的中心轴线的方向朝向或远离喷嘴座构件移动。 喷嘴具有面向喷嘴座构件的导电表面。 手电筒主体具有与喷嘴的导电表面接触的弹性电接触部分,以形成用于引导电弧到喷嘴的导电路径。 当喷嘴朝向喷嘴座构件移动以将喷嘴安装在喷嘴座构件上时,喷嘴的导电表面在基本上平行于中心轴线的方向上按压电接触部分。
    • 24. 发明授权
    • Imaging device, imaging method and imaging program
    • 成像设备,成像方法和成像程序
    • US07711190B2
    • 2010-05-04
    • US11365671
    • 2006-03-02
    • Yoshihiro Yamaguchi
    • Yoshihiro Yamaguchi
    • G06K9/00
    • G06K9/00281G03B7/08G03B17/00H04N5/232H04N5/23219
    • The present invention provides an imaging device comprising an imaging unit for photographing an image, a face extracting unit for extracting a face region including a person's face part from said image, a rating calculation unit for calculating a rating from said extracted face region, a threshold setting unit for accepting setting of a threshold for said rating, and a photograph indicating unit for indicating re-photograph based on comparison of said rating and said threshold. According to the imaging device of the present invention, re-photograph is indicated based on comparison of the rating and the threshold. A user can easily obtain a satisfactory image by repeating photograph until the rating obtained from the face region reaches the threshold.
    • 本发明提供了一种成像装置,其特征在于,具备拍摄图像的摄像部件,从所述图像中提取包含人脸部的面部区域的脸部提取部,从所述提取的面部区域计算出评价值的评价计算部, 用于接受所述评级的阈值的设置的设置单元,以及基于所述评级和所述阈值的比较来指示重新拍摄的照片指示单元。 根据本发明的成像装置,基于评级和阈值的比较来指示重新拍摄。 用户可以通过重复照片容易地获得令人满意的图像,直到从脸部区域获得的评分达到阈值。
    • 25. 发明授权
    • Cutting machine
    • 切割机
    • US07674998B2
    • 2010-03-09
    • US11597286
    • 2005-05-26
    • Satoshi OhnishiYoshihiro Yamaguchi
    • Satoshi OhnishiYoshihiro Yamaguchi
    • B23K9/00
    • B23K26/38B23K7/00B23K9/013B23K9/325B23K10/00B23K26/0876B23K26/142B23K37/0229B23K37/0461B23K2101/18Y10T83/05Y10T83/7693
    • To enable the amount of air capable of bringing smoke to the vicinity of a discharge opening of a gas discharge chamber to be sent into the gas discharge chamber. A cutting machine has gas discharge chambers arranged side by side by partitioning the inside of a table, blower openings each provided on one end side of a gas discharge chamber, gas discharge openings each provided on the other side of the gas discharge chamber, and fans for sending air, while moving to the outside of the table, to at least one gas discharge chamber from the blower opening of the gas discharge chamber and arranged in the direction of the movement. The fans are arranged at intervals such that two or more fans face the blower opening of one gas discharge chamber, and the two or more fans can simultaneously send air to the one gas discharge chamber.
    • 使能够将气体排出到排气室的排气口附近的空气量送入气体排出室。 切割机具有通过分隔桌子内侧并排布置的排气室,设置在排气室的一端侧的鼓风机开口,设置在气体排出室的另一侧的气体排出口,以及风扇 用于在从桌子的外部移动到从气体排出室的鼓风机开口至少一个排气室的同时沿着运动方向布置的空气。 风扇间隔布置,使得两个或更多个风扇面对一个气体放电室的鼓风机开口,并且两个或更多个风扇可以同时向一个气体放电室发送空气。
    • 29. 发明授权
    • Semiconductor element and method of manufacturing the same
    • 半导体元件及其制造方法
    • US07479678B2
    • 2009-01-20
    • US11485284
    • 2006-07-13
    • Syotaro OnoWataru SaitoYusuke KawaguchiYoshihiro Yamaguchi
    • Syotaro OnoWataru SaitoYusuke KawaguchiYoshihiro Yamaguchi
    • H01L29/76
    • H01L29/7813H01L29/0634H01L29/0696H01L29/4236H01L29/66727H01L29/66734
    • A semiconductor element is provided, comprising a first semiconductor layer of the first conduction type; and a pillar layer including first semiconductor pillars of the first conduction type and second semiconductor pillars of the second conduction type arranged periodically and alternately on the first semiconductor layer. A semiconductor base layer of the second conduction type is formed on the upper surface of the pillar layer, And a second semiconductor layer of the first conduction type is formed on the upper surface of the semiconductor base layer. A control electrode of the trench gate type is formed in a trench, which is formed in depth through the semiconductor base layer to the first semiconductor pillar. The control electrode is tapered such that the width thereof decreases with the distance from a second main electrode toward a first main electrode and the tip thereof locates almost at the center of the first semiconductor pillar.
    • 提供一种半导体元件,包括第一导电类型的第一半导体层; 以及第一导电型的第一半导体柱和第二导电型的第二半导体柱在第一半导体层上周期性且交替地配置的柱层。 第二导电类型的半导体基层形成在柱层的上表面上,第一导电类型的第二半导体层形成在半导体基层的上表面上。 沟槽栅型的控制电极形成在沟槽中,该沟槽通过半导体基底层向第一半导体柱形成深度。 控制电极是锥形的,使得其宽度随着从第二主电极朝向第一主电极的距离而减小,并且其尖端几乎位于第一半导体柱的中心。