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21. 发明授权

US06948107B1 Method and installation for fast fault localization in an integrated circuit 失效
标题翻译：集成电路中快速故障定位的方法和安装
公开(公告)号：US06948107B1
公开(公告)日：2005-09-20
申请号：US09831525
申请日：1999-05-21
申请人： Romain Desplats , Philippe Perdu
发明人： Romain Desplats , Philippe Perdu
IPC分类号： G01R31/30 , G01R31/319 , G06F11/00 , G01R31/08 , G01R31/28 , G06F7/02
CPC分类号： G01R31/3008 , G01R31/3004 , G01R31/31903
摘要： The invention relates to a method and an installation for fast location of a fault in an integrated circuit. A sequence of NRZ location vectors is created, the abnormal location vectors are determined, for which the value of the electrical consumption current at rest IDDQ of the circuit is abnormal, at least one set of images is produced with an abnormal location vector, and at least one abnormal vector image is compared with a reference image.
摘要翻译：本发明涉及用于在集成电路中快速定位故障的方法和装置。产生NRZ位置向量的序列，确定异常位置向量，对于该异常位置向量，电路的静止IDDQ的电耗电流的值异常，产生具有异常位置向量的至少一组图像，并且在将至少一个异常矢量图像与参考图像进行比较。

22. 发明申请

US20050006602A1 Spatial and temporal selective laser assisted fault localization 有权
公开(公告)号：US20050006602A1
公开(公告)日：2005-01-13
申请号：US10888840
申请日：2004-07-09
申请人： Philippe Perdu , Romain Desplats , Felix Beaudoin , Praveen Vedagarbha , Martin Leibowitz , Kenneth Wilsher
发明人： Philippe Perdu , Romain Desplats , Felix Beaudoin , Praveen Vedagarbha , Martin Leibowitz , Kenneth Wilsher
IPC分类号： G01R31/26 , G01R31/302 , G01R31/311 , G03C5/00 , G06F17/50 , G21K5/10 , H01J37/08 , H01S20060101
CPC分类号： G01R31/31816 , G01R31/311
摘要： A method and apparatus for laser-assisted fault mapping which synchronizes the laser control with the tester unit. The inventive method provides for laser-assisted pseudo-static fault mapping to localize defects in a device whose inputs are being stimulated dynamically by a tester. It further provides for laser-assisted dynamic soft error mapping, to localize in terms of location and to correlate with respect to a specific test vector, sensitive areas in a device by utilizing device performance criteria such as pass-fail status outputs. The apparatus includes a fully controllable dynamic laser stimulation apparatus connected to a control unit that provides complete synchronization with a tester unit.

23. 发明申请

US20110187352A1 METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE 审中-公开
标题翻译：基于单向探针的电子设备的多维测试方法与机器
公开(公告)号：US20110187352A1
公开(公告)日：2011-08-04
申请号：US13001482
申请日：2009-06-24
申请人： Philippe Perdu
发明人： Philippe Perdu
IPC分类号： G01B7/14
CPC分类号： G01R31/302 , G01R31/265 , G01R31/315
摘要： In a method and a machine for testing an electronic device, in which the magnetic field emitted is measured by a monodirectional measurement probe, a first value of the component Bz of the magnetic field along axis ZZ′ is measured by the probe and recorded. The probe and the electronic device are displaced with respect to one another by relative pivoting about an axis XX′ orthogonal to axis ZZ′, according to an angular amplitude of less than 90° while maintaining distance d0 and, for each position (x, y) of axis ZZ′, a second value of component Bz of the magnetic field along axis ZZ′ is measured by the probe and recorded, then the value of component By of the magnetic field along axis YY′ orthogonal to axes ZZ′ and XX′ is determined and recorded on the basis of the first value and the second value which have been obtained.
摘要翻译：在通过单向测量探头测量发射的磁场的电子装置的测试方法和机器中，通过探头测量沿着ZZ'轴的磁场的分量Bz的第一值并进行记录。探针和电子设备通过相对于垂直于轴线ZZ'的轴线XX'相对枢转地相对于彼此相对移动，根据小于90°的角度振幅，同时保持距离d0，并且对于每个位置（x，y）），通过探头测量沿着ZZ'轴的磁场的分量Bz的第二值，记录，然后沿与轴ZZ'和XX'正交的轴线YY'的磁场的分量By的值，基于已经获得的第一值和第二值来确定和记录。

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