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    • 26. 发明授权
    • Light beam scanner with foreign matter removing feature
    • 光束扫描器具有异物去除功能
    • US5046797A
    • 1991-09-10
    • US322872
    • 1989-03-14
    • Akira KurisuKiyoshi Suzuki
    • Akira KurisuKiyoshi Suzuki
    • G02B26/12G02B27/00
    • G02B27/0006G02B26/121
    • A light beam scanner which is adapted to reflect optical beams by a rotary polygonal mirror provided adjacent a free end portion of a rotary shaft which is supported rotatably by a bearing, thereby performing scanning, the rotary polygonal mirror is covered with a protective cover, the protective cover being provided with a gas-inlet opening capable of introducing gas into the inside of the protective cover and a gas-outlet opening with the rotary shaft loosely-fitted therein, the gas-outlet opening permitting a discharge of gas from the inside of the protection cover. Accordingly, any deposition of oil mist which may leak from the bearing on the rotary polygonal mirror can be prevented by producing a gas-flow stream which travels from the gas-inlet opening to the gas-outlet opening.
    • 一种光束扫描器,其适于通过旋转多面镜反射光束,所述旋转多面镜邻近由轴承可旋转地支撑的旋转轴的自由端部设置,从而进行扫描,所述旋转多面镜被保护盖覆盖, 保护罩设置有能够将气体引入保护罩的内部的气体入口和带有松动地配合在其中的旋转轴的气体出口,气体出口开口允许从内部排出气体 防护罩。 因此,可以通过产生从气体入口到气体出口开口的气流来防止可能从旋转多面镜上的轴承泄漏的油雾沉积。
    • 30. 发明授权
    • Method of optimizing process recipe of substrate processing system
    • 基板处理系统工艺配方优化方法
    • US08082054B2
    • 2011-12-20
    • US12760017
    • 2010-04-14
    • Kaname YamajiKiyoshi SuzukiYuichi Takenaga
    • Kaname YamajiKiyoshi SuzukiYuichi Takenaga
    • G06F19/00
    • C23C16/52G05B13/021H01L21/67005H01L22/12H01L22/20
    • The present invention is a method of optimizing a process recipe of a substrate processing system including: a substrate processing apparatus that performs a film deposition process of a substrate to be processed according to a process recipe; a data processing unit that executes a calculation for optimizing the process recipe; and a host computer; the substrate processing apparatus, the data processing unit, and the host computer being connected to each other through a network. The present invention includes the steps of: measuring a film thickness of a substrate to be processed that has been subjected to a film deposition process by the substrate processing apparatus; sending a command for conducting a process-recipe optimizing process from the host computer to the substrate processing apparatus, when the measured film thickness is deviated from a target film thickness and the deviation is beyond an allowable range; and in response to the command for conducing a process-recipe optimizing process from the host computer, sending required data from the substrate processing apparatus to the data processing unit, causing the data processing unit to execute a process-recipe optimizing calculation to calculate an optimum process recipe for achievement of the target film thickness, and updating the process recipe in the substrate processing apparatus based on the calculated result.
    • 本发明是一种优化基板处理系统的工艺配方的方法,包括:基板处理装置,其根据处理配方进行待加工基板的成膜处理; 数据处理单元,其执行用于优化处理配方的计算; 和主机; 基板处理装置,数据处理单元和主机通过网络彼此连接。 本发明包括以下步骤:测量由基板处理装置进行的膜沉积处理的被处理基板的膜厚; 当测量的膜厚度偏离目标膜厚度并且偏差超出允许范围时,发送用于进行从主机到基板处理装置的处理配方优化处理的命令; 并且响应于从主计算机进行处理配方优化处理的命令,将所需数据从基板处理装置发送到数据处理单元,使数据处理单元执行处理配方优化计算以计算最佳值 用于实现目标膜厚度的处理配方,以及基于计算结果更新基板处理装置中的处理配方。