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    • 22. 发明申请
    • Edge flow faceplate for improvement of CVD film properties
    • 边缘流动面板,用于改善CVD膜性能
    • US20050126484A1
    • 2005-06-16
    • US11013124
    • 2004-12-15
    • Maosheng ZhaoLun TsueiJuan Rocha-AlvarezTom Cho
    • Maosheng ZhaoLun TsueiJuan Rocha-AlvarezTom Cho
    • C23C16/00C23C16/44C23C16/455C23C16/509H01J37/32H01L21/00
    • C23C16/45565C23C16/5096H01J37/3244
    • Embodiments in accordance with the present invention relate to apparatuses and methods distributing processing gases over a workpiece surface. In accordance with one embodiment of the present invention, process gases are flowed to a surface of a semiconductor wafer through a substantially circular gas distribution showerhead defining a plurality of holes. A first set of holes located at the center of the faceplate, are arranged in a non-concentric manner not exhibiting radial symmetry. This asymmetric arrangement achieves maximum density of holes and gases distributed therefrom. To compensate for nonuniform exposure of the wafer edges to gases flowed from the first hole set, the faceplate periphery defines a second set of holes arranged concentrically and exhibiting radial symmetry. Processing substrates with gases flowed through the first and second sets of holes results in formation of films exhibiting enhanced uniformity across center-to-edge regions.
    • 根据本发明的实施例涉及在工件表面上分配处理气体的装置和方法。 根据本发明的一个实施例,工艺气体通过限定多个孔的基本圆形的气体分配喷头流向半导体晶片的表面。 位于面板中心的第一组孔布置成不呈径向对称的非同心方式。 这种不对称布置实现了从其分布的孔和气体的最大密度。 为了补偿晶片边缘对从第一孔组流出的气体的不均匀曝光,面板周边限定了同心布置且呈径向对称的第二组孔。 处理具有流经第一和第二组孔的气体的衬底导致形成在中心到边缘区域上具有增强的均匀性的膜。