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    • 21. 发明授权
    • Semiconductor integrated circuit incorporating test configuration and test method for the same
    • 半导体集成电路结合测试配置和测试方法相同
    • US07702979B2
    • 2010-04-20
    • US11397899
    • 2006-04-05
    • Masayuki AraiKazuhiko IwasakiSatoshi FukumotoTakeshi ShodaJunichi Nishimoto
    • Masayuki AraiKazuhiko IwasakiSatoshi FukumotoTakeshi ShodaJunichi Nishimoto
    • G01R31/28
    • G01R31/318544G01R31/318536
    • An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.
    • 本发明的一个目的是大大减少包含使用部分旋转扫描电路的测试配置的半导体集成电路中的面积开销。 为了实现这一点,在包括组合电路(3)和通过连接多个扫描触发器(5)构成的扫描链(2)的测试配置的半导体集成电路中,扫描链(2) )被分成多个子扫描链(20a至20n),每个子扫描链具有部分旋转扫描(PRS)功能和测试响应压缩(MISR)功能。 通过在将要设置为PRS的子扫描链和将被设置为MISR的副扫描链的组合改变的同时执行多个步骤中的扫描测试,可以执行测试而不必提供测试响应压缩器 与扫描链分开,因此可以减少面积开销。